Table 4: Signal Assignments (Continued)
Primary Side Secondary Side
Pin # Signal Name Description Pin # Signal Name Description
29 GND Ground 30 TWI Two-wire interface
31 -A Differential signal pair +A
and -A
32 TWI
33 +A 34 GND Ground
35 GND Ground 36 Reserved No connect
37 GND Ground 38 Reserved No connect
39 3V3 +3.3V 40 GND Ground
41 3V3 +3.3V 42 Reserved No connect
43 NC No connect 44 DEVSLP Device sleep
45 Optional No connect 46 Reserved No connect
47 Optional No connect 48 1V5 No connect
49 DA/DSS Drive activity LED 50 GND Ground
51 Presence Presence detection 52 3V3 +3.3V
M500IT mSATA NAND Flash SSD
Interface Connectors
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.
Performance
Measured performance can vary for a number of reasons. The major factors affecting
drive performance are the capacity of the drive and the interface of the host. Addition-
ally, overall system performance can affect the measured drive performance. When
comparing drives, it is recommended that all system variables are the same, and only
the drive being tested varies.
Performance numbers will vary depending on the host system configuration.
For SSDs designed for the industrial market, Micron specifies performance in fresh-out-
of-box (FOB) state. Data throughput measured in "steady state" may be lower than FOB
state, depending on the nature of the data workload.
For a description of these performance states and of Micron's best practices for per-
formance measurement, refer to Micron's technical marketing brief "Best Practices for
SSD Performance Measurement"
(www.micron.com/products/solid-state-storage/).
Table 5: Drive Performance
Capacity 60GB 120GB 240GB 64GB 128GB 256GB
UnitInterface Speed 6 Gb/s 6 Gb/s 6 Gb/s 6 Gb/s 6 Gb/s 6 Gb/s
Sequential read (128KB
transfer)
500 500 500 500 500 500 MB/s
Sequential write (128KB
transfer)
130 130 250 130 130 250 MB/s
Random read (4KB trans-
fer)
55,000 55,000 65,000 55,000 55,000 65,000 IOPS
Random write (4KB trans-
fer)
35,000 35,000 60,000 35,000 35,000 60,000 IOPS
READ latency (TYP) 160 160 160 160 160 160 µs
WRITE latency (TYP) 40 40 40 40 40 40 µs
Notes:
1. Performance numbers are maximum values, except as noted.
2. Typical I/O performance numbers as measured using Iometer with a queue depth of 32
and write cache enabled. Fresh-out-of-box (FOB) state is assumed. For performance
measurement purposes, the SSD may be restored to FOB state using the SECURE ERASE
command.
3. Iometer measurements are performed on an 20GB span of logical block addresses
(LBAs).
4. 4KB transfers with a queue depth of 1 are used to measure READ/WRITE latency values
with write cache enabled.
M500IT mSATA NAND Flash SSD
Performance
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.
Reliability
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 6: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate Operation
<1 sector per 10
16
bits read READ
Mean Time To Failure
Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-
ability data using the methods referenced in the Telcordia SR-332 reliability prediction
procedures for electronic equipment.
Table 7: MTTF
Capacity (GB) MTTF (Operating Hours)
1
60 3.0 million
120 3.0 million
240 3.0 million
64 3.0 million
128 3.0 million
256 3.0 million
Note:
1. The product achieves a mean time to failure (MTTF) of 3.0 million hours, based on popu-
lation statistics not relevant to individual units.
Endurance
Endurance for the SSD can be predicted based on the usage conditions applied to the
device, the internal NAND component cycles, the write amplification factor, and the
wear-leveling efficiency of the drive. For each SSD capacity, the table below shows drive
lifetime and sequential input based on predefined usage conditions.
Table 8: Drive Lifetime
Capacity (GB) Drive Lifetime (Total Bytes Written)
60 60TB
120 120TB
240 240TB
64 60TB
128 120TB
M500IT mSATA NAND Flash SSD
Reliability
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9
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.

MTFDDAT064MBD-1AH12ITYY

Mfr. #:
Manufacturer:
Micron
Description:
Solid State Drives - SSD M500IT 64GB MSATA SSD
Lifecycle:
New from this manufacturer.
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