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602-00009

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P28
2003 Jun 25 10
Philips Semiconductors Product specification
8-bit serial-in, serial or parallel-out shift
register with output latches; 3-state
74HC595; 74HCT595
Note
1. All typical values are measured at T
amb
=25°C.
T
amb
= −40 to +125 °C
V
IH
HIGH-level input
voltage
2.0 1.5 −−V
4.5 3.15 −−V
6.0 4.2 −−V
V
IL
LOW-level input
voltage
2.0 −−0.5 V
4.5 −−1.35 V
6.0 −−1.8 V
V
OH
HIGH-level output
voltage
V
I
=V
IH
or V
IL
all outputs
I
O
= −20 µA 2.0 1.9 −−V
4.5 4.4 −−V
6.0 5.9 −−V
Q7’ standard output
I
O
= −4.0 mA 4.5 3.7 −−V
I
O
=−5.2 mA 6.0 5.2 −−V
Qn bus driver outputs
I
O
= −6.0 mA 4.5 3.7 −−V
I
O
=−7.8 mA 6.0 5.2 −−V
V
OL
LOW-level output
voltage
V
I
=V
IH
or V
IL
all outputs
I
O
=20µA 4.5 −−0.1 V
Q7’ standard output
I
O
= 4.0 mA 4.5 −−0.4 V
Qn bus driver outputs
I
O
= 6.0 mA 4.5 −−0.4 V
I
LI
input leakage current V
I
=V
CC
or GND 5.5 −−±1.0 µA
I
OZ
3-state output
OFF-state current
V
I
=V
IH
or V
IL
;
V
O
=V
CC
or GND
5.5 −−±10.0 µA
I
CC
quiescent supply
current
V
I
=V
CC
or GND;
I
O
=0
5.5 −−160 µA
SYMBOL PARAMETER
TEST CONDITIONS
MIN. TYP. MAX. UNIT
OTHER V
CC
(V)
2003 Jun 25 11
Philips Semiconductors Product specification
8-bit serial-in, serial or parallel-out shift
register with output latches; 3-state
74HC595; 74HCT595
Type 74HCT
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); t
r
=t
f
= 6 ns; C
L
=50pF.
SYMBOL PARAMETER
TEST CONDITIONS
MIN. TYP. MAX. UNIT
OTHER V
CC
(V)
T
amb
= −40 to +85 °C; note 1
V
IH
HIGH-level input
voltage
4.5 to 5.5 2.0 1.6 − V
V
IL
LOW-level input
voltage
4.5 to 5.5 − 1.2 0.8 V
V
OH
HIGH-level output
voltage
V
I
=V
IH
or V
IL
all outputs
I
O
= −20 µA 4.5 4.4 4.5 − V
Q7’ standard output
I
O
= −4.0 mA 4.5 3.84 4.32 − V
Qn bus driver outputs
I
O
= −6.0 mA 4.5 3.7 4.32 − V
V
OL
LOW-level output
voltage
V
I
=V
IH
or V
IL
all outputs
I
O
=20µA 4.5 − 0 0.33 V
Q7’ standard output
I
O
= 4.0 mA 4.5 − 0.15 0.33 V
Qn bus driver outputs
I
O
= 6.0 mA 4.5 − 0.16 0.33 V
I
LI
input leakage current V
I
=V
CC
or GND 5.5 −−±1.0 µA
I
OZ
3-state output
OFF-state current
V
I
=V
IH
or V
IL
;
V
O
=V
CC
or GND
5.5 −−±5.0 µA
I
CC
quiescent supply
current
V
I
=V
CC
or GND;
I
O
=0
5.5 −−80 µA
∆I
CC
additional supply
current per input
V
I
=V
CC
− 2.1 V;
I
O
= 0; note 2
4.5 to 5.5 − 100 450 µA
2003 Jun 25 12
Philips Semiconductors Product specification
8-bit serial-in, serial or parallel-out shift
register with output latches; 3-state
74HC595; 74HCT595
Notes
1. All typical values are measured at T
amb
=25°C.
2. The value of additional quiescent supply current (∆I
CC
) for a unit load of 1 is given here. To determine ∆I
CC
per input,
multiply this value by the unit load coefficient per input pin:
a. pin DS: 0.25
b. pins MR, SH_CP, ST_CP and OE: 1.50.
T
amb
= −40 to +125 °C
V
IH
HIGH-level input
voltage
4.5 to 5.5 2.0 −−V
V
IL
LOW-level input
voltage
4.5 to 5.5 −−0.8 V
V
OH
HIGH-level output
voltage
V
I
=V
IH
or V
IL
all outputs
I
O
= −20 µA 4.5 4.4 −−V
Q7’ standard output
I
O
= −4.0 mA 4.5 3.7 −−V
Qn bus driver outputs
I
O
= −6.0 mA 4.5 3.7 −−V
V
OL
LOW-level output
voltage
V
I
=V
IH
or V
IL
all outputs
I
O
=20µA 4.5 −−0.1 V
Q7’ standard output
I
O
= 4.0 mA 4.5 −−0.4 V
Qn bus driver outputs
I
O
= 6.0 mA 4.5 −−0.4 V
I
LI
input leakage current V
I
=V
CC
or GND 5.5 −−±1.0 µA
I
OZ
3-state output
OFF-state current
V
I
=V
IH
or V
IL
;
V
O
=V
CC
or GND
5.5 −−±10.0 µA
I
CC
quiescent supply
current
V
I
=V
CC
or GND;
I
O
=0
5.5 −−160 µA
∆I
CC
additional supply
current per input
V
I
=V
CC
− 2.1 V;
I
O
= 0; note 2
4.5 to 5.5 −−490 µA
SYMBOL PARAMETER
TEST CONDITIONS
MIN. TYP. MAX. UNIT
OTHER V
CC
(V)
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P28

602-00009

Mfr. #:
Buy 602-00009
Manufacturer:
Parallax
Description:
Counter Shift Registers Serial to Parallel 74HC595
Lifecycle:
New from this manufacturer.
Delivery:
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