MMA1201P

ARCHIVED BY FREESCALE SEMICONDUCTOR, INC. 2005
ARCHIVED BY FREESCALE SEMICONDUCTOR, INC. 2005
4 Motorola Sensor Device Data
PRINCIPLE OF OPERATION
The Motorola accelerometer is a surface–micromachined
integrated–circuit accelerometer.
The device consists of a surface micromachined capaci-
tive sensing cell (g–cell) and a CMOS signal conditioning
ASIC contained in a single integrated circuit package. The
sensing element is sealed hermetically at the wafer level
using a bulk micromachined “cap’’ wafer.
The g–cell is a mechanical structure formed from semicon-
ductor materials (polysilicon) using semiconductor pro-
cesses (masking and etching). It can be modeled as two
stationary plates with a moveable plate in–between. The
center plate can be deflected from its rest position by sub-
jecting the system to an acceleration (Figure 2).
When the center plate deflects, the distance from it to one
fixed plate will increase by the same amount that the dis-
tance to the other plate decreases. The change in distance is
a measure of acceleration.
The g–cell plates form two back–to–back capacitors
(Figure 3). As the center plate moves with acceleration, the
distance between the plates changes and each capacitor’s
value will change, (C = Aε/D). Where A is the area of the
plate, ε is the dielectric constant, and D is the distance
between the plates.
The CMOS ASIC uses switched capacitor techniques to
measure the g–cell capacitors and extract the acceleration
data from the difference between the two capacitors. The
ASIC also signal conditions and filters (switched capacitor)
the signal, providing a high level output voltage that is ratio-
metric and proportional to acceleration.
Acceleration
Figure 2. Transducer
Physical Model
Figure 3. Equivalent
Circuit Model
SPECIAL FEATURES
Filtering
The Motorola accelerometers contain an onboard 4–pole
switched capacitor filter. A Bessel implementation is used
because it provides a maximally flat delay response (linear
phase) thus preserving pulse shape integrity. Because the fil-
ter is realized using switched capacitor techniques, there is
no requirement for external passive components (resistors
and capacitors) to set the cut–off frequency.
Self–Test
The sensor provides a self–test feature that allows the
verification of the mechanical and electrical integrity of the
accelerometer at any time before or after installation. This
feature is critical in applications such as automotive airbag
systems where system integrity must be ensured over the life
of the vehicle. A fourth “plate’’ is used in the g–cell as a self–
test plate. When the user applies a logic high input to the
self–test pin, a calibrated potential is applied across the
self–test plate and the moveable plate. The resulting elec-
trostatic force (Fe =
1
/
2
AV
2
/d
2
) causes the center plate to
deflect. The resultant deflection is measured by the accel-
erometer’s control ASIC and a proportional output voltage
results. This procedure assures that both the mechanical
(g–cell) and electronic sections of the accelerometer are
functioning.
Ratiometricity
Ratiometricity simply means that the output offset voltage
and sensitivity will scale linearly with applied supply voltage.
That is, as you increase supply voltage the sensitivity and
offset increase linearly; as supply voltage decreases, offset
and sensitivity decrease linearly. This is a key feature when
interfacing to a microcontroller or an A/D converter because
it provides system level cancellation of supply induced errors
in the analog to digital conversion process.
Status
Motorola accelerometers include fault detection circuitry
and a fault latch. The Status pin is an output from the fault
latch, OR’d with self–test, and is set high whenever one (or
more) of the following events occur:
