NB3F8L3005C
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4
FUNCTION TABLES
Table 3. CLOCK ENABLE (SELx) FUNCTION TABLE
SEL Input Selected Input Clock
0 CLK/CLK
1 Crystal Osc Input
Table 4. CLOCK OUTPUT ENABLE (OE) FUNCTION
TABLE
OE Input Q
n
Outputs
0 Disabled, High Impedance
1 Outputs Enabled
Table 5. CLK INPUT VS. OUTPUT STATUS
Input Condition Output
CLK/CLK = OPEN Logic LOW
CLK/CLK = GND Undefined
CLK = HIGH; CLK = LOW Logic HIGH
CLK = LOW; CLK = HIGH Logic LOW
Table 6. CRYSTAL CHARACTERISTICS
Parameter Min Typ Max Unit
Mode of Oscillation Fundamental
Frequency 10 50 MHz
Equivalent Series Resistance (ESR) 50
W
Shunt Capacitance 7 pF
Drive Power 100
mW
Table 7. ATTRIBUTES
Characteristic Value
ESD Protection Human Body Model
Machine Model
>2 kV
200 V
Moisture Sensitivity (Note 2) QFN24 Level 3
Flammability Rating Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in
Transistor Count 474
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
2. For additional information, see Application Note AND8003/D.
Table 8. MAXIMUM RATINGS (Note 3)
Symbol
Parameter Condition Rating Unit
V
DD
,
VDDO
x
Positive Power Supply GND = 0 V 4.6 V
V
I
Input Voltage
XTAL_IN
Diff, SELx, OE Inputs
0 v V
I
v V
DD
–0.5 v V
I
v V
DD
+ 0.5
V
V
O
Output Voltage – 0.5 v V
O
v VDDO
x
+ 0.5 V
T
stg
Storage Temperature Range −65 to +150
_C
θ
JA
Thermal Resistance (Junction−to−Ambient) QFN24
QFN24
0 lfpm
500 lfpm
37
32
_C/W
θ
JC
Thermal Resistance (Junction−to−Case) QFN24 (Note 3) 11
_C/W
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
3. JEDEC standard multilayer board − 2S2P (2 signal, 2 power).
