4
INDUSTRIAL TEMPERATURE RANGE
IDT74FCT162827AT/CT
FAST CMOS 20-BIT BUFFER
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
ΔI
CC Quiescent Power Supply Current VCC = Max. — 0.5 1.5 mA
TTL Inputs HIGH VIN = 3.4V
(3)
ICCD Dynamic Power Supply Current
(4)
VCC = Max. VIN = VCC — 60 100 µ A /
Outputs Open VIN = GND MHz
xOE
1 = xOE2 = GND
One Input Toggling
50% Duty Cycle
I
C Total Power Supply Current
(6)
VCC = Max. VIN = VCC — 0.6 1.5 mA
Outputs Open VIN = GND
fi = 10MHz
50% Duty Cycle V
IN = 3.4V — 0.9 2.3
xOE1 = xOE2 = GND VIN = GND
One Bit Toggling
V
CC = Max. VIN = VCC — 3 5.5
(5)
Outputs Open VIN = GND
fi = 2.5MHz
50% Duty Cycle V
IN = 3.4V — 8 20.5
(5)
xOE1 = xOE2 = GND VIN = GND
Twenty Bits Toggling
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ΔICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi
POWER SUPPLY CHARACTERISTICS
