NLSX4373
http://onsemi.com
6
TIMING CHARACTERISTICS − RAIL−TO−RAIL DRIVING CONFIGURATIONS
(I/O test circuit of Figures 2 and 3, C
LOAD
= 15 pF, driver output impedance v 50 W, R
LOAD
= 1 MW)
Symbol Unit
−405C to +855C
(Notes 3 and 4)
Test ConditionsParameterSymbol Unit
MaxTypMin
Test ConditionsParameter
V
L
= 3.6 V, V
CC
= 2.5 V
t
RVCC
I/O V
CC
Risetime 15 ns
t
FVCC
I/O V
CC
Falltime 10 ns
t
RVL
I/O V
L
Risetime 15 ns
t
FVL
I/O V
L
Falltime 15 ns
t
PDVL−VCC
Propagation Delay (Driving I/O V
L
) 15 ns
t
PDVCC−VL
Propagation Delay (Driving I/O V
CC
) 15 ns
t
PPSKEW
Part−to−Part Skew 5 nS
Maximum Data Rate 20 Mb/s
V
L
= 5.5 V, V
CC
= 1.5 V
t
RVCC
I/O V
CC
Risetime 30 ns
t
FVCC
I/O V
CC
Falltime 10 ns
t
RVL
I/O V
L
Risetime 15 ns
t
FVL
I/O V
L
Falltime 20 ns
t
PDVL−VCC
Propagation Delay (Driving I/O V
L
) 20 ns
t
PDVCC−VL
Propagation Delay (Driving I/O V
CC
) 20 ns
t
PPSKEW
Part−to−Part Skew 5 nS
Maximum Data Rate 20 Mb/s
3. Typical values are for V
CC
= +3.3 V, V
L
= +1.8 V and T
A
= +25°C.
4. All units are production tested at T
A
= +25°C. Limits over the operating temperature range are guaranteed by design.
TIMING CHARACTERISTICS − OPEN DRAIN DRIVING CONFIGURATIONS
(I/O test circuit of Figures 4 and 5, C
LOAD
= 15 pF, driver output impedance v 50 W, R
LOAD
= 1 MW)
Symbol Parameter Test Conditions
−405C to +855C
(Notes 5 and 6)
Unit
Min Typ Max
+1.5 v V
L
v V
CC
v +5.5 V
t
RVCC
I/O V
CC
Risetime 400 ns
t
FVCC
I/O V
CC
Falltime 50 ns
t
RVL
I/O V
L
Risetime 400 ns
t
FVL
I/O V
L
Falltime 60 ns
t
PDVL−VCC
Propagation Delay (Driving I/O V
L
) 1000 ns
t
PDVCC−VL
Propagation Delay (Driving I/O V
CC
) 1000 ns
t
PPSKEW
Part−to−Part Skew 50 nS
MDR Maximum Data Rate 2 Mb/s
5. Typical values are for V
CC
= +3.3 V, V
L
= +1.8 V and T
A
= +25°C.
6. All units are production tested at T
A
= +25°C. Limits over the operating temperature range are guaranteed by design.
