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PSMN008-75P,127
P1-P3
P4-P6
P7-P9
P10-P12
P13-P13
PSMN008-75P_4
© NXP B.V
. 2009. All rights reserv
ed.
Product data sheet
Rev
. 04 — 10 December 2009
3 of 12
NXP Semiconductors
PSMN008-75P
N-channel T
renchMOS SiliconMAX st
andard level FET
Fig 1.
Normalized continuous drain curre
nt as a
function of mou
nting base te
mperature
Fig 2.
Normalize
d total power d
issipation as
a
function of mounting base temp
erature
Fig 3.
Safe operating area; continuous an
d peak drain curren
ts as a function of drain-source voltage
0
40
80
120
0
50
100
150
200
T
mb
(
°
C)
I
der
(%)
03am86
T
mb
(
°
C)
0
200
150
50
100
03aa16
40
80
120
P
der
(%)
0
03am79
V
DS
(V)
1
10
3
10
2
10
10
2
10
10
3
I
D
(A)
1
Limit R
DSon
=
V
DS
/I
D
DC
100
μ
s
10 ms
1 ms
t
p
= 10
μ
s
PSMN008-75P_4
© NXP B.V
. 2009. All rights reserv
ed.
Product data sheet
Rev
. 04 — 10 December 2009
4 of 12
NXP Semiconductors
PSMN008-75P
N-channel T
renchMOS SiliconMAX st
andard level FET
5.
Thermal characteristics
T
able 5.
Thermal characteristics
Symbol
Parameter
Conditions
Min
Ty
p
Max
Unit
R
th(j-mb)
thermal resistance from junction to
mounting base
see
Figure 4
-
-
0.65
K/W
R
th(j-a)
thermal resistance from junction to ambient
vertical in still air
-
60
-
K
/W
Fig 4.
Trans
ient thermal impe
dance from junc
tion to mountin
g base as a fu
nction of pu
lse duration
03am78
t
p
(s)
10
-4
1
10
−
1
10
−
3
10
−
2
10
−
1
1
Z
th(j-mb)
(K/W)
10
−
2
t
p
t
p
T
P
t
T
δ
=
single pulse
δ
= 0.5
0.2
0.1
0.05
0.02
PSMN008-75P_4
© NXP B.V
. 2009. All rights reserv
ed.
Product data sheet
Rev
. 04 — 10 December 2009
5 of 12
NXP Semiconductors
PSMN008-75P
N-channel T
renchMOS SiliconMAX st
andard level FET
6.
Characteristics
T
able 6.
Characteristics
Symbol
Parameter
Conditions
Min
Ty
p
Max
Unit
St
atic characteristics
V
(BR)DSS
drain-source
breakdown voltage
I
D
=2
5
0µ
A
;
V
GS
=0V
;
T
j
=2
5°
C
7
5
9
0
-
V
V
GS(th)
gate-source threshold
voltage
I
D
=1m
A
;
V
DS
= V
GS
; T
j
=-
5
5°
C
;
see
Figure 8
--4
.
4
V
I
D
=1m
A
;
V
DS
= V
GS
; T
j
=1
7
5°
C
;
see
Figure 8
1-
-
V
I
D
=1m
A
;
V
DS
= V
GS
; T
j
=2
5°
C
;
see
Figure 8
234V
I
DSS
drain leakage current
V
DS
=7
5V
;
V
GS
=0V
;
T
j
= 25 °C
-
0.05
10
µA
V
DS
=7
5V
;
V
GS
=0V
;
T
j
= 175 °C
-
-
5
00
µA
I
GSS
gate leakage current
V
GS
=2
0V
;
V
DS
=0V
;
T
j
= 25 °
C
-
4
100
nA
V
GS
=-
2
0V
;
V
DS
=0V
;
T
j
= 25 °
C
-
4
100
nA
R
DSon
drain-source on-state
resistance
V
GS
=1
0V
;
I
D
=2
5A
;
T
j
= 175 °C;
see
Figure 9
and
10
--2
0
m
Ω
V
GS
=1
0V
;
I
D
=2
5A
;
T
j
=2
5°
C
;
see
Figure 9
and
10
-6
.
5
8
.
5
m
Ω
Dynamic ch
aracter
istics
Q
G(tot)
total gate charge
I
D
=7
5A
;
V
DS
=6
0V
;
V
GS
=1
0V
;
T
j
=2
5°
C
;
s
e
e
Figure 1
1
-
122.8
-
nC
Q
GS
gate-source charge
-
21
-
nC
Q
GD
gate-drain charge
-
50
-
n
C
C
iss
input capacitance
V
DS
=2
5V
;
V
GS
= 0 V
; f = 1 MHz;
T
j
=2
5°
C
;
s
e
e
Figure 12
-
5260
-
pF
C
oss
output capacitance
-
525
-
pF
C
rss
reverse transfer
capacit
ance
-
420
-
pF
t
d(on)
turn-on delay time
V
DS
=3
8V
;
R
L
=1
.
5
Ω
; V
GS
=1
0V
;
R
G(ext)
=1
0
Ω
; T
j
=2
5°
C
-1
8
-n
s
t
r
rise time
-
55
-
ns
t
d(off
)
turn-off delay time
-
88
-
ns
t
f
fall time
-
80
-
n
s
Source-drain di
ode
V
SD
source-drain voltage
I
S
=2
5A
;
V
GS
=0V
;
T
j
=2
5°
C
;
see
Figure 13
-
0.84
1.2
V
t
rr
reverse recovery time
I
S
=5A
;
d
I
S
/dt =
-100
A/µs; V
GS
=0V
;
V
DS
=3
0V
;
T
j
=2
5°
C
-7
0
-n
s
Q
r
recovered charge
-
100
-
nC
P1-P3
P4-P6
P7-P9
P10-P12
P13-P13
PSMN008-75P,127
Mfr. #:
Buy PSMN008-75P,127
Manufacturer:
NXP Semiconductors
Description:
MOSFET N-CH 75V 75A TO220AB
Lifecycle:
New from this manufacturer.
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PSMN008-75P,127