Philips Semiconductors
2N7000
N-channel enhancement mode field-effect transistor
Product specification Rev. 03 — 19 May 2000 4 of 13
9397 750 07153
© Philips Electronics N.V. 2000. All rights reserved.
7. Thermal characteristics
7.1 Transient thermal impedance
Table 4: Thermal characteristics
Symbol Parameter Conditions Value Unit
R
th(j-a)
thermal resistance from junction to ambient vertical in still air;
lead length 5 mm; Figure 4
150 K/W
Vertical in still air.
Fig 4. Transient thermal impedance from junction to ambient as a function of pulse
duration.
03aa00
0.1
1
10
100
1000
0.00001 0.0001 0.001 0.01 0.1 1 10 100
t
p
(s)
Z
th(j-a)
(K/W)
single pulse
δ = 0.5
0.2
0.1
0.05
0.02
t
p
t
p
T
P
t
T
δ =
Philips Semiconductors
2N7000
N-channel enhancement mode field-effect transistor
Product specification Rev. 03 — 19 May 2000 5 of 13
9397 750 07153
© Philips Electronics N.V. 2000. All rights reserved.
8. Characteristics
Table 5: Characteristics
T
j
=25
°
C unless otherwise specified
Symbol Parameter Conditions Min Typ Max Unit
Static characteristics
V
(BR)DSS
drain-source breakdown
voltage
I
D
=10µA; V
GS
=0V
T
j
=25°C6075 V
T
j
= 55 °C55−−V
V
GS(th)
gate-source threshold voltage I
D
= 1 mA; V
DS
=V
GS
;
Figure 9
T
j
=25°C12 V
T
j
= 150 °C 0.6 −−V
T
j
= 55 °C −−3.5 V
I
DSS
drain-source leakage current V
DS
= 48 V; V
GS
=0V
T
j
=25°C 0.01 1.0 µA
T
j
= 150 °C −−10 µA
I
GSS
gate-source leakage current V
GS
= ±15 V; V
DS
=0V 10 100 nA
R
DSon
drain-source on-state
resistance
V
GS
=10V; I
D
= 500 mA;
Figure 7 and 8
T
j
=25°C 2.8 5
T
j
= 150 °C −−9.25
V
GS
= 4.5 V; I
D
=75mA;
Figure 7 and 8
T
j
=25°C 3.8 5.3
Dynamic characteristics
g
fs
forward transconductance V
DS
= 10 V; I
D
= 200 mA;
Figure 11
100 300 mS
C
iss
input capacitance V
GS
=0V; V
DS
=10V;
f = 1 MHz; Figure 12
25 40 pF
C
oss
output capacitance 18 30 pF
C
rss
reverse transfer capacitance 7.5 10 pF
t
on
turn-on time V
DD
= 50 V; R
D
= 250 ;
V
GS
=10V; R
G
=50;
R
GS
=50
310ns
t
off
turn-off time 12 15 ns
Source-drain diode
V
SD
source-drain (diode forward)
voltage
I
S
= 300 mA; V
GS
=0V;
Figure 13
0.85 1.5 V
t
rr
reverse recovery time I
S
= 300 mA;
dI
S
/dt = 100 A/µs;
V
GS
=0V; V
DS
=25V
30 ns
Q
r
recovered charge 30 nC
Philips Semiconductors
2N7000
N-channel enhancement mode field-effect transistor
Product specification Rev. 03 — 19 May 2000 6 of 13
9397 750 07153
© Philips Electronics N.V. 2000. All rights reserved.
T
j
=25°CT
j
=25°C and 150 °C; V
DS
I
D
× R
DSon
Fig 5. Output characteristics: drain current as a
function of drain-source voltage; typical values.
Fig 6. Transfer characteristics: drain current as a
function of gate-source voltage; typical values.
T
j
=25°C
Fig 7. Drain-source on-state resistance as a function
of drain current; typical values.
Fig 8. Normalized drain source on-state resistance
factor as a function of junction temperature.
03aa04
0
0.2
0.4
0.6
0.8
1
0 0.4 0.8 1.2 1.6 2
3.5 V
T
j
= 25
o
C
4 V
4.5 V
3 V
V
DS
(V)
I
D
(A)
V
GS
= 10 V
03aa06
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
01234567
V
DS
> I
D
X R
DSon
T
j
= 25
o
C
150
o
C
I
D
(A)
V
GS
(V)
03aa05
0
1
2
3
4
5
6
7
8
9
10
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8
T
j
= 25
o
C
4.5 V
4 V
3.5V
3 V
R
DSon
()
V
GS
= 10 V
I
D
(A)
03aa28
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
1.8
2
2.2
-60 -20 20 60 100 140 180
T
j
(
o
C)
a
a
R
DSon
R
DSon 25 C
°
()
----------------------------
=

2N7000,126

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
MOSFET N-CH 60V 300MA TO-92
Lifecycle:
New from this manufacturer.
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