CBT3126_4 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 04 — 12 October 2009 4 of 13
NXP Semiconductors
CBT3126
Quad FET bus switch
9. Static characteristics
[1] All typical values are measured at V
CC
=5V; T
amb
=25°C.
[2] This is the increase in supply current for each input that is at the specified TTL voltage level rather than V
CC
or GND.
[3] Measured by the voltage drop between the A and the B terminals at the indicated current through the switch. ON resistance is
determined by the lowest voltage of the two (A or B) terminals.
10. Dynamic characteristics
[1] This parameter is warranted but not production tested. The propagation delay is based on the RC time constant of the typical ON
resistance of the switch and a load capacitance, when driven by an ideal voltage source (zero output impedance).
[2] t
PLH
and t
PHL
are the same as t
pd
;
t
PZL
and t
PZH
are the same as t
en
;
t
PLZ
and t
PHZ
are the same as t
dis
.
Table 6. Static characteristics
T
amb
=
40
°
C to +85
°
C.
Symbol Parameter Conditions Min Typ
[1]
Max Unit
V
IK
input clamping voltage V
CC
= 4.5 V; I
I
= 18 mA - - 1.2 V
V
pass
pass voltage V
I
=V
CC
= 5.0 V; I
SW
= 100 µA - 3.8 - V
I
I
input leakage current V
CC
= 5.5 V; V
I
= GND or 5.5 V - - ±1 µA
I
CC
supply current V
CC
= 5.5 V; I
SW
= 0 mA;
V
I
=V
CC
or GND
--3µA
I
CC
additional supply current control pins; per input;
V
CC
= 5.5 V; one input at 3.4 V,
other inputs at V
CC
or GND
[2]
- - 2.5 mA
C
I
input capacitance control pins; V
I
= 3 V or 0 V - 1.7 - pF
C
io(off)
off-state input/output capacitance V
O
= 3 V or 0 V; nOE = V
CC
- 3.4 - pF
R
ON
ON resistance V
CC
= 4.0 V
[3]
V
I
= 2.4 V; I
I
= 15 mA - 16 22
V
CC
= 4.5 V
V
I
=0V; I
I
=64mA - 5 7
V
I
=0V; I
I
=30mA - 5 7
V
I
= 2.4 V; I
I
= 15 mA - 10 15
Table 7. Dynamic characteristics
T
amb
=
40
°
C to +85
°
C; V
CC
= 4.5 V to 5.5 V; for test circuit see Figure 8.
Symbol Parameter Conditions Min Max Unit
t
pd
propagation delay nA to nB or nB to nA; see Figure 6
[1][2]
- 0.25 ns
t
en
enable time nOE to nA or nB; see Figure 7
[2]
1.6 4.5 ns
t
dis
disable time nOE to nA or nB; see Figure 7
[2]
1.0 5.4 ns
CBT3126_4 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 04 — 12 October 2009 5 of 13
NXP Semiconductors
CBT3126
Quad FET bus switch
11. AC waveforms
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 6. The input (nA, nB) to output (nB, nA) propagation delay times
001aai367
V
M
V
M
V
M
V
M
V
I
input
0 V
V
OH
output
V
OL
t
PHL
t
PLH
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 7. Enable and disable times
001aaj027
t
PLZ
t
PHZ
switch
disabled
switch
enabled
V
Y
V
X
switch
enabled
output
LOW-to-OFF
OFF-to-LOW
output
HIGH-to-OFF
OFF-to-HIGH
nOE input
V
I
V
OL
V
OH
V
CC
V
M
GND
GND
t
PZL
t
PZH
V
M
V
M
Table 8. Measurement points
Input Output
V
M
V
M
V
X
V
Y
1.5 V 1.5 V V
OL
+ 0.3 V V
OH
0.3 V
CBT3126_4 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 04 — 12 October 2009 6 of 13
NXP Semiconductors
CBT3126
Quad FET bus switch
12. Test information
Test data is given in Table 9.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 8. Test circuit for measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aae331
V
EXT
V
CC
V
I
V
O
DUT
C
L
R
T
R
L
R
L
G
Table 9. Test data
Supply voltage Input Load V
EXT
V
CC
V
I
t
r
, t
f
C
L
R
L
t
PLH
, t
PHL
t
PLZ
, t
PZL
t
PHZ
, t
PZH
4.5 V to 5.5 V GND to 3.0 V 2.5 ns 50 pF 500 open 7.0 V open

CBT3126DB,112

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
IC FET BUS SWITCH QUAD 14SSOP
Lifecycle:
New from this manufacturer.
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