13
Figure 5. Logic levels to access the ash RAM.
Table 2. Current Requirements at Dierent Brightness Levels V
DD
= 5.0 V
% Current at 25°C
Symbol D
2
D
1
D
0
Brightness Typ. Units
I
DD
(V) 0 0 0 100 200 mA
0 0 1 80 160 mA
0 1 0 53 106 mA
0 1 1 40 80 mA
1 0 0 27 54 mA
1 0 1 20 40 mA
1 1 0 13 26 mA
Figure 6. Logic levels to access the control word register
Control Word Register
Figure 6 shows how to access the Control Word Register.
This 8-bit register performs ve functions: Bright ness
control, Flash RAM control, Blinking, Self Test, and Clear.
Each function is independent of the others; how ever, all
bits are updated during each Control Word write cycle.
Brightness (Bits 0-2)
Bits 0-2 of the Control Word adjust the brightness of the
display. Bits 0-2 are interpreted as a three bit binary code
with code (000) corresponding to maximum brightness
and code (111) corresponding to a blanked display. In
addition to varying the display brightness, bits 0-2 also
vary the average value of I
DD
. I
DD
can be calcu lated at any
bright ness level by multiplying the percent brightness
level by the value of I
DD
at the 100% bright ness level.
These values of I
DD
are shown in Table 2.
Flash Function (Bit 3)
Bit 3 determines whether the ashing character attribute
is on or o. When bit 3 is a“1, the output of the Flash RAM
is checked. If the content of a loca tion in the Flash RAM is
a “1, the associated digit will ash at approximately 2 Hz.
For an external clock, the blink rate can be calculated by
driving the clock frequency by 28,672. If the ash enable
bit of the Control Word is a “0, the content of the Flash
RAM is ignored. To use this function with multiple dis play
systems, see the Display Reset section.
Blink Function (Bit 4)
Bit 4 of the Control Word is used to synchronize blinking
of all eight digits of the display. When this bit is a “1” all
eight digits of the display will blink at approx i mately 2
Hz. The actual rate is dependent on the clock fre quency.
For an external clock, the blink rate can be calculated by
dividing the clock frequency by 28,672. This func tion will
override the Flash function when it is active. To use this
function with multiple display systems, see the Display
Reset section.
CE
FL A
4
A
3
A
2
A
1
A
0
RST WR RD
01
00
01
1
XX0
0
11
UNDEFINED
REMOVE FLASH AT
SPECIFIED DIGIT LOCATION
STORE FLASH AT
SPECIFIED DIGIT LOCATION
CONTROL SIGNALS
FLASH RAM ADDRESS
FLASH RAM DATA FORMAT
0 = LOGIC 0; 1 = LOGIC 1; X = DO NOT CARE
WRITE TO DISPLAY
READ FROM DISPLAY
UNDEFINED
D
7
D
6
D
5
D
4
D
3
D
2
D
1
D
0
X
XXXXXX
0
1
CHARACTER
ADDRESS
000 = LEFT MOST
111 = RIGHT MOST
CE
FL A
4
A
3
A
2
A
1
A
0
RST WR RD
01
00
01
1
10XXX1
0
11
UNDEFINED
CONTROL SIGNALS
CONTROL WORD ADDRESS
CONTROL WORD DATA FORMAT
0 = LOGIC 0; 1 = LOGIC 1; X = DO NOT CARE
0 DISABLE FLASH
1 ENABLE FLASH
BRIGHTNESS
CONTROL
LEVELS
0 DISABLE BLINKING
1 ENABLE BLINKING
0 NORMAL OPERATION
1 CLEAR FLASH AND CHARACTER RAMS
0 X NORMAL OPERATION; X IS IGNORED
1 X START SELF TEST; RESULT GIVEN IN X
X = 0 FAILED X = 1 PASSED
WRITE TO DISPLAY
READ FROM DISPLAY
UNDEFINED
D
7
D
6
D
5
D
4
D
3
D
2
D
1
D
0
C
SSBLFB
0 0 0 100%
00180%
01053%
01140%
10027%
10120%
11013%
1110%
BB
14
Figure 7. Logic levels to reset the display.
