ISL6622ACRZ-T

7
FN6601.2
March 19, 2009
protection to the load if the upper MOSFET(s) is or becomes
shorted. If the PHASE node goes higher than the gate
threshold of the lower MOSFET, it results in the progressive
turn-on of the device and the effective clamping of the PHASE
node’s rise. The actual PHASE node clamping level depends
on the lower MOSFET’s electrical characteristics, as well as the
characteristics of the input supply and the path connecting it to
the respective PHASE node.
Internal Bootstrap Device
The ISL6622A features an internal bootstrap Schottky diode.
Simply adding an external capacitor across the BOOT and
PHASE pins completes the bootstrap circuit. The bootstrap
function is also designed to prevent the bootstrap capacitor
from overcharging due to the large negative swing at the
trailing-edge of the PHASE node. This reduces voltage
stress on the BOOT to PHASE pins.
The bootstrap capacitor must have a maximum voltage
rating well above the maximum voltage intended for UVCC.
Its minimum capacitance value can be chosen from
Equation 1.
where Q
G1
is the amount of gate charge per upper MOSFET
at V
GS1
gate-source voltage and N
Q1
is the number of
control MOSFETs. The ΔV
BOOT_CAP
term is defined as the
allowable droop in the rail of the upper gate drive. Select
results are exemplified in Figure 2.
Gate Drive Voltage Versatility
The ISL6622A provides the user flexibility in choosing the
gate drive voltage for efficiency optimization. The ISL6622A
upper gate drive is fixed to VCC [+12V] in the SOIC, but the
lower drive rail can be driven from 5V to 12V using the LVCC
pin. In the DFN package, a separate UVCC pin is available
for the upper gate drive voltage to be driven from 5V to 12V
for efficiency optimization, while the lower gate can be driven
independently using the LVCC pin from 5V to 12V.
Diode Emulation
Diode emulation allows for higher converter efficiency under
light-load situations. With diode emulation active, the
ISL6622A detects the zero current crossing of the output
inductor and turns off LGATE. This prevents the low side
MOSFET from sinking current and ensures that
discontinuous conduction mode (DCM) is achieved. The
LGATE has a minimum on-time of 350ns in DCM mode.
Power Dissipation
Package power dissipation is mainly a function of the
switching frequency (F
SW
), the output drive impedance, the
external gate resistance, and the selected MOSFET’s internal
gate resistance and total gate charge. Calculating the power
dissipation in the driver for a desired application is critical to
ensure safe operation. Exceeding the maximum allowable
power dissipation level may push the IC beyond the maximum
recommended operating junction temperature. The DFN
package is more suitable for high frequency applications. See
Layout Considerations” on page 8 for thermal transfer
improvement suggestions. When designing the driver into an
application, it is recommended that the following calculation is
used to ensure safe operation at the desired frequency for the
selected MOSFETs. The total gate drive power losses due to
the gate charge of MOSFETs and the driver’s internal circuitry
and their corresponding average driver current can be
estimated with Equations 2 and 3, respectively:
where the gate charge (Q
G1
and Q
G2
) is defined at a
particular gate to source voltage (V
GS1
and V
GS2
) in the
corresponding MOSFET data sheet; I
Q
is the driver’s total
quiescent current with no load at both drive outputs; N
Q1
and N
Q2
are number of upper and lower MOSFETs,
respectively; UVCC and LVCC are the drive voltages for
both upper and lower FETs, respectively. The I
Q*
VCC
product is the quiescent power of the driver without
capacitive load.
50nC
20nC
FIGURE 2. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE
VOLTAGE
ΔV
BOOT_CAP
(V)
C
BOOT_CAP
(µF)
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0.30.0 0.1 0.2 0.4 0.5 0.6 0.90.7 0.8 1.0
Q
GATE
= 100nC
C
BOOT_CAP
Q
GATE
ΔV
BOOT_CAP
--------------------------------------
Q
GATE
Q
G1
UVCC
V
GS1
------------------------------------
N
Q1
=
(EQ. 1)
P
Qg_TOT
P
Qg_Q1
P
Qg_Q2
I
Q
VCC++=
(EQ. 2)
P
Qg_Q1
Q
G1
UVCC
2
V
GS1
---------------------------------------
F
SW
N
Q1
=
P
Qg_Q2
Q
G2
LVCC
2
V
GS2
--------------------------------------
F
SW
N
Q2
=
I
DR
Q
G1
UVCC N
Q1
V
GS1
------------------------------------------------------
Q
G2
LVCC N
Q2
V
GS2
-----------------------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
F
SW
I
Q
+=
(EQ. 3)
ISL6622A
8
FN6601.2
March 19, 2009
The total gate drive power losses are dissipated among the
resistive components along the transition path, as outlined in
Equation 4. The drive resistance dissipates a portion of the
total gate drive power losses, the rest will be dissipated by the
external gate resistors (R
G1
and R
G2
) and the internal gate
resistors (R
GI1
and R
GI2
) of MOSFETs. Figures 3 and 4 show
the typical upper and lower gate drives turn-on current path.
Application Information
Layout Considerations
During switching of the devices, the parasitic inductances of
the PCB and the power devices’ packaging (both upper and
