SGP30N60HS
SGW30N60HS
Power Semiconductors
6 Rev. 2.3 Sep 08
t, SWITCHING TIMES
0A 10A 20A 30A 40A 50A
10ns
00ns
t
r
t
d(on)
t
f
t
d(off)
t, SWITCHING TIMES
0Ω 5Ω 10Ω 15Ω 20Ω 25Ω
10 ns
100 ns
t
f
t
r
t
d(off)
t
d(on)
I
C
, COLLECTOR CURRENT
R
G
, GATE RESISTOR
Figure 9. Typical switching times as a
function of collector current
(inductive load, T
J
=150°C,
V
CE
=400V, V
GE
=0/15V, R
G
=11Ω,
Dynamic test circuit in Figure E)
Figure 10. Typical switching times as a
function of gate resistor
(inductive load, T
J
=150°C,
V
CE
=400V, V
GE
=0/15V, I
C
=30A,
Dynamic test circuit in Figure E)
t, SWITCHING TIMES
0°C 50°C 100°C 150°C
10ns
100ns
t
f
t
r
t
d(on)
t
d(off)
V
GE(th),
GATE-EMITT TRSHOLD VOLTAGE
-50°C 0°C 50°C 100°C 150°C
1,0V
1,5V
2,0V
2,5V
3,0V
3,5V
4,0V
4,5V
5,0V
5,5V
min.
typ.
max.
T
J
, JUNCTION TEMPERATURE T
J
, JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
function of junction temperature
(inductive load, V
CE
=400V,
V
GE
=0/15V, I
C
=30A, R
G
=11Ω,
Dynamic test circuit in Figure E)
Figure 12. Gate-emitter threshold voltage as
a function of junction temperature
(I
C
= 0.7mA)