CERST WR RD
0 = LOGIC 0; 1 = LOGIC 1; X = DO NOT CARE
NOTE:
IF RST, CE, AND WR ARE LOW, UNKNOWN
DATA MAY BE WRITTEN INTO THE DISPLAY.
FL
0
1XXXXX
A
4
-A
0
D
7
-D
0
Self Test Function (Bits 5, 6)
Bit 6 of the Control Word Regis ter is used to initiate the
self test function. Results of the internal self test are
stored in bit 5 of the Control Word. Bit 5 is a read only bit
where bit 5 = “1” indicates a passed self test and bit 5 =
“0” indicates a failed self test.
Setting bit 6 to a logic 1 will start the self test function.
The built-in self test function of the IC consists of two
internal rou tines which exercise major portions of the
IC and illumin ate all of the LEDs. The rst routine cycles
the ASCII decoder ROM through all states and performs
a check sum on the output. If the checksum agrees
with the correct value, bit 5 is set to “1. The second
rou tine provides a visual test of the LEDs using the drive
circuitry. This is accomplished by writing checkered and
inverse checkered patterns to the display. Each pattern is
displayed for approxi mately 2 seconds.
During the self test function the display must not be
accessed. The time needed to execute the self test
function is calculated by multiplying the clock period
by 262,144. For example, assume a clock frequency of
58 KHz, then the time to execute the self test function
frequency is equal to (262,144/58,000) = 4.5 second
duration.
At the end of the self test func tion, the Character RAM
is loaded with blanks, the Control Word Register is set to
zeros except for bit 5, the Flash RAM is cleared, and the
UDC Address Register is set to all ones.
Clear Function (Bit 7)
Bit 7 of the Control Word will clear the Character RAM
and the Flash RAM. Setting bit 7 to a “1” will start the
clear func tion. Three clock cycles (110 ms minimum using
the internal refresh clock) are required to complete the
clear function. The display must not be accessed while
the display is being cleared. When the clear function
has been com pleted, bit 7 will be reset to a “0. The ASCII
char acter code for a space (20H) will be loaded into the
Character RAM to blank the display and the Flash RAM
will be loaded with “0”s. The UDC RAM, UDC Address
Register, and the re mainder of the Control Word are
unaected.
Display Reset
Figure 7 shows the logic levels needed to Reset the
display. The display should be Reset on Power-up. The
external Reset clears the Character RAM, Flash RAM,
Control Word and resets the internal counters. After the
rising edge of the Reset signal, three clock cycles (110 μs
minimum using the internal refresh clock) are required
to complete the reset sequence. The display must not
be accessed while the display is being reset. The ASCII
Character code for a space (20H) will be loaded into
the Character RAM to blank the display. The Flash RAM
and Control Word Register are loaded with all “0”s. The
UDC RAM and UDC Address Regis ter are unaected. All
displays which operate with the same clock source must
be simul ta ne ously reset to synchronize the Flashing and
Blinking functions.
Mechanical and Elec trical Considerations
The HDSP-210X/-211X/-250X are 28 pin dual-in-line
packages with 26 external pins. The devices can be
stacked horizontally and verti cally to create arrays of any
size. The HDSP-210X/-211X/-250X are designed to operate
continu ously from -45°C to +85°C with a maxi mum of 20
dots on per character at 5.25 V. Illuminating all thirty-ve
dots at full bright ness is not recommended.
The HDSP-210X/-211X/-250X are assembled by die
attaching and wire bonding 280 LED chips and a CMOS
IC to a thermally conductive printed circuit board. A poly-
carbonate lens is placed over the PC board creating an air
gap over the LED wire bonds. A protective cap creates an
air gap over the CMOS IC. Backll epoxy environment ally
seals the display package. This package construction
makes the display highly tolerant to tem per ature cycling
and allows wave soldering.
The inputs to the IC are pro tected against static discharge
and input current latchup. How ever, for best results
standard CMOS handling precautions should be used.
Prior to use, the HDSP-210X/-211X/-250X should be
stored in antistatic tubes or in conductive material.
