NX3L4051 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 5 — 3 July 2012 13 of 23
NXP Semiconductors
NX3L4051
Single low-ohmic 8-channel analog switch
a. Test circuit
b. Input and output measurement points
Fig 16. Test circuit for measuring break-before-make timing
V
V
O
001aal665
C
L
R
L
GND
V
EXT
= 1.5 V
G
V
I
Sn
E
Z
V
CC
V
IL
or V
IH
V
IL
Yn
001aag572
V
I
t
b-m
V
O
0.9V
O
0.9V
O
0.5V
I
Test data is given in Table 11.
Definitions test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
V
EXT
= External voltage for measuring switching times.
V
I
may be connected to Sn or E.
Fig 17. Test circuit for measuring switching times
V
V
O
001aal666
C
L
R
L
GND
V
EXT
= 1.5 V
G
V
I
Sn
E
Z
V
CC
V
IL
or V
IH
V
IL
Yn
Table 11. Test data
Supply voltage Input Load
V
CC
V
I
t
r
, t
f
C
L
R
L
1.4 V to 4.3 V V
CC
2.5ns 35pF 50
NX3L4051 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 5 — 3 July 2012 14 of 23
NXP Semiconductors
NX3L4051
Single low-ohmic 8-channel analog switch
12.2 Additional dynamic characteristics
[1] f
i
is biased at 0.5V
CC
.
12.3 Test circuits
Table 12. Additional dynamic characteristics
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); V
I
= GND or V
CC
(unless otherwise
specified); t
r
= t
f
2.5 ns; T
amb
= 25
C.
Symbol Parameter Conditions Min Typ Max Unit
THD total harmonic
distortion
f
i
=20Hzto20 kHz; R
L
=32; see Figure 18
[1]
V
CC
=1.4V; V
I
= 1 V (p-p) - 0.15 - %
V
CC
=1.65V; V
I
= 1.2 V (p-p) - 0.10 - %
V
CC
=2.3V; V
I
= 1.5 V (p-p) - 0.02 - %
V
CC
=2.7V; V
I
= 2 V (p-p) - 0.02 - %
V
CC
=4.3V; V
I
= 2 V (p-p) - 0.02 - %
f
(3dB)
3 dB frequency
response
R
L
=50; see Figure 19
[1]
V
CC
= 1.4 V to 4.3 V - 15 - MHz
iso
isolation (OFF-state) f
i
= 100 kHz; R
L
=50; see Figure 20
[1]
V
CC
= 1.4 V to 4.3 V - 90 - dB
V
ct
crosstalk voltage between digital inputs and switch;
f
i
= 1 MHz; C
L
= 50 pF; R
L
=50; see Figure 21
V
CC
= 1.4 V to 3.6 V - 0.2 - V
V
CC
= 3.6 V to 4.3 V - 0.3 - V
Xtalk crosstalk between switches;
f
i
= 100 kHz; R
L
=50;seeFigure 22
[1]
V
CC
= 1.4 V to 4.3 V - 90 - dB
Q
inj
charge injection f
i
= 1 MHz; C
L
= 0.1 nF; R
L
=1 M; V
gen
=0V;
R
gen
=0; see Figure 23
V
CC
= 1.5 V - 3 - pC
V
CC
= 1.8 V - 4 - pC
V
CC
=2.5V - 6 - pC
V
CC
=3.3V - 9 - pC
V
CC
=4.3V - 15 - pC
Fig 18. Test circuit for measuring total harmonic distortion
f
i
D
001aal667
R
L
GND
Sn
E
Z
V
CC
0.5V
CC
V
IL
Yn
V
IL
or V
IH
NX3L4051 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 5 — 3 July 2012 15 of 23
NXP Semiconductors
NX3L4051
Single low-ohmic 8-channel analog switch
Adjust f
i
voltage to obtain 0 dBm level at output. Increase f
i
frequency until dB meter reads 3dB.
Fig 19. Test circuit for measuring the frequency response when channel is in ON-state
f
i
dB
001aal668
R
L
GND
Sn
E
Z
V
CC
0.5V
CC
V
IL
Yn
V
IL
or V
IH
Adjust f
i
voltage to obtain 0 dBm level at input.
Fig 20. Test circuit for measuring isolation (OFF-state)
f
i
dB
001aal669
R
L
GND
Sn
E
Z
V
CC
0.5V
CC
R
L
0.5V
CC
V
IH
Yn
V
IL
or V
IH

NX3L4051PW,118

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Analog Switch ICs ANLG SWT SPST 3.3V
Lifecycle:
New from this manufacturer.
Delivery:
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