OMO ElectronicOMO Electronic
Expand menu
Hello, Sign inMy Account
0 Cart

74FCT162827ATPVG8

P1-P3P4-P6P7-P7
1
IDT74FCT162827AT/CT
FAST CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
SEPTEMBER 2009
IDT74FCT162827AT/CT
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS
20-BIT BUFFER
DESCRIPTION:
The FCT162827T 20-bit buffers are built using advanced dual metal CMOS
technology. These 20-bit bus drivers provide high-performance bus interface
buffering for wide data/address paths or buses carrying parity. Two pair of
NAND-ed output enable controls offer maximum control flexibility and are
organized to operate the device as two 10-bit buffers or one 20-bit buffer. Flow-
through organization of signal pins simplifies layout. All inputs are designed with
hysteresis for improved noise margin.
The FCT162827T has balanced output drive with current limiting resistors.
This offers low ground bounce, minimal undershoot, and controlled output fall
times–reducing the need for external series terminating resistors. The
FCT162827T is a plug-in replacement for the FCT16827T and ABT16827 for
on-board interface applications.
2
Y
1
TO NINE OTHER CHANNELS
2
OE
1
2
OE
2
2
A
1
1
Y
1
TO NINE OTHER CHANNELS
1
OE
1
1
OE
2
1
A
1
1
56
55
28
29
422
15
FEATURES:
• 0.5 MICRON CMOS Technology
• High-speed, low-power CMOS replacement for ABT functions
• Typical tSK(o) (Output Skew) < 250ps
• Low input and output leakage
≤≤
≤≤
≤1µA (max.)
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
•VCC = 5V ±10%
• Balanced Output Drivers (±24mA)
• Reduced system switching noise
• Typical VOLP (Output Ground Bounce) < 0.6V at VCC = 5V,
TA = 25°C
• Available in SSOP and TSSOP packages
FUNCTIONAL BLOCK DIAGRAM
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
© 2009 Integrated Device Technology, Inc. DSC-5440/7
2
INDUSTRIAL TEMPERATURE RANGE
IDT74FCT162827AT/CT
FAST CMOS 20-BIT BUFFER
SSOP/ TSSOP
TOP VIEW
PIN CONFIGURATION
1
Y
1
GND
1
Y
3
V
CC
1
OE
1
GND
1
Y
10
GND
1
Y
2
1
Y
4
1
Y
5
1
Y
6
1
Y
7
1
Y
8
1
Y
9
2
Y
3
V
CC
GND
2
Y
4
2
Y
5
2
Y
7
2
Y
8
2
Y
6
2
OE
1
1
OE
2
1
A
1
1
A
2
GND
1
A
3
1
A
4
V
CC
1
A
5
1
A
6
1
A
7
1
A
8
1
A
9
1
A
10
GND
GND
47
37
38
39
40
41
42
43
44
45
46
33
34
35
36
56
55
49
50
51
52
53
54
48
1
2
3
4
5
6
7
8
9
10
12
13
14
15
16
17
18
19
20
11
21
22
23
24
2
Y
1
2
Y
2
2
Y
10
2
Y
9
2
A
3
2
A
4
V
CC
2
A
5
2
A
7
2
A
8
2
A
6
GND
2
A
9
2
A
10
2
OE
2
29
30
31
3225
26
27
28
2
A
1
2
A
2
Symbol Description Max Unit
VTERM
(2)
Terminal Voltage with Respect to GND –0.5 to 7 V
VTERM
(3)
Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V
TSTG Storage Temperature –65 to +150 ° C
I
OUT DC Output Current –60 to +120 mA
ABSOLUTE MAXIMUM RATINGS
(1)(1)
(1)(1)
(1)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Outputs and I/O terminals for FCT162XXX.
Symbol Parameter
(1)
Conditions Typ. Max. Unit
CIN Input Capacitance VIN = 0V 3.5 6 pF
C
OUT Output Capacitance VOUT = 0V 3.5 8 pF
CAPACITANCE (TA = +25°C, f = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
Pin Names Description
xOEx Output Enable Inputs (Active LOW)
x Ax Data Inputs
xY x 3-State Outputs
PIN DESCRIPTION
Inputs Outputs
xOE1 xOE2 xAx xYx
LLL L
LLH H
HXX Z
XHX Z
FUNCTION TABLE
(1)
NOTE:
1. H = HIGH voltage level
L = LOW voltage level
X = Don’t care
Z = High-impedance
3
IDT74FCT162827AT/CT
FAST CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V
VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V
IIH Input HIGH Current (Input pins)
(4)
VCC = Max. VI = VCC ——±1µA
Input HIGH Current (I/O pins)
(4)
——±1
IIL Input LOW Current (Input pins)
(4)
VI = GND — — ±1
Input LOW Current (I/O pins)
(4)
——±1
IOZH High Impedance Output Current VCC = Max. VO = 2.7V — — ±1 µA
IOZL (3-State Output pins)
(4)
VO = 0.5V — — ±1
VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V
IOS Short Circuit Current VCC = Max., VO = GND
(3)
–80 –140 –250 mA
VH Input Hysteresis — — 100 — mV
I
CCL Quiescent Power Supply Current VCC = Max — 5 500 µA
ICCH VIN = GND or VCC
ICCZ
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
IODL Output LOW Current VCC = 5V, VIN = VIH or VIL, VO = 1.5V
(3)
60 115 200 mA
IODH Output HIGH Current VCC = 5V, VIN = VIH or VIL, VO = 1.5V
(3)
–60 –115 –200 mA
VOH Output HIGH Voltage VCC = Min. IOH = –24mA 2.4 3.3 — V
VIN = VIH or VIL
VOL Output LOW Voltage VCC = Min. IOL = 24mA — 0.3 0.55 V
V
IN = VIH or VIL
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This test limit for this parameter is ±5µA at TA = –55°C.
OUTPUT DRIVE CHARACTERISTICS
P1-P3P4-P6P7-P7

74FCT162827ATPVG8

Mfr. #:
Buy 74FCT162827ATPVG8
Manufacturer:
IDT
Description:
Buffers & Line Drivers 16BIT BUF
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet