Table 8: Drive Lifetime (Continued)
Capacity (GB) Drive Lifetime (Total Bytes Written)
256 240TB
Notes:
1. Total bytes written validated with the drive 90% full.
2. Access patterns used during reliability testing are 25% sequential and 75% random and
consist of the following: 50% are 4 KB; 40% are 64 KB; and 10% are 128 KB.
3. Host workload parameters, including write cache settings, I/O alignment, transfer sizes,
randomness, and percent full, that are substantially different than the described notes
may result in varied endurance results.
4. GB/day can be calculated by dividing the total bytes written value by (365 × number of
years). For example: 100 TB/5 years/365 days = 54 GB/day for 5 years.
M500IT mSATA NAND Flash SSD
Reliability
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Electrical Characteristics
Environmental conditions beyond those listed may cause permanent damage to the de-
vice. This is a stress rating only, and functional operation of the device at these or any
other conditions above those indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods
may affect reliability.
Table 9: SATA Power Consumption
Capacity (GB)
Device Sleep
Typical Idle Average Active Average
Active Maximum
(128KB transfer) Unit
60 10 100 150 2200 mW
120 10 100 150 2300 mW
240 10 100 150 3500 mW
64 10 100 150 2200 mW
128 10 100 150 2300 mW
256 10 100 150 3500 mW
Notes:
1. Data taken at 25°C using a 6 Gb/s SATA interface.
2. Active average power measured while running MobileMark productivity suite.
3. DIPM (device-initiated power management) enabled. DIPM slumber supported.
4. Active maximum power is an average power measurement performed using Iometer
with 128KB sequential write transfers.
Table 10: Maximum Ratings
Parameter/Condition Symbol Min Max Unit Notes
Voltage input 3V3 3.14 3.46 V
Operating temperature T
C
–40 85 °C 1
Non-operating temperature –40 85 °C
Rate of temperature change 20 °C/hour
Relative humidity (non-condensing) 5 95 %
Note:
1. Operating temperature is best measured by reading the SSD's on-board temperature
sensor, which is recorded in SMART attribute 194 (or 0xC2).
Table 11: Shock and Vibration
Parameter/Condition Specification
Non-operating shock 1500G/0.5ms (10x shocks per axis)
Non-operating vibration 7 – 2000Hz @ 20 Grms (30 minutes per axis)
Note:
1. Stress qualification tests are not intended for operational or continuous use. Exposure
to these conditions may affect reliability.
M500IT mSATA NAND Flash SSD
Electrical Characteristics
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Adaptive Thermal Monitoring
The device features adaptive thermal monitoring. While most host computers exhibit
operating environments that keep an SSD running in the range of 40°C to 45°C, adap-
tive thermal monitoring enables the SSD device to operate in a wide variety of environ-
ments by helping to prevent the host computer from running at excessive temperatures.
Adaptive thermal monitoring reduces total SSD power consumption by the device con-
troller, as well as the NAND media, by injecting time-based delays between internal
processing of media commands when the device temperature reaches 85 °C. The delay
times used are bound to the microsecond range, and are based on a proportional and
differential control equation of the general form shown here.
Figure 5: Adaptive Thermal Monitoring Control Equation
u(t) = Kp × T
p
(t) + Kd ×
dT
d
dt
The delay-control equation is tuned for a steady-state temperature target, which has
been designed as an optimum balance of hardware temperature tolerances and drive
performance. Steady-state temperature targets are hardware-configuration dependant,
and may range from 85 °C to 90 °C. Temperatures below the intended steady-state target
will not produce a proportional component to delay, but may produce a differential
component based on the current rate of temperature change according to the control
equation. When the feature is active, DRAM refresh rates are also adjusted to improve
data integrity and stability while operating outside of temperature specifications.
When the device temperature falls below 85 °C, normal operation will continue without
induced delays. If temperature continues to rise above the temperature target and ex-
ceeds a hardware-dependant critical threshold, the device will abort host commands to
prevent component damage. The critical threshold values have a 6 °C margin on top of
target threshold, and range between 95 °C and 101 °C.
Device temperature values used by the adaptive thermal monitoring feature are based
on an internal temperature sensor located on the device PCB, and may differ from case
or package temperatures as measured by thermocouple. Device temperature is accessi-
ble through SMART attribute 194, though usage of the SMART feature is not necessary
for adaptive thermal monitoring functionality.
Adaptive thermal monitoring does not change the current negotiated speed of the SATA
bus, nor require or cause any new commands to be issued on the SATA bus. Rated-
throughput performance is not guaranteed at any point above the maximum specified
operating temperature.
This feature is still under definition, and further details on exact behavior will be provi-
ded later.
M500IT mSATA NAND Flash SSD
Adaptive Thermal Monitoring
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MTFDDAT128MBD-1AK12ITYY

Mfr. #:
Manufacturer:
Micron
Description:
Solid State Drives - SSD M500IT 128GB MSATA SSD
Lifecycle:
New from this manufacturer.
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