74AHC_AHCT1G07 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 7 — 18 November 2014 6 of 12
NXP Semiconductors
74AHC1G07; 74AHCT1G07
Buffer with open-drain output
12. Waveforms
Measurement points are given in Table 9.
Fig 5. Input (A) to output (Y) propagation delays
PQD
W
3/=
9
2/
9
$LQSXW
<RXWSXW
9
,
9
&&
9
0
9
2/
*1'
W
3=/
9
0
Table 9. Measurement point
Type Input Output
V
I
V
M
(1)
V
M
(2)
74AHC1G07 GND to V
CC
0.5 V
CC
0.5 V
CC
74AHCT1G07 GND to 3.0 V 1.5 V 0.5 V
CC
Test data is given in Table 8. Definitions for test circuit:
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
For t
PLZ
, t
PZL
, S
1
= V
CC
Fig 6. Test circuit for measuring switching times
RSHQ
*1'
9
&&
9
&&
9
,
9
2
PQD
'87
&
/
5
7
5
/
ȍ
38/6(
*(1(5$725
6
