AOW11N60

AOW11N60
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
0
3
6
9
12
15
0 10 20 30 40 50
V
GS
(Volts)
Q
g
(nC)
Figure 7: Gate-Charge Characteristics
V
DS
=480V
I
D
=11A
1
10
100
1000
10000
0.1 1 10 100
Capacitance (pF)
V
DS
(Volts)
Figure 8: Capacitance Characteristics
C
iss
C
oss
C
rss
0.01
0.1
1
10
100
1 10 100 1000
I
D
(Amps)
V
DS
(Volts)
Figure 9: Maximum Forward Biased Safe
Operating Area for AOW11N60 (Note F)
10
µ
s
1ms
DC
R
DS(ON)
limited
T
J(Max)
=150°C
T
C
=25°C
100µs
0
2
4
6
8
10
12
0 25 50 75 100 125 150
Current rating I
D
(A)
T
CASE
(°C)
Figure 10: Current De-rating (Note B)
Operating Area for AOW11N60 (Note F)
0.001
0.01
0.1
1
10
1E-06 1E-05 0.0001 0.001 0.01 0.1 1 10
Z
θ
JC
Normalized Transient
Thermal Resistance
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance for AOW11N60(Note F)
D=T
on
/T
T
J,PK
=T
C
+P
DM
.Z
θJC
.R
θJC
R
θJC
=0.46°C/W
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
T
on
T
P
D
Single Pulse
Rev0: Jan 2012 www.aosmd.com Page 4 of 5
AOW11N60
-
+
VDC
Ig
Vds
DUT
-
+
VDC
Vgs
Vgs
10V
Qg
Qgs Qgd
Charge
Gate Charge Test Circuit & Waveform
-
+
VDC
DUT
Vdd
Vgs
Vds
Vgs
RL
Rg
Vgs
Vds
10%
90%
Resistive Switching Test Circuit & Waveforms
t t
r
d(on)
t
on
t
d(off)
t
f
t
off
Vdd
Vgs
Id
+
VDC
L
Vgs
Vds
BV
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
Vds
AR
DSS
2
E = 1/2 LI
AR
AR
Vdd
Vgs
Vgs
Rg
DUT
-
VDC
Id
Vgs
Ig
Vgs
-
+
VDC
DUT
L
Vgs
Vds
Isd
Isd
Diode Recovery Test Circuit & Waveforms
Vds -
Vds +
I
F
AR
dI/dt
I
RM
rr
Vdd
Vdd
Q = - Idt
t
rr
Rev0: Jan 2012 www.aosmd.com Page 5 of 5

AOW11N60

Mfr. #:
Manufacturer:
Description:
MOSFET N-CH 600V 11A TO262
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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