DSF01S30SL
1
Schottky Barrier Diode Silicon Epitaxial
DSF01S30SL
DSF01S30SL
DSF01S30SL
DSF01S30SL
Start of commercial production
2015-06
1.
1.
1.
1. Applications
Applications
Applications
Applications
• High-Speed Switching
2.
2.
2.
2. Features
Features
Features
Features
(1) Low forward voltage: V
F
= 0.41 V (typ.) @ I
F
= 100 mA
3.
3.
3.
3. Packaging and Internal Circuit
Packaging and Internal Circuit
Packaging and Internal Circuit
Packaging and Internal Circuit
1: Cathode
2: Anode
4.
4.
4.
4. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
a
a
a
a
= 25
= 25
= 25
= 25
)
)
)
)
Characteristics
Reverse voltage
Peak forward current
Average rectified current
Non-repetitive peak forward surge current
Junction temperature
Storage temperature
Symbol
V
R
I
FM
I
O
I
FSM
T
j
T
stg
Note
(Note 1)
(Note 2)
Rating
30
200
100
2
125
-55 to 125
Unit
V
mA
A
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Mounted on a glass epoxy circuit board of 25.4 mm × 25.4 mm × 1.6 mm, Pad dimension of 645 mm
2
.
Note 2: Measured with a 10 ms pulse.
2015-06-11
Rev.1.0