13
The single ended analog input can be DC coupled
(Figure
20) as long as the input is within the analog input
common mode voltage range.
The resistor, R, in Figure 20 is not absolutely necessary but
may be used as a load setting resistor. A capacitor, C,
connected from V
IN
+ to V
IN
- will help filter any high
frequency noise on the inputs, also improving performance.
Values around 20pF are sufficient and can be used on AC
coupled inputs as well. Note, however, that the value of
capacitor C chosen must take into account the highest
frequency component of the analog input signal.
A single ended source may give better overall system
performance if it is first converted to differential before
driving the HI5767.
Digital Output Control and Clock Requirements
The HI5767 provides a standard high-speed interface to
external TTL logic families.
In order to ensure rated performance of the HI5767, the duty
cycle of the clock should be held at 50% 5%. It must also
have low jitter and operate at standard TTL levels.
Performance of the HI5767 will only be guaranteed at
conversion rates above 1 MSPS. This ensures proper
performance of the internal dynamic circuits. Similarly, when
power is first applied to the converter, a maximum of 20
cycles at a sample rate above 1 MSPS will have to be
performed before valid data is available.A Data Format
Select (DFS) pin is provided which will determine the format
of the digital data outputs. When at logic low, the data will be
output in offset binary format. When at logic high, the data
will be output in two’s complement format. Refer to Table 1
for further information.
The output enable pin, OE, when pulled high will three-state
the digital outputs to a high impedance state. Set the
OE
input to logic low for normal operation.
Supply and Ground Considerations
The HI5767 has separate analog and digital supply and
ground pins to keep digital noise out of the analog signal
path. The digital data outputs also have a separate supply
pin, DV
CC2
, which can be powered from a 3.0V or 5.0V
supply. This allows the outputs to interface with 3.0V logic if
so desired.
The part should be mounted on a board that provides separate
low impedance connections for the analog and digital supplies
and grounds. For best performance, the supplies to the HI5767
should be driven by clean, linear regulated supplies. The board
should also have good high frequency decoupling capacitors
mounted as close as possible to the converter. If the part is
powered off a single supply, then the analog supply should be
isolated with a ferrite bead from the digital supply.
Refer to the application note “Using Intersil High Speed A/D
Converters” (AN9214) for additional considerations when
using high speed converters.
Static Performance Definitions
Offset Error (V
OS
)
The midscale code transition should occur at a level
1
/
4
LSB
above half-scale. Offset is defined as the deviation of the
actual code transition from this point.
Full-Scale Error (FSE)
The last code transition should occur for an analog input that
is
3
/
4
LSB below Positive Full Scale (+FS) with the offset
error removed. Full scale error is defined as the deviation of
the actual code transition from this point.
Differential Linearity Error (DNL)
DNL is the worst case deviation of a code width from the
ideal value of 1 LSB.
Integral Linearity Error (INL)
INL is the worst case deviation of a code center from a best
fit straight line calculated from the measured data.
Power Supply Sensitivity
Each of the power supplies are moved plus and minus 5% and
the shift in the offset and full scale error (in LSBs) is noted.
Dynamic Performance Definitions
Fast Fourier Transform (FFT) techniques are used to evaluate
the dynamic performance of the HI5767. A low distortion sine
wave is applied to the input, it is coherently sampled, and the
output is stored in RAM. The data is then transformed into the
frequency domain with an FFT and analyzed to evaluate the
dynamic performance of the A/D. The sine wave input to the
part is typically -0.5dB down from full scale for all these tests.
SNR and SINAD are quoted in dB. The distortion numbers are
quoted in dBc (decibels with respect to carrier) and DO NOT
include any correction factors for normalizing to full scale.
The Effective Number of Bits (ENOB) is calculated from the
SINAD data by:
ENOB = (SINAD - 1.76 + V
CORR
) / 6.02,
OE INPUT DIGITAL DATA OUTPUTS
0 Active
1 High Impedance
V
IN
+
V
IN
-
HI5767
V
DC
R
C
V
IN
V
DC
FIGURE 19. DC COUPLED SINGLE ENDED INPUT
HI5767
14
where: V
CORR
= 0.5 dB (Typical).
