IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by one or more of the following U.S. patents: 4,835,592 4,881,106 5,017,508 5,049,961 5,187,117 5,486,715 6,306,728B1
4,850,072 4,931,844 5,034,796 5,063,307 5,237,481 5,381,025
Symbol Test Conditions Characteristic Values
(T
J
= 25°C, unless otherwise specified)
min. typ. max.
g
fs
V
DS
= 10 V; I
D
= 0.5 I
D25
Note 1 45 S
C
iss
9400 pF
C
oss
V
GS
= 0 V, V
DS
= 25 V, f = 1 MHz 1280 pF
C
rss
460 pF
t
d(on)
45 ns
t
r
V
GS
= 10 V, V
DS
= 0.5 V
DSS
, I
D
= 0.5 I
D25
60 ns
t
d(off)
R
G
= 2 Ω (External), 120 ns
t
f
45 ns
Q
g(on)
330 nC
Q
gs
V
GS
= 10 V, V
DS
= 0.5 V
DSS
, I
D
= 0.5 I
D25
55 nC
Q
gd
155 nC
R
thJC
0.22 K/W
R
thCK
0.15 K/W
Source-Drain Diode Characteristic Values
(T
J
= 25°C, unless otherwise specified)
Symbol Test Conditions min. typ. max.
I
S
V
GS
= 0 V 55N50 55 A
50N50 50 A
I
SM
Repetitive; 55N50 220 A
pulse width limited by T
JM
50N50 200 A
V
SD
I
F
= I
S
, V
GS
= 0 V Note 1 1.5 V
t
rr
250 ns
Q
RM
1.0 µC
I
RM
10 A
I
F
=25 A,-di/dt = 100 A/µs, V
R
= 100 V
Dim. Millimeter Inches
Min. Max. Min. Max.
A 4.83 5.21 .190 .205
A
1
2.29 2.54 .090 .100
A
2
1.91 2.16 .075 .085
b 1.14 1.40 .045 .055
b
1
1.91 2.13 .075 .084
b
2
2.92 3.12 .115 .123
C 0.61 0.80 .024 .031
D 20.80 21.34 .819 .840
E 15.75 16.13 .620 .635
e 5.45 BSC .215 BSC
L 19.81 20.32 .780 .800
L1 3.81 4.32 .150 .170
Q 5.59 6.20 .220 0.244
R 4.32 4.83 .170 .190
Terminals: 1 - Gate
2 - Drain (Collector)
3 - Source (Emitter)
4 - Drain (Collector)
PLUS 247
TM
Outline
Note: 1.Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
IXFX 50N50
IXFX 55N50