74AHC_AHCT573 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 7 — 8 November 2011 12 of 19
NXP Semiconductors
74AHC573; 74AHCT573
Octal D-type transparant latch; 3-state
Test data is given in Table 9.
Definitions test circuit:
R
T
= termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= load capacitance including jig and probe capacitance.
R
L
= load resistance.
S1 = test selection switch.
Fig 11. Test circuitry for switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aad983
DUT
V
CC
V
CC
V
I
V
O
R
T
R
L
S1
C
L
open
G
Table 9. Test data
Type Input Load S1 position
V
I
t
r
, t
f
C
L
R
L
t
PHL
, t
PLH
t
PZH
, t
PHZ
t
PZL
, t
PLZ
74AHC573 V
CC
3.0ns 15pF, 50pF 1k open GND V
CC
74AHCT573 3.0 V 3.0ns 15pF, 50pF 1k open GND V
CC