V
CORR
adjusts the SINAD, and hence the ENOB, for the
amount the analog input signal is backed off from full scale.
Signal To Noise and Distortion Ratio (SINAD)
SINAD is the ratio of the measured RMS signal to RMS sum
of all the other spectral components below the Nyquist
frequency, f
S
/2, excluding DC.
Signal To Noise Ratio (SNR)
SNR is the ratio of the measured RMS signal to RMS noise at
a specified input and sampling frequency. The noise is the
RMS sum of all of the spectral components below f
S
/2
excluding the fundamental, the first five harmonics and DC.
Total Harmonic Distortion (THD)
THD is the ratio of the RMS sum of the first 5 harmonic
components to the RMS value of the fundamental input signal.
2nd and 3rd Harmonic Distortion
This is the ratio of the RMS value of the applicable harmonic
component to the RMS value of the fundamental input signal.
Spurious Free Dynamic Range (SFDR)
SFDR is the ratio of the fundamental RMS amplitude to the
RMS amplitude of the next largest spectral component in the
spectrum below f
S
/2.
Intermodulation Distortion (IMD)
Nonlinearities in the signal path will tend to generate
intermodulation products when two tones, f
1
and f
2
, are
present at the inputs. The ratio of the measured signal to the
distortion terms is calculated. The terms included in the
calculation are (f
1
+f
2
), (f
1
-f
2
), (2f
1
), (2f
2
), (2f
1
+f
2
), (2f
1
-f
2
),
(f
1
+2f
2
), (f
1
-2f
2
). The ADC is tested with each tone 6dB
below full scale.
Transient Response
Transient response is measured by providing a full-scale
transition to the analog input of the ADC and measuring the
number of cycles it takes for the output code to settle within
10-bit accuracy.
Over-Voltage Recovery
Over-Voltage Recovery is measured by providing a full-scale
transition to the analog input of the ADC which overdrives
the input by 200mV, and measuring the number of cycles it
takes for the output code to settle within 10-bit accuracy.
Full Power Input Bandwidth (FPBW)
Full power input bandwidth is the analog input frequency at
which the amplitude of the digitally reconstructed output has
decreased 3dB below the amplitude of the input sine wave.
The input sine wave has an amplitude which swings from
-FS to +FS. The bandwidth given is measured at the
specified sampling frequency.
HI5767
15
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Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
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Video Definitions
Differential Gain and Differential Phase are two commonly
found video specifications for characterizing the distortion of
a chrominance signal as it is offset through the input voltage
range of an ADC.
Differential Gain (DG)
Differential Gain is the peak difference in chrominance
amplitude (in percent) relative to the reference burst.
Differential Phase (DP)
Differential Phase is the peak difference in chrominance
phase (in degrees) relative to the reference burst.
Timing Definitions
Refer to Figure 1 and Figure 2 for these definitions.
Aperture Delay (t
AP
)
Aperture delay is the time delay between the external
sample command (the falling edge of the clock) and the time
at which the signal is actually sampled. This delay is due to
internal clock path propagation delays.
Aperture Jitter (t
AJ
)
Aperture jitter is the RMS variation in the aperture delay due
to variation of internal clock path delays.
Data Hold Time (t
H
)
Data hold time is the time to where the previous data (N - 1)
is no longer valid.
Data Output Delay Time (t
OD
)
Data output delay time is the time to where the new data (N)
is valid.
Data Latency (t
LAT
)
After the analog sample is taken, the digital data representing
an analog input sample is output to the digital data bus on
the 7th cycle of the clock after the analog sample is taken.
This is due to the pipeline nature of the converter where the
analog sample has to ripple through the internal subconverter
stages. This delay is specified as the data latency. After the
data latency time, the digital data representing each
succeeding analog sample is output during the following
clock cycle. The digital data lags the analog input sample by 7
sample clock cycles.
Power-Up Initialization
This time is defined as the maximum number of clock cycles
that are required to initialize the converter at power-up. The
requirement arises from the need to initialize the dynamic
circuits within the converter.
HI5767

HI5767/4CB

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
IC ADC 10BIT PIPELINED 28SOIC
Lifecycle:
New from this manufacturer.
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