© 2016 Integrated Device Technology, Inc.
3 ESD Protection and EMC Specification
3.1. ESD Protection
All pins have an ESD protection of ≥ 2000V according to the Human Body Model (HBM, based on MIL883,
Method 3015.7). The VDDE, VSSE, and AOUT pins have an additional ESD protection of ≥ 4000V (HBM).
In addition, Charged Device Model (CDM) tests are processed with protection levels of ≥ 750V for corner pins and
≥ 500V for all other pins.
The level of ESD protection has been tested with devices in QFN24 4X4mm packages during the product
qualification.
3.2. Latch-Up Immunity
All pins pass ±100mA latch-up test based on testing that conforms to the standard EIA/JESD 78.
3.3. Electromagnetic Emission
The wired emission of externally connected pins of the device is measured according to the following standard:
IEC 61967_4:2002 + A1:2006.
Measurements must be performed with the application circuits described in the ZSSC4151 Application Descrip-
tion.
For the off-board pins, the spectral power measured with the 150Ω method must not exceed the limits according
to IEC 61967_4k, Annex B.4 code H10kN. For the VSSE pin, the spectral power measured with the 1Ω method
must not exceed the limits according to IEC 61967_4k, Annex B.4 code 15KmO.
3.4. Conducted Susceptibility (DPI)
The conducted susceptibility of externally connected pins of the device is measured according to the IEC 62132-4
standard, which describes the direct power injection (DPI) test method.
Measurements must be performed with the application circuit described in the ZSSC4151 Application Description.
Measurements are performed with an internal reference capacitor and internal temperature sensor. The sensing
element is replaced by a resistive divider. Calibration is parameterized so that ~50% VDDA is output.
Table 3.1 gives the specifications for the DPI tests. RES refers to the coupling impedance.
Table 3.1 Conducted Susceptibility (DPI) Tests
LOAD RES = 5kΩ
LOAD CAP = 10nF
LOAD RES = 5kΩ
LOAD CAP = 10nF
