CAT28C256
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4
Table 4. MODE SELECTION
Mode CE WE OE I/O Power
Read L H L D
OUT
ACTIVE
Byte Write (WE Controlled) L H D
IN
ACTIVE
Byte Write (CE Controlled) L H D
IN
ACTIVE
Standby and Write Inhibit H X X High−Z STANDBY
Read and Write Inhibit X H H High−Z ACTIVE
Table 5. CAPACITANCE (T
A
= 25°C, f = 1.0 MHz, V
CC
= 5 V)
Symbol Test Max Conditions Units
C
I/O
(Note 7) Input/Output Capacitance 10 V
I/O
= 0 V pF
C
IN
(Note 7) Input Capacitance 6 V
IN
= 0 V pF
7. This parameter is tested initially and after a design or process change that affects the parameter.
Table 6. A.C. CHARACTERISTICS, READ CYCLE (V
CC
= 5 V ±10%, unless otherwise specified.)
Symbol Parameter
28C256−12 28C256−15
Units
Min Max Min Max
t
RC
Read Cycle Time 120 150 ns
t
CE
CE Access Time 120 150 ns
t
AA
Address Access Time 120 150 ns
t
OE
OE Access Time 50 70 ns
t
LZ
(Note 8) CE Low to Active Output 0 0 ns
t
OLZ
(Note 8) OE Low to Active Output 0 0 ns
t
HZ
(Notes 8, 9) CE High to High−Z Output 50 50 ns
t
OHZ
(Notes 8, 9) OE High to High−Z Output 50 50 ns
t
OH
(Note 8) Output Hold from Address Change 0 0 ns
8. This parameter is tested initially and after a design or process change that affects the parameter.
9. Output floating (High−Z) is defined as the state when the external data line is no longer driven by the output buffer.