TC75S58F,LF

TC75S58F/FU/FE
2014-03-01
1
TOSHIBA CMOS Linear Integrated Circuit Silicon Monolithic
TC75S58F, TC75S58FU, TC75S58FE
Single Comparator
The TC75S58F/TC75S58FU/TC75S58FE is a CMOS general-
purpose single comparator. The device can operate off a single
power supply and draws a lower supply current than a
conventional bipolar general-purpose comparator. This device’s
open-drain output stage can be wire-ORed with those of other
open-drain output circuits.
Features
Low-current power supply : I
DD
= 10 μA (typ.)
Single power supply operation
Wide common mode input voltage range : V
SS
to V
DD
0.9 V
Open drain output circuit
Low input bias current
Small package
Marking
(top view)
Pin Connection
(top view)
TC75S58F
TC75S58FU
TC75S58FE
Weight
SSOP5-P-0.95 : 0.014 g (typ.)
SSOP5-P-0.65A : 0.006 g (typ.)
SON5-P-0.50 : 0.003 g (typ.)
T E
4 5
3 1 2
V
DD
5
IN (+)
4
1 3
V
SS
2
OUT
IN ()
Start of commercial production
1997-02
TC75S58F/FU/FE
2014-03-01
2
Absolute Maximum Ratings
(Ta
=
25°C)
Characteristics Symbol Rating Unit
Supply voltage V
DD
, V
SS
±3.5 or 7 V
Differential input voltage DV
IN
±7 V
Input voltage V
IN
V
SS
to V
DD
V
Output current I
O
±35 mA
TC75S58F/FU
200
Power dissipation
TC75S58FE
P
D
100
mW
Operating temperature T
opr
40 to 85 °C
Storage temperature T
stg
55 to 125 °C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note: This device’s CMOS structure makes it prone to latch-up. To prevent latch-up, please take the following
precautions:
Ensure that no I/O pin’s voltage level ever exceeds V
DD
or drops below V
SS
.
In addition, check the power-on timing.
Do not subject the device to excessive noise.
TC75S58F/FU/FE
2014-03-01
3
Electrical Characteristics
(V
DD
=
5 V, V
SS
=
GND, Ta
=
25°C)
Characteristics Symbol
Test
Circuit
Test Condition Min Typ. Max Unit
Input offset voltage V
IO
±1 ±7 mV
Input offset current I
IO
1 pA
Input bias current I
I
1 pA
Common mode input voltage CMV
IN
0 4.1 V
Supply current I
DD
(Note) 11 22 μA
Voltage gain G
V
94 dB
Sink current I
sink
V
OL
= 0.5 V 13 25 mA
Output leak current I
LEAK
V
O
= 5 V 5 nA
Output voltage V
OL
I
sink
= 5.0 mA 0.1 0.3 V
Operating supply voltage V
DD
1.8 7.0 V
t
PLH (1)
Over drive = 100 mV 800
Propagation delay time (turn on)
t
PLH (2)
TTL step input 620
ns
t
PHL (1)
Over drive = 100 mV 230
Propagation delay time (turn off)
t
PHL (2)
TTL step input 350
ns
t
TLH
Over drive = 100 mV 190
Response time
t
THL
Over drive = 100 mV 6
ns
Electrical Characteristics
(V
DD
=
3 V, V
SS
=
GND, Ta
=
25°C)
Characteristics Symbol
Test
Circuit
Test Condition Min Typ. Max Unit
Input offset voltage V
IO
±1 ±7 mV
Input offset current I
IO
1 pA
Input bias current I
I
1 pA
Common mode input voltage CMV
IN
0 2.1 V
Supply current I
DD
(Note) 10 20 μA
Sink current I
sink
V
OL
= 0.5 V 6 18 mA
Output leak current I
LEAK
V
O
= 3 V 5 nA
Output voltage V
OL
I
sink
= 5.0 mA 0.15 0.35 V
Propagation delay time (turn on) t
PLH
Over drive = 100 mV 590 ns
Propagation delay time (turn off) t
PHL
Over drive = 100 mV 230 ns
t
TLH
Over drive = 100 mV 170
Response time
t
THL
Over drive = 100 mV 5
ns
Note: This device’s current consumption increases as its operating frequency increases. Note that the power
dissipation should not exceed the allowable power dissipation.

TC75S58F,LF

Mfr. #:
Manufacturer:
Toshiba
Description:
Analog Comparators CMOS Comparator
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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