Philips Semiconductors Product specification
74F193Up/down binary counter with separate up/down clocks
1995 Jul 17
5
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free-air temperature range.)
SYMBOL PARAMETER RATING UNIT
V
CC
Supply voltage –0.5 to +7.0 V
V
IN
Input voltage –0.5 to +7.0 V
I
IN
Input current –30 to +5.0 mA
V
OUT
Voltage applied to output in High output state –0.5 to +V
CC
V
I
OUT
Current applied to output in Low output state 40 mA
T
amb
Operating free-air temperature range 0 to +70
°
C
T
stg
Storage temperature –65 to +150
°
C
RECOMMENDED OPERATING CONDITIONS
LIMITS
MIN NOM MAX
V
CC
Supply voltage 4.5 5.0 5.5 V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level input voltage 0.8 V
I
IK
Input clamp current –18 mA
I
OH
High-level output current –1 mA
I
OL
Low-level output current 20 mA
T
amb
Operating free-air temperature range 0 +70
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL PARAMETER TEST CONDITIONS
MIN
TYP
NO TAG
MAX
UNIT
p
V
= MIN
V
= MAX
10%V
CC
2.5 V
OH
-
v
u
u
v
=
=
I
OH
= MAX, V
IH
= MIN
5%V
CC
2.7 3.4 V
p
V
= MIN
V
= MAX
10%V
CC
0.35 0.50 V
OL
w-
v
u
u
v
=
=
I
OL
= MAX, V
IH
= MIN
5%V
CC
0.35 0.50 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
–0.73 –1.2 V
I
I
Input current at maximum
input voltage
V
CC
= MAX, V
I
= 7.0V 100 µA
I
IH
High-level input current V
CC
= MAX, V
I
= 2.7V 20 µA
I
IL
Low-level input
CP
U
, CP
D
–1.8 mA
current
Others
CC
=
,
I
=
.
–0.6 mA
I
OS
Short-circuit output current
NO TAG
V
CC
= MAX –60 –150 mA
I
CC
Supply current (total)
4
V
CC
= MAX 32 50 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. Measure I
CC
with parallel load and Master reset inputs grounded, all other inputs at 4.5V and all outputs open.