Supply voltage falls below the Low Voltage Detect (LVD)
voltage threshold
Clock oscillator falls below the clock monitor minimum
frequency
Parity of the EPROM bits becomes odd in number.
The fault latch can be reset by a rising edge on the self–
test input pin, unless one (or more) of the fault conditions
continues to exist.
BASIC CONNECTIONS
Pinout Description for the Wingback Package
1
2
3
4
5
6
Pin No. Pin Name Description
1 Leave unconnected or connect to
signal ground
2 ST Logic input pin to initiate self test
3 V
OUT
Output voltage
4 Status Logic output pin to indicate fault
5 V
SS
Signal ground
6 V
DD
Supply voltage (5 V)
Wings Support pins, internally connected to
lead frame. Tie to V
SS
.
Freescale Semiconductor, I
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
nc
.
..
ARCHIVED BY FREESCALE SEMICONDUCTOR, INC. 2005
ARCHIVED BY FREESCALE SEMICONDUCTOR, INC. 2005
5Motorola Sensor Device Data
MMA2200W
ST
V
DD
V
SS
V
OUT
OUTPUT
SIGNAL
R1
1 k
3
C2
0.01 µF
2
6
5
LOGIC
INPUT
V
DD
C1
0.1 µF
Figure 4. Wingback Accelerometer with
Recommended Connection Diagram
STATUS
4
Pinout Description for the DIP Package
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
N/C
N/C
N/C
ST
V
OUT
STATUS
V
SS
V
DD
N/C
N/C
N/C
N/CN/C
N/C
N/C
N/C
N/C
Pin No.
Pin Name Description
1 Leave unconnected or connect to
signal ground.
2 thru 3 No internal connection. Leave
unconnected.
4 ST Logic input pin to initiate self
test.
5 V
OUT
Output voltage
6 Status Logic output pin to indicate
fault.
7 V
SS
Signal ground
8 V
DD
Supply voltage (5 V)
9 thru 13 Trim Pins Used for factory trim. Leave
unconnected.
14 thru 16 No internal connection. Leave
unconnected.
MMA1201P
ST
V
DD
V
SS
V
OUT
OUTPUT
SIGNAL
R1
1 k
5
C2
0.01 µF
4
8
7
LOGIC
INPUT
V
DD
C1
0.1 µF
Figure 5. DIP Accelerometer with Recommended
Connection Diagram
STATUS
6
PCB Layout
P0
A/D IN
V
RH
V
SS
V
DD
ST
V
OUT
V
SS
V
DD
0.01 µF
C
1 k
0.1 µF
C
0.1 µF
POWER SUPPLY
C
R
C
0.1 µF
MICROCONTROLLER
ACCELEROMETER
Figure 6. Recommend PCB Layout for Interfacing
Accelerometer to Microcontroller
P1STATUS
NOTES:
Use a 0.1 µF capacitor on V
DD
to decouple the power
source.
Physical coupling distance of the accelerometer to the
microcontroller should be minimal.
Place a ground plane beneath the accelerometer to reduce
noise, the ground plane should be attached to all of the
open ended terminals shown in Figure 6.
Use an RC filter of 1 k and 0.01 µF on the output of the
accelerometer to minimize clock noise (from the switched
capacitor filter circuit).
PCB layout of power and ground should not couple power
supply noise.
Accelerometer and microcontroller should not be a high
current path.
A/D sampling rate and any external power supply switching
frequency should be selected such that they do not inter-
fere with the internal accelerometer sampling frequency.
This will prevent aliasing errors.
Freescale Semiconductor, I
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
nc
.
..
ARCHIVED BY FREESCALE SEMICONDUCTOR, INC. 2005
ARCHIVED BY FREESCALE SEMICONDUCTOR, INC. 2005
6 Motorola Sensor Device Data
16 9
18
*
DIP PACKAGE
* When positioned as shown, the Earth’s gravity will result in a positive 1g output
Positive Acceleration Sensing Direction
WINGBACK PACKAGE
12
16
7
*
.090 .190 .290 .390 .490.000
.090
.033
Measurement in inches
Drilling Patterns
WB PACKAGE DRILLING PATTERN
.031
6X
.049
.047
2X
.590 .680
ORDERING INFORMATION
Device Temperature Range Case No. Package
MMA1201P –40 to +85°C Case 648C–04 Plastic DIP
MMA2200W –40 to +85°C Case 456–06 Plastic Wingback
Freescale Semiconductor, I
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
nc
.
..

MMA1201P

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
ACCELEROMETER 38G ANALOG 16DIP
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet