HCPL-M601-500E

7
Notes:
1. Bypassing of the power supply line is required with a 0.1 μF ceramic disc capacitor adjacent to each optocoupler. The total lead length be-
tween both ends of the capacitor and the isolator pins should not exceed 10 mm.
2. Peaking circuits may produce transient input currents up to 50 mA, 50 ns maximum pulse width, provided average current does not exceed
20 mA.
3. Device considered a two terminal device: pins 1 and 3 shorted together, and pins 4, 5 and 6 shorted together.
4. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 4500 V
RMS
for 1 second (Leakage detec-
tion current limit, I
I-O
≤ 5 μA).
5. The t
PLH
propagation delay is measured from 3.75 mA point on the falling edge of the input pulse to the 1.5 V point on the rising edge of the
output pulse.
6. The t
PHL
propagation delay is measured from 3.75 mA point on the rising edge of the input pulse to the 1.5 V point on the falling edge of the
output pulse.
7. CM
H
is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in a high logic state (i.e., V
OUT
>
2.0 V).
8. CM
L
is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state (i.e., V
OUT
> 0.8
V).
9. For sinusoidal voltages, (|dV
CM
|/dt)
max
= Sf
CM
V
CM(p-p)
.
10. See application section; “Propagation Delay, Pulse-Width Distortion and Propagation Delay Skew” for more information.
11. t
PSK
is equal to the worst case differ ence in t
PHL
and/or t
PLH
that will be seen between units at any given temperature within the worst case
operating condition range.
Switching Specifications
Over recommended temperature (T
A
= -40°C to 85°C), V
CC
= 5 V, I
F
= 7.5 mA unless otherwise specified.
Device
Parameter Symbol HCPL- Min. Typ.* Max. Unit Test Conditions Fig. Note
Propagation t
PLH
20 48 75 ns T
A
= 25°C R
L
= 350 Ω 6, 7 5
Delay Time
to High 100
C
L
= 15 pF
8
Output Level
Propagation t
PHL
25 50 75 T
A
= 25°C 6, 7 6
Delay Time
to Low 100 8
Output Level
Propagation t
PSK
40 10,
Delay Skew 11
Pulse Width |t
PHL
- t
PLH
| 3.5 35 9 10
Distortion
Output Rise t
rise
24
Time 10
(10%-90%)
Output Fall t
fall
10
Time 10
(10%-90%)
Common |CM
H
| M600 10,000 V/μs V
CM
= 10 V V
O(min)
= 2 V 11 7, 9
M601 5,000 10,000 V
CM
= 50 V
M611 10,000 15,000 V
CM
= 1000 V
Common |CM
H
| M600 10,000 V
CM
= 10 V V
O(max)
= 0.8 V 11 8, 9
M601 5,000 10,000 V
CM
= 50 V
M611 10,000 15,000 V
CM
= 1000 V
*All typicals at T
A
= 25°C, V
CC
= 5 V.
Mode Transient
Immunity at High
Output Level
Mode Transient
Immunity at Low
Output Level
R
L
= 350 Ω
I
F
= 7.5 mA
T
A
= 25°C
R
L
= 350 Ω
I
F
= 0 mA
T
A
= 25°C
8
Figure 5. Low Level Output Current vs. Temperature.
Figure 4. Output Voltage vs. Forward Input current.
Figure 1. High Level Output Current vs. Temperature. Figure 2. Low Level Output Voltage vs. Temperature. Figure 3. Input Diode Forward Characteristic.