During assembly, a grounded conduc tive work area
should be used, and assembly personnel should wear
conductive wrist straps. Lab coats made of synthetic
ma terial should be avoided since they are prone to static
buildup. Input current latchup is caused when the CMOS
inputs are sub jected to either a voltage below ground
(V
IN
< ground) or to a voltage higher than V
DD
(V
IN
>
V
DD
) and when a high current is forced into the input. To
prevent input current latchup and ESD damage, un used
inputs should be con nected either to ground or to V
DD
.
Volt ages should not be applied to the inputs until V
DD
has been applied to the display.
15
Thermal Considerations
The HDSP-210X/-211X/-212X/250X have been designed
to provide a low ther mal resistance path for the CMOS
IC to the 26 package pins. Heat is typically conducted
through the traces of the printed circuit board to free
air. For most applications no addi tional heatsinking is
required.
Measurements were made on a 32 character display
string to determine the thermal resis tance of the display
assembly. Several display boards were con structed using
0.062 in. thick printed circuit material, and one ounce
copper 0.020 in. traces. Some of the device pins were
connected to a heatsink formed by etching a copper
area on the printed circuit board surround ing the display.
A maximally metallized printed circuit board was also
evaluated. The junc tion tem per ature was measured for
displays soldered directly to these PC boards, displays
installed in sockets, and nally displays installed in
sockets with a lter over the display to restrict air ow.
The results of these ther mal resistance measure ments,
Rq
J-A
are shown in Table 3 and include the eects of
Rq
J-C
.
Ground Connections
Two ground pins are provided to keep the internal IC
logic ground clean. The designer can, when necessary,
route the ana log ground for the LED drivers separately
from the logic ground until an appropriate ground
plane is available. On long inter con nec tions between
the display and the host system, the designer can keep
voltage drops on the analog ground from aect ing the
display logic levels by isolating the two grounds.
The logic ground should be connected to the same
ground poten tial as the logic interface cir cuitry.
The analog ground and the logic ground should be
connected at a common ground which can withstand
the cur rent introduced by the switch ing LED drivers.
When separate ground connec tions are used, the analog
ground can vary from -0.3 V to +0.3 V with re spect to the
logic ground. Volt age below -0.3 V can cause all dots to
be on. Voltage above +0.3 V can cause dimming and dot
mismatch.
Table 3. Thermal Resistance, T
JA
, Using Various Amounts
of Heatsinking Material
Heatsinking
Metal W/Sockets W/O Sockets W/Sockets
per Device W/O Filter W/O Filter W/Filter
sq. in. (Avg.) (Avg.) (Avg.) Units
0 31 30 35 °C/W
1 31 28 33 °C/W
3 30 26 33 °C/W
Max. Metal 29 25 32 °C/W
4 Board Avg 30 27 33 °C/W
Soldering and Post Solder
Cleaning Instructions for the
HDSP-210X/-211X/-250X
The HDSP-210X/-211X/-250X may be hand soldered or
wave soldered with SN63 solder. When hand soldering,
it is recom mended that an elec tronic ally tempera ture
con trolled and securely grounded soldering iron be used.
For best results, the iron tip temperature should be set at
315°C (600°F). For wave solder ing, a rosin-based RMA ux
can be used. The solder wave tem per a ture should be set
at 245°C ± 5°C (473°F ± 9°F), and the dwell in the wave
should be set between 1
1
/
2
to 3 seconds for optimum
soldering. The preheat tempera ture should not exceed
105°C (221°F) as measured on the solder side of the PC
board.
For addi tional information on solder ing and post solder
clean ing, see Application Note 1027, Soldering LED Com-
ponents.
Contrast Enhancement
The objective of contrast enhance ment is to provide
good readability in a variety of ambient lighting condi-
tions. For informa tion on contrast enhancement see
Appli ca tion Note 1015, Contrast Enhance ment Techniques
for LED Displays.

HDSP-2502

Mfr. #:
Manufacturer:
Broadcom / Avago
Description:
LED Displays & Accessories Red 626nm 5x7 Smart Display
Lifecycle:
New from this manufacturer.
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