NX3L1G3157_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 23 May 2013 13 of 21
NXP Semiconductors NX3L1G3157-Q100
Low-ohmic single-pole double-throw analog switch
12.2 Additional dynamic characteristics
[1] f
i
is biased at 0.5V
CC
.
12.3 Test circuits
Table 12. Additional dynamic characteristics
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); V
I
= GND or V
CC
(unless otherwise
specified); t
r
= t
f
2.5 ns; T
amb
= 25
C.
Symbol Parameter Conditions Min Typ Max Unit
THD total harmonic
distortion
f
i
=20Hzto20 kHz; R
L
=32; see Figure 17
[1]
V
CC
=1.4V; V
I
= 1 V (p-p) - 0.15 - %
V
CC
=1.65V; V
I
= 1.2 V (p-p) - 0.10 - %
V
CC
=2.3V; V
I
= 1.5 V (p-p) - 0.02 - %
V
CC
=2.7V; V
I
= 2 V (p-p) - 0.02 - %
V
CC
=4.3V; V
I
= 2 V (p-p) - 0.02 - %
f
(3dB)
3 dB frequency
response
R
L
=50; see Figure 18
[1]
V
CC
= 1.4 V to 4.3 V - 60 - MHz
iso
isolation (OFF-state) f
i
= 100 kHz; R
L
=50; see Figure 19
[1]
V
CC
= 1.4 V to 4.3 V - 90 - dB
V
ct
crosstalk voltage between digital inputs and switch;
f
i
= 1 MHz; C
L
= 50 pF; R
L
=50; see Figure 20
V
CC
= 1.4 V to 3.6 V - 0.2 - V
V
CC
= 3.6 V to 4.3 V - 0.3 - V
Q
inj
charge injection f
i
= 1 MHz; C
L
= 0.1 nF; R
L
=1 M; V
gen
=0V;
R
gen
=0; see Figure 21
V
CC
= 1.5 V - 3 - pC
V
CC
= 1.8 V - 4 - pC
V
CC
=2.5V - 6 - pC
V
CC
=3.3V - 9 - pC
V
CC
=4.3V - 15 - pC
Fig 17. Test circuit for measuring total harmonic distortion
001aag573
f
i
R
L
switch S
1V
IL
2V
IH
switch
V
CC
V
IL
or V
IH
0.5V
CC
Y0
Y1
1
2
S
Z
GND
D
NX3L1G3157_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 23 May 2013 14 of 21
NXP Semiconductors NX3L1G3157-Q100
Low-ohmic single-pole double-throw analog switch
To obtain 0 dBm level at output, adjust f
i
voltage. Increase f
i
frequency until dB meter reads 3dB.
Fig 18. Test circuit for measuring the frequency response when channel is in ON-state
001aag574
f
i
R
L
switch S
1V
IL
2V
IH
switch
V
CC
V
IL
or V
IH
0.5V
CC
Y0
Y1
1
2
S
Z
GND
dB
To obtain 0 dBm level at output, adjust f
i
voltage.
Fig 19. Test circuit for measuring isolation (OFF-state)
001aag561
f
i
R
L
R
L
switch S
1V
IH
2V
IL
switch
V
CC
V
IL
or V
IH
0.5V
CC
0.5V
CC
Y0
Y1
1
2
S
Z
GND
dB
NX3L1G3157_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 23 May 2013 15 of 21
NXP Semiconductors NX3L1G3157-Q100
Low-ohmic single-pole double-throw analog switch
a. Test circuit
b. Input and output pulse definitions
Fig 20. Test circuit for measuring crosstalk voltage between digital inputs and switch
V
001aah442
R
L
switch
1
2V
IH
V
IL
S
S
Z
Y0
Y1
V
CC
V
I
V
O
logic
input
0.5V
CC
R
L
C
L
0.5V
CC
switch
1
2
G
V
ct
onoff
logic
input (S)
off
V
O
001aah443

NX3L1G3157GW-Q100H

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Analog Switch ICs Sngl-pole dbl-throw analog switch
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet