844001 Data Sheet
©2016 Integrated Device Technology, Inc June 2, 20167
APPLICATION INFORMATION
Figure 2. CRYSTAL INPUt INTERFACE
CRYSTAL INPUT INTERFACE
The 844001 has been characterized with 18pF parallel
resonant crystals. The capacitor values, C1 and C2, shown in
Figure 2 below were determined using a 26.5625MHz, 18pF
parallel resonant crystal and were chosen to minimize the ppm
error. The optimum C1 and C2 values can be slightly adjusted
for different board layouts.
POWER SUPPLY FILTERING TECHNIQUES
As in any high speed analog circuitry, the power supply
pins are vulnerable to random noise. The 844001 pro-
vides separate power supplies to isolate any high switching
noise from the outputs to the internal PLL. V
DD
and V
DDA
should be
individually connected to the power supply plane through vias, and
bypass capacitors should be used for each pin. To achieve optimum
jitter performance, power supply isolation is required. Figure 1 illus-
trates how a 10Ω resistor along with a 10μF and a .01μF bypass
capacitor should be connected to each V
DDA
pin.
FIGURE 1. POWER SUPPLY FILTERING
10Ω
V
DDA
10μF
.01μF
3.3V or 2.5V
.01μF
V
DD
844001 Data Sheet
©2016 Integrated Device Technology, Inc June 2, 20168
3.3V, 2.5V LVDS DRIVER TERMINATION
A general LVDS interface is shown in Figure 4. In a 100Ω
differential transmission line environment, LVDS drivers
require a matched load termination of 100Ω across near
FIGURE 4. TYPICAL LVDS DRIVER TERMINATION
the receiver input. For a multiple LVDS outputs buffer, if only
partial outputs are used, it is recommended to terminate the
unused outputs.
2.5V or 3.3V
+
-
VDD
100 Ohm Differential Transmission Line
R1
100
LVDS_Driv er
844001 Data Sheet
©2016 Integrated Device Technology, Inc June 2, 20169
POWER CONSIDERATIONS
This section provides information on power dissipation and junction temperature for the 844001.
Equations and example calculations are also provided.
1. Power Dissipation.
The total power dissipation for the 844001 is the sum of the core power plus the power dissipated in the load(s).
The following is the power dissipation for V
DD
= 3.3V + 5% = 3.465V, which gives worst case results.
Power (core)
MAX
= V
DD_MAX
* (I
DD_MAX
+ I
DDA_MAX
) = 3.465V * (115mA + 12mA) = 440mW
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad and directly affects the reliability of the
device. The maximum recommended junction temperature is 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA
Tj = Junction Temperature
θ
JA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
T
A
= Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θ
JA
must be used. Assuming a moderate
air fl ow of 1 meter per second and a multi-layer board, the appropriate value is 90.5°C/W per Table 6 below.
Therefore, Tj for an ambient temperature of 70°C with all outputs switching is:
70°C + 0.440W *90.5°C/W = 109.8°C. This is well below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air fl ow, and the
type of board (single layer or multi-layer).
TABLE 6. THERMAL RESISTANCE θ
JA
FOR 8-PIN TSSOP, FORCED CONVECTION
θ
JA
by Velocity (Meters per Second)
0 1 2.5
Multi-Layer PCB, JEDEC Standard Test Boards 101.7°C/W 90.5°C/W 89.8°C/W

844001AGLF

Mfr. #:
Manufacturer:
IDT
Description:
Clock Generators & Support Products FC1/FC2 FemtoClock LVDS Synthesize
Lifecycle:
New from this manufacturer.
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