FDS8947A

March 1998
FDS8947A
Dual P-Channel Enhancement Mode Field Effect Transistor
General Description Features
Absolute Maximum Ratings T
A
= 25
o
C unless other wise noted
Symbol Parameter FDS8947A Units
V
DSS
Drain-Source Voltage -30 V
V
GSS
Gate-Source Voltage -20 V
I
D
Drain Current - Continuous (Note 1a) - 4.0 A
- Pulsed -20
P
D
Power Dissipation for Dual Operation 2 W
Power Dissipation for Single Operation (Note 1a) 1.6
(Note 1b) 1
(Note 1c) 0.9
T
J
,T
STG
Operating and Storage Temperature Range -55 to 150 °C
THERMAL CHARACTERISTICS
R
θ
JA
Thermal Resistance, Junction-to-Ambient (Note 1a) 78 °C/W
R
θ
JC
Thermal Resistance, Junction-to-Case (Note 1) 40 °C/W
FDS8947A Rev.B
-4.0 A, -30 V. R
DS(ON)
= 0.052 @ V
GS
= -10 V
R
DS(ON)
= 0.080 @ V
GS
= -4.5 V.
High density cell design for extremely low R
DS(ON)
.
High power and current handling capability in a widely
used surface mount package.
Dual MOSFET in surface mount package.
SOT-23
SuperSOT
TM
-8
SOIC-16
SO-8 SOT-223
SuperSOT
TM
-6
SO-8 P-Channel enhancement mode power field effect
transistors are produced using Fairchild's proprietary, high cell
density, DMOS technology. This very high density process is
especially tailored to minimize on-state resistance and provide
superior switching performance. These devices are particularly
suited for low voltage applications such as notebook computer
power management and other battery powered circuits where
fast switching, low in-line power loss, and resistance to
transients are needed.
S1
D1
S2
G1
SO-8
D2
D2
D1
G2
FDS
8947A
pin
1
1
5
7
8
2
3
4
6
© 1998 Fairchild Semiconductor Corporation
Electrical Characteristics (T
A
= 25
O
C unless otherwise noted )
Symbol Parameter Conditions Min Typ Max Units
OFF CHARACTERISTICS
BV
DSS
Drain-Source Breakdown Voltage V
GS
= 0 V, I
D
= -250 µA -30