74ABT125CSJX

74ABT125 — Quad Buffer with 3-STATE Outputs
©1994 Fairchild Semiconductor Corporation www.fairchildsemi.com
74ABT125 Rev. 1.4.0
January 2008
74ABT125
Quad Buffer with 3-STATE Outputs
Features
Non-inverting buffers
Output sink capability of 64mA, source capability of
32mA
Guaranteed latchup protection
High impedance glitch free bus loading during entire
power up and power down cycle
Nondestructive hot insertion capability
Disable time less than enable time to avoid bus
contention
General Description
The ABT125 contains four independent non-inverting
buffers with 3-STATE outputs.
Ordering Information
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering number.
All packages are lead free per JEDEC: J-STD-020B standard.
Connection Diagram
Pin Description
Function Table
H
=
HIGH Voltage Level
L
=
LOW Voltage Level
Z
=
HIGH Impedance
X
=
Immaterial
Order Number
Package
Number Package Description
74ABT125CSC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150"
Narrow
74ABT125CSJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74ABT125CMTC MTC14 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153,
4.4mm Wide
Pin Names Description
A
n
, B
n
Inputs
O
n
Outputs
Inputs Output
A
n
B
n
O
n
L L L
L H H
H X Z
©1994 Fairchild Semiconductor Corporation www.fairchildsemi.com
74ABT125 Rev. 1.4.0 2
74ABT125 — Quad Buffer with 3-STATE Outputs
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Note:
1. Either voltage limit or current limit is sufficient to protect inputs.
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to absolute maximum ratings.
Symbol Parameter Rating
T
STG
Storage Temperature –65°C to +150°C
T
A
Ambient Temperature Under Bias –55°C to +125°C
T
J
Junction Temperature Under Bias –55°C to +150°C
V
CC
V
CC
Pin Potential to Ground Pin –0.5V to +7.0V
V
IN
Input Voltage
(1)
–0.5V to +7.0V
I
IN
Input Current
(1)
–30mA to +5.0mA
V
O
Voltage Applied to Any Output
Disabled or Power-Off State –0.5V to 5.5V
HIGH State –0.5V to V
CC
Current Applied to Output in LOW State (Max.) twice the rated I
OL
(mA)
DC Latchup Source Current (Across Comm Operating Range) –300mA
Over Voltage Latchup (I/O) 10V
Symbol Parameter Rating
T
A
Free Air Ambient Temperature –40°C to +85°C
V
CC
Supply Voltage +4.5V to +5.5V
V
/
t Minimum Input Edge Rate
Data Input 50mV/ns
Enable Input 20mV/ns
©1994 Fairchild Semiconductor Corporation www.fairchildsemi.com
74ABT125 Rev. 1.4.0 3
74ABT125 — Quad Buffer with 3-STATE Outputs
DC Electrical Characteristics
Notes:
2. Guaranteed, but not tested.
3. For 8-bit toggling, I
CCD
<
0.8mA/MHz.
Symbol Parameter V
CC
Conditions Min. Typ. Max. Units
V
IH
Input HIGH Voltage Recognized HIGH Signal 2.0 V
V
IL
Input LOW Voltage Recognized LOW Signal 0.8 V
V
CD
Input Clamp Diode Voltage Min. I
IN
=
–18mA –1.2 V
V
OH
Output HIGH Voltage Min. I
OH
=
–3mA 2.5 V
I
OH
=
–32mA 2.0
V
OL
Output LOW Voltage Min. I
OL
=
64mA 0.55 V
I
IH
Input HIGH Current Max. V
IN
=
2.7V
(2)
A
V
IN
=
V
CC
1
I
BVI
Input HIGH Current Breakdown
Test
Max. V
IN
=
7.0V 7 µA
I
IL
Input LOW Current Max. V
IN
=
0.5V
(2)
–1 µA
V
IN
=
0.0V –1
V
ID
Input Leakage Test 0.0 I
ID
=
1.9µA, All Other Pins
Grounded
4.75 V
I
OZH
Output Leakage Current 0–5.5V V
OUT
=
2.7V, OE
n
=
2.0V 10 µA
I
OZL
Output Leakage Current 0–5.5V V
OUT
=
0.5V, OE
n
=
2.0V –10 µA
I
OS
Output Short-Circuit Current Max. V
OUT
=
0.0V –275 mA
I
CEX
Output HIGH Leakage Current Max. V
OUT
=
V
CC
50 µA
I
ZZ
Bus Drainage Test 0.0 V
OUT
=
5.5V, All Others GND 100 µA
I
CCH
Power Supply Current Max. All Outputs HIGH 50 µA
I
CCL
Power Supply Current Max. All Outputs LOW 15 mA
I
CCZ
Power Supply Current Max. OE
n
=
V
CC
, All Others at V
CC
or Ground
50 µA
I
CCT
Additional
I
CC
/Input
Outputs Enabled Max. V
I
=
V
CC
– 2.1V 1.5 mA
Outputs 3-STATE Enable Input V
I
=
V
CC
– 2.1V 1.5 mA
Outputs 3-STATE Data Input V
I
=
V
CC
– 2.1V,
All Others at V
CC
or Ground
50 µA
I
CCD
Dynamic I
CC
No Load
(2)
Max. Outputs OPEN, OE
n
=
GND
(3)
,
One-Bit Toggling,
50% Duty Cycle
0.1 mA/
MHz

74ABT125CSJX

Mfr. #:
Manufacturer:
ON Semiconductor / Fairchild
Description:
Buffers & Line Drivers Quad Buffer
Lifecycle:
New from this manufacturer.
Delivery:
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