MTFDDAV120MAV-1AE12ABYY Datasheet MTFDDAV120MAV-1AE12ABYY, MTFDDAV240MAV-1AE12ABYY | P7-P9

Reliability

Micron’s SSDs incorporate advanced technology for defect and error management.

They use various combinations of hardware-based error correction algorithms and

firmware-based static and dynamic wear-leveling algorithms.

Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-

fined as data that is reported as successfully programmed to the SSD but when it is read

out of the SSD, the data differs from what was programmed.

Table 6: Uncorrectable Bit Error Rate

Uncorrectable Bit Error Rate Operation

<1 sector per 10

bits read READ

Mean Time To Failure

Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-

ability data using the methods referenced in the Telcordia SR-332 reliability prediction

procedures for electronic equipment.

Table 7: MTTF

Capacity MTTF (Operating Hours)

120GB 1.2 million

240GB 1.2 million

480GB 1.2 million

960GB 1.2 million

Note:

1. The product achieves a mean time to failure (MTTF) of 1.2 million hours, based on popu-

lation statistics not relevant to individual units.

M500 2.5-Inch NAND Flash SSD

Reliability

PDF: 09005aef84fed121

m500_2_5_ssd.pdf - Rev. E 9/13 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Endurance

Endurance for the SSD can be predicted based on the usage conditions applied to the

device, the internal NAND component cycles, the write amplification factor, and the

wear-leveling efficiency of the drive. The tables below show the drive lifetime for each

SSD capacity by client computing and sequential input and based on predefined usage

conditions.

Table 8: Drive Lifetime – Client Computing

Capacity Drive Lifetime (Total Bytes Written)

120GB 72TB

240GB 72TB

480GB 72TB

960GB 72TB

Notes:

1. Total bytes written calculated with the drive 90% full.

2. Access patterns used during reliability testing are 25% sequential and 75% random and

consist of the following: 50% are 4KiB; 40% are 64KiB; and 10% are 128KiB.

3. GB/day can be calculated by dividing the total bytes written value by (365 × number of

years). For example: 72TB/5 years/365 days = 40 GB/day for 5 years.

Table 9: Drive Lifetime – Sequential Input

Capacity Drive Lifetime (Total Bytes Written)

120GB 125TB

240GB 250TB

480GB 500TB

960GB 500TB

Notes:

1. Endurance of Client SSDs in some data center applications can be maximized by imple-

menting workloads which are sequential when writing, with read-intensive access. Mi-

cron recommends no higher than 20% of input/output operations be writes.

2. Micron recommends sequential writes in transfer sizes of 128KiB or integer multiples of

128KiB which are 4KiB-aligned. Contact Micron for details.

M500 2.5-Inch NAND Flash SSD

Reliability

PDF: 09005aef84fed121

m500_2_5_ssd.pdf - Rev. E 9/13 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Electrical Characteristics

Environmental conditions beyond those listed may cause permanent damage to the de-

vice. This is a stress rating only, and functional operation of the device at these or any

other conditions above those indicated in the operational sections of this specification

is not implied. Exposure to absolute maximum rating conditions for extended periods

may affect reliability.

Table 10: SATA Power Consumption

Capacity

Device Sleep

Average Idle Average Active Average

Active Maximum

(128KB transfer) Unit

120GB <5 80 150 2100 mW

240GB <5 95 150 3200 mW

480GB <10 100 150 3600 mW

960GB <20 100 150 3800 mW

Notes:

1. Data taken at 25°C using a 6 Gb/s SATA interface.

2. Active average power measured while running MobileMark Productivity Suite.

3. DIPM (device-initiated power management) enabled. DIPM Slumber supported.

4. Active maximum power is measured using Iometer with 128KB sequential write trans-

fers.

Table 11: Maximum Ratings

Parameter/Condition Symbol Min Max Unit

Voltage input V5 4.5 5.5 V

Operating temperature T

0 70 °C

Non-operating temperature –40 85 °C

Rate of temperature change – 20 °C/hour

Relative humidity (non-condensing) 5 95 %

Notes:

1. Temperature is best measured by reading the SSD's on-board temperature sensor, which

is recorded in SMART attribute 194 (or 0xC2).

2. Power-off sequence: When the SSD is shut down, the ATA STANDBY IMMEDIATE (STBI)

command should be the last command sent by the host and acknowledged by the SSD.

Failure to follow this process might result in a longer than normal time-to-ready (TTR)

during the subsequent power-on sequence. TTR is the time from power-on to drive

ready to accept SATA commands.

Table 12: Shock and Vibration

Parameter/Condition Specification

Non-operating shock 1500G/0.5ms

Non-operating vibration 5–800Hz @ 3.13G

M500 2.5-Inch NAND Flash SSD

Electrical Characteristics

PDF: 09005aef84fed121

m500_2_5_ssd.pdf - Rev. E 9/13 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

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MTFDDAV120MAV-1AE12ABYY

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Description:

SSD 120GB M.2 MLC SATA III 3V

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