10
Again, the difference between the two internal voltage
references is 2V. If V
IN
is a 4V
P-P
sinewave, then V
IN
+ is a
4V
P-P
sinewave riding on a positive voltage equal to VDC.
The converter will be at positive full scale when V
IN
+ is at
VDC + 2V (V
IN
+ - V
IN
- = 2V) and will be at negative full scale
when V
IN
+ is equal to VDC - 2V (V
IN
+ - V
IN
- = -2V). In this
case, V
DC
could range between 2V and 3V without a
significant change in ADC performance. The simplest way to
produce VDC is to use the V
DC
bias voltage output of the
HI5805.
The single ended analog input can be DC coupled (Figure
18) as long as the input is within the analog input common
mode voltage range.
The resistor, R, in Figure 18 is not absolutely necessary but
may be used as a load setting resistor. A capacitor, C,
connected from V
IN
+ to V
IN
- will help filter any high
frequency noise on the inputs, also improving performance.
Values around 20pF are sufficient and can be used on AC
coupled inputs as well. Note, however, that the value of
capacitor C chosen must take into account the highest
frequency component of the analog input signal.
A single ended source will give better overall system
performance if it is first converted to differential before
driving the HI5805.
Digital I/O and Clock Requirements
The HI5805 provides a standard high-speed interface to
external TTL/CMOS logic families. The digital CMOS clock
input has TTL level thresholds. The low input bias current
allows the HI5805 to be driven by CMOS logic.
The digital CMOS outputs have a separate digital supply.
This allows the digital outputs to operate from a 3.0V to 5.0V
supply. When driving CMOS logic, the digital outputs will
swing to the rails. When driving standard TTL loads, the
digital outputs will meet standard TTL level requirements
even with a 3.0V supply.
In order to ensure rated performance of the HI5805, the duty
cycle of the clock should be held at 50% 5%. It must also
have low jitter and operate at standard TTL levels.
Performance of the HI5805 will only be guaranteed at
conversion rates above 0.5MSPS. This ensures proper
performance of the internal dynamic circuits.
Supply and Ground Considerations
The HI5805 has separate analog and digital supply and
ground pins to keep digital noise out of the analog signal
path. The part should be mounted on a board that provides
separate low impedance connections for the analog and
digital supplies and grounds. For best performance, the
supplies to the HI5805 should be driven by clean, linear
regulated supplies. The board should also have good high
frequency decoupling capacitors mounted as close as
possible to the converter. If the part is powered off a single
supply then the analog supply and ground pins should be
isolated by ferrite beads from the digital supply and ground
pins.
Refer to the Application Note AN9214, “Using Intersil High
Speed A/D Converters” for additional considerations when
using high speed converters.
Static Performance Definitions
Offset Error (V
OS
)
The midscale code transition should occur at a level
1
/
4
LSB
above half scale. Offset is defined as the deviation of the
actual code transition from this point.
Full-Scale Error (FSE)
The last code transition should occur for an analog input that
is
3
/
4
LSB below positive full scale with the offset error
removed. Full-scale error is defined as the deviation of the
actual code transition from this point.
Differential Linearity Error (DNL)
DNL is the worst case deviation of a code width from the
ideal value of 1 LSB.
Integral Linearity Error (INL)
INL is the worst case deviation of a code center from a best
fit straight line calculated from the measured data.
Power Supply Rejection Ratio (PSRR)
Each of the power supplies are moved plus and minus 5%
and the shift in the offset and gain error (in LSBs) is noted.
V
IN
+
V
IN
-
HI5805
V
IN
VDC
FIGURE 17. AC COUPLED SINGLE ENDED INPUT
V
IN
+
V
IN
-
HI5805
V
DC
R
C
V
IN
V
DC
FIGURE 18. DC COUPLED SINGLE ENDED INPUT
HI5805
11
Dynamic Performance Definitions
Fast Fourier Transform (FFT) techniques are used to
evaluate the dynamic performance of the HI5805. A low
distortion sine wave is applied to the input, it is coherently
sampled, and the output is stored in RAM. The data is then
transformed into the frequency domain with an FFT and
analyzed to evaluate the dynamic performance of the A/D.