Figure 6. Test Circuit for t
PHL
and t
PLH
.
I
OH
– HIGH LEVEL OUTPUT CURRENT – μA
-60
0
T
A
– TEMPERATURE – °C
100
10
15
-20
5
20
V
CC
= 5.5 V
V
O
= 5.5 V
I
F
= 250 μA
60
-40 0 40 80
V
CC
= 5.5 V
I
F
= 5.0 mA
0.5
0.4
-60 -20 20
60
100
T
A
– TEMPERATURE – °C
0.3
80400-40
0.1
V
OL
– LOW LEVEL OUTPUT VOLTAGE – V
0.2
I
O
= 16 mA
I
O
= 12.8 mA
I
O
= 9.6 mA
I
O
= 6.4 mA
V
F
– FORWARD VOLTAGE – VOLTS
10
0.1
0.01
1.10 1.20 1.30 1.40
I
F
– FORWARD CURRENT – mA
1.601.50
1.0
0.001
100
I
F
V
F
+
T
A
= 25°C
1
6
2
3
4
5
1234
5
6
I
F
– FORWARD INPUT CURRENT – mA
R
L
= 350 Ω
R
L
= 1 KΩ
R
L
= 4 KΩ
0
0
V
CC
= 5 V
T
A
= 25 °C
V
O
– OUTPUT VOLTAGE – V
I
OL
– LOW LEVEL OUTPUT CURRENT – mA
-60
0
T
A
– TEMPERATURE – °C
100
60
80
-20
20
20
V
CC
= 5.0 V
V
OL
= 0.6 V
60-40 0 40 80
40
I
F
= 10 mA, 15 mA
I
F
= 5.0 mA
OUTPUT V
O
MONITORING
NODE
1.5 V
t
PLH
t
PHL
I
F
INPUT
V
O
OUTPUT
I
F
= 7.5 mA
I
F
= 3.75 mA
+5 V
I
F
R
L
R
M
0.1μF
BYPASS
*C
L
*C
L
IS APPROXIMATELY 15 pF WHICH INCLUDES
PROBE AND STRAY WIRING CAPACITANCE.
INPUT
MONITORING
NODE
PULSE GEN.
Z
O
= 50 Ω
t
f
= t
r
= 5 ns
V
CC
GND
1
3
6
5
4
9
Figure 12. Temperature Coefficient for Forward Voltage
vs. Input Current.
Figure 10. Rise and Fall Time vs. Temperature.
Figure 9. Pulse Width Distortion vs. Temperature.Figure 8. Propagation Delay vs. Pulse Input Current.Figure 7. Propagation Delay vs. Temperature.
Figure 11. Test Circuit for Common Mode Transient Immunity and Typical Waveforms.
V
CC
= 5.0 V
I
F
= 7.5 mA
100
80
-60 -20 20
60
100
T
A
– TEMPERATURE – °C
60
80400-40
0
t
P
– PROPAGATION DELAY – ns
40
20
t
PLH
, R
L
= 4 KΩ
t
PLH
, R
L
= 1 KΩ
t
PLH
, R
L
= 350 Ω
t
PHL
, R
L
= 350 Ω
1 KΩ
4 KΩ
V
CC
= 5.0 V
T
A
= 25°C
105
90
5913
I
F
– PULSE INPUT CURRENT – mA
75
15117
30
t
P
– PROPAGATION DELAY – ns
60
45
t
PLH
, R
L
= 4 KΩ
t
PLH
, R
L
= 1 KΩ
t
PLH
, R
L
= 350 Ω
t
PHL
, R
L
= 350 Ω
1 KΩ
4 KΩ
V
CC
= 5.0 V
I
F
= 7.5 mA
40
30
-20 20
60
100
T
A
– TEMPERATURE – °C
20
80400-40
PWD – PULSE WIDTH DISTORTION – ns
10
R
L
= 350 kΩ
R
L
= 1 kΩ
R
L
= 4 kΩ
0
-60
-10
t
r
, t
f
– RISE, FALL TIME – ns
-60
0
T
A
– TEMPERATURE – °C
100
300
-20
40
20 60-40 0 40 80
60
290
20
V
CC
= 5.0 V
I
F
= 7.5 mA
R
L
= 4 kΩ
R
L
= 1 kΩ
R
L
= 350 Ω, 1 kΩ, 4 kΩ
t
RISE
t
FALL
R
L
= 350 Ω
dVF/
dT
– FORWARD VOLTAGE
TEMPERATURE COEFFICIENT – mV/°C
0.1 1 10 100
I
F
– PULSE INPUT CURRENT – mA
-1.4
-2.2
-2.0
-1.8
-1.6
-1.2
-2.4
V
O
0.5 V
V
O
(MIN.)
5 V
0 V
SWITCH AT A: I
F
= 0 mA
SWITCH AT B: I
F
= 7.5 mA
V
CM
CM
H
CM
L
V
O
(MAX.)
V
CM
(PEAK)
V
O
+5 V
0.1 μF
BYPASS
+
_
350 Ω
V
FF
1
3
6
5
4
B
A
OUTPUT V
O
MONITORING
NODE
I
F
PULSE
GENERATOR
Z
O
= 50 Ω
V
CC
GND

HCPL-M601-500E

Mfr. #:
Manufacturer:
Broadcom / Avago
Description:
High Speed Optocouplers 10MBd 3750Vdc
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union