lower MOSFETs) leads to ringing, possibly in excess of the
absolute maximum rating of the devices. Careful layout can
help minimize such unwanted stress. The following advice is
meant to lead to an optimized layout:
Keep decoupling loops (LVCC-GND and BOOT-PHASE)
as short as possible.
Minimize trace inductance, especially low-impedance
lines: all power traces (UGATE, PHASE, LGATE, GND,
LVCC) should be short and wide, as much as possible.
Minimize the inductance of the PHASE node: ideally, the
source of the upper and the drain of the lower MOSFET
should be as close as thermally allowable.
Minimize the input current loop: connect the source of the
lower MOSFET to ground as close to the transistor pin as
feasible; input capacitors (especially ceramic decoupling)
should be placed as close to the drain of upper and source
of lower MOSFETs as possible.
In addition, for improved heat dissipation, place copper
underneath the IC whether it has an exposed pad or not. The
copper area can be extended beyond the bottom area of the
IC and/or connected to buried power ground plane(s) with
thermal vias. This combination of vias for vertical heat
escape, extended surface copper islands, and buried planes
combine to allow the IC and the power switches to achieve
their full thermal potential.
Upper MOSFET Self Turn-On Effects At Startup
Should the driver have insufficient bias voltage applied, its
outputs are floating. If the input bus is energized at a high
dV/dt rate while the driver outputs are floating, due to
self-coupling via the internal C
GD
of the MOSFET, the gate of
the upper MOSFET could momentarily rise up to a level
greater than the threshold voltage of the device, potentially
turning on the upper switch. Therefore, if such a situation
could conceivably be encountered, it is a common practice to
place a resistor (R
UGPH
) across the gate and source of the
upper MOSFET to suppress the Miller coupling effect. The
value of the resistor depends mainly on the input voltage’s
rate of rise, the C
GD
/C
GS
ratio, as well as the gate-source
threshold of the upper MOSFET. A higher dV/dt, a lower
C
DS
/C
GS
ratio, and a lower gate-source threshold upper FET
will require a smaller resistor to diminish the effect of the
internal capacitive coupling. For most applications, the
integrated 20kΩ resistor is sufficient, not affecting normal
performance and efficiency.
The coupling effect can be roughly estimated with
Equation 5, which assumes a fixed linear input ramp and
neglects the clamping effect of the body diode of the upper
drive and the bootstrap capacitor. Other parasitic
components such as lead inductances and PCB
capacitances, are also not taken into account. Figure 5
provides a visual reference for this phenomenon and its
potential solution.
FIGURE 3. TYPICAL UPPER-GATE DRIVE TURN-ON PATH
FIGURE 4. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
P
DR
P
DR_UP
P
DR_LOW
I
Q
VCC++=
(EQ. 4)
P
DR_UP
R
HI1
R
HI1
R
EXT1
+
--------------------------------------
R
LO1
R
LO1
R
EXT1
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q1
2
---------------------
=
P
DR_LOW
R
HI2
R
HI2
R
EXT2
+
--------------------------------------
R
LO2
R
LO2
R
EXT2
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q2
2
---------------------
=
R
EXT1
R
G1
R
GI1
N
Q1
-------------
+=
R
EXT2
R
G2
R
GI2
N
Q2
-------------
+=
Q1
D
S
G
R
GI1
R
G1
BOOT
R
HI1
C
DS
C
GS
C
GD
R
LO1
PHASE
UVCC
LVCC
Q2
D
S
G
R
GI2
R
G2
R
HI2
C
DS
C
GS
C
GD
R
LO2
V
GS_MILLER
dV
dt
-------
RC
rss
1e
V
DS
dV
dt
-------
RC
iss
----------------------------------
⎝⎠
⎜⎟
⎜⎟
⎜⎟
⎜⎟
⎛⎞
⋅⋅=
RR
UGPH
R
GI
+=
C
rss
C
GD
=
C
iss
C
GD
C
GS
+=
(EQ. 5)
ISL6622A
9
FN6601.2
March 19, 2009
Gate Drive Voltage Options
Intersil provides various gate drive voltage options in
ISL6622 product family, as shown in Table 2.
The ISL6622 can drop the low-side MOSFET’s gate drive
voltage when operating in DEM, while the high-side FET’s
gate drive voltage of the DFN package can be connected to
VCC or LVCC.
The ISL6622A allows the low-side MOSFET(s) to operate
from an externally-provided rail as low as 5V, eliminating the
LDO losses, while the high-side MOSFET’s gate drive
voltage of the DFN package can be connected to VCC or
LVCC.
The ISL6622B sets the low-side MOSFET’s gate drive
voltage at a fixed, programmable LDO level, while the high-
side FETs’ gate drive voltage of the DFN package can be
connected to VCC or LVCC.
FIGURE 5. GATE-TO-SOURCE RESISTOR TO REDUCE
UPPER MOSFET MILLER COUPLING
VIN
Q
UPPER
D
S
G
R
GI
R
UGPH
BOOT
DU
C
DS
C
GS
C
GD
DL
PHASE
UVCC
ISL6622A
C
BOOT
UGATE
TABLE 1. ISL6622 FAMILY OPTIONS
POWER RAILS
LVCC
UVCC VCCPSI
= LOW PSI = HIGH
ISL6622 SOIC 5.75V 11.2V VCC Operating Voltage Ranges from 6.8V to 13.2V
DFN Programmable 11.2V Own Rail
ISL6622A SOIC Own Rail VCC
DFN Own Rail Own Rail
ISL6622B SOIC 5.75V VCC
DFN Programmable Own Rail
ISL6622A

ISL6622ACRZ-T

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
Gate Drivers SYNCH BUCK MSFT HV DRVR NOLDO VR11 1
Lifecycle:
New from this manufacturer.
Delivery:
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