The sine wave input to the part is -0.5dB down from full scale
for all these tests. SNR and SINAD are quoted in dB. The
distortion numbers are quoted in dBc (decibels with respect
to carrier) and DO NOT include any correction factors for
normalizing to full scale.
Signal-to-Noise Ratio (SNR)
SNR is the measured RMS signal to RMS noise at a
specified input and sampling frequency. The noise is the
RMS sum of all of the spectral components except the
fundamental and the first five harmonics.
Signal-to-Noise + Distortion Ratio (SINAD)
SINAD is the measured RMS signal to RMS sum of all
other spectral components below the Nyquist frequency,
f
S
/2, excluding DC.
Effective Number Of Bits (ENOB)
The effective number of bits (ENOB) is calculated from the
SINAD data by:
where: V
CORR
= 0.5dB.
V
CORR
adjusts the ENOB for the amount the input is below
fullscale.
Total Harmonic Distortion (THD)
THD is the ratio of the RMS sum of the first 5 harmonic
components to the RMS value of the fundamental input
signal.
2nd and 3rd Harmonic Distortion
This is the ratio of the RMS value of the applicable
harmonic component to the RMS value of the fundamental
input signal.
Spurious Free Dynamic Range (SFDR)
SFDR is the ratio of the fundamental RMS amplitude to the
RMS amplitude of the next largest spur or spectral
component in the spectrum below f
S
/2.
Intermodulation Distortion (IMD)
Nonlinearities in the signal path will tend to generate
intermodulation products when two tones, f
1
and f
2
, are
present at the inputs. The ratio of the measured signal to
the distortion terms is calculated. The terms included in the
calculation are (f
1
+ f
2
), (f
1
- f
2
), (2f
1
), (2f
2
), (2f
1
+ f
2
),
(2f
1
-f
2
), (f
1
+2f
2
), (f
1
- 2f
2
). The ADC is tested with each
tone 6dB below full scale.
ENOB = SINAD + V
CORR
-1.76/6.02,
HI5805
12
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Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reli-
able. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from
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For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Transient Response
Transient response is measured by providing a full-scale
transition to the analog input of the ADC and measuring the
number of cycles it takes for the output code to settle within
12-bit accuracy.
Over-Voltage Recovery
Over-voltage Recovery is measured by providing a full-scale
transition to the analog input of the ADC which overdrives
the input by 200mV, and measuring the number of cycles it
takes for the output code to settle within 12-bit accuracy.
Full Power Input Bandwidth (FPBW)
Full power input bandwidth is the analog input frequency at
which the amplitude of the digitally reconstructed output has
decreased 3dB below the amplitude of the input sinewave.
The input sinewave has an amplitude which swings from -f
S
to +f
S
. The bandwidth given is measured at the specified
sampling frequency.
Timing Definitions
Refer to Figure 1, Internal Circuit Timing, and Figure 2,
Input-To-Output Timing, for these definitions.
Aperture Delay (t
AP
)
Aperture delay is the time delay between the external
sample command (the falling edge of the clock) and the time
at which the signal is actually sampled. This delay is due to
internal clock path propagation delays.
Aperture Jitter (t
AJ
)
Aperture Jitter is the RMS variation in the aperture delay due
to variation of internal clock path delays.
Data Hold Time (t
H
)
Data hold time is the time to where the previous data (N - 1)
is no longer valid.
Data Output Delay Time (t
OD
)
Data output delay time is the time to where the new data (N)
is valid.
Data Latency (t
LAT
)
After the analog sample is taken, the digital data is output on
the bus at the third cycle of the clock. This is due to the
pipeline nature of the converter where the data has to ripple
through the stages. This delay is specified as the data
latency. After the data latency time, the data representing
each succeeding sample is output at the following clock
pulse. The digital data lags the analog input sample by 3
clock cycles.
HI5805

HI5805BIB

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
IC ADC 12BIT PIPELINED 28SOIC
Lifecycle:
New from this manufacturer.
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