74CBTLV3244 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet Rev. 3 — 8 November 2016 6 of 19
NXP Semiconductors
74CBTLV3244
8-bit bus switch with 4-bit output enables
9.1 Test circuits
9.2 ON resistance
[1] Typical values are measured at T
amb
=25C and nominal V
CC
.
[2] Measured by the voltage drop between the A and B terminals at the indicated current through the switch. ON-state resistance is
determined by the lower of the voltages of the two (A or B) terminals.
V
I
= V
CC
or GND and V
O
= GND or V
CC
.V
I
= V
CC
or GND and V
O
= open circuit.
Fig 6. Test circuit for measuring OFF-state leakage
current (one switch)
Fig 7. Test circuit for measuring ON-state leakage
current (one switch)
DDP
Q%Q
Q2(
9
,+
Q$Q
*1'
9
&&
9
O
9
2
,
V
$
,
V
$
DDP
Q$Q
Q2(
9
,/
Q%Q
*1'
9
&&
9
O
9
2
,
V
$
Table 7. Resistance R
ON
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for test circuit see Figure 8.
Symbol Parameter Conditions T
amb
= 40 C to +85 C T
amb
= 40 C to +125 C Unit
Min Typ
[1]
Max Min Max
R
ON
ON resistance V
CC
= 2.3 V to 2.7 V;
see Figure 9
to Figure 11
[2]
I
SW
=64mA; V
I
= 0 V - 4.2 8.0 - 15.0
I
SW
=24 mA; V
I
= 0 V - 4.2 8.0 - 15.0
I
SW
= 15 mA; V
I
= 1.7 V - 8.4 40 - 60.0
V
CC
= 3.0 V to 3.6 V;
see Figure 12 to Figure 14
I
SW
=64mA; V
I
=0V - 4.0 7.0 - 11.0
I
SW
=24 mA; V
I
=0V - 4.0 7.0 - 11.0
I
SW
= 15 mA; V
I
= 2.4 V - 6.2 15 - 25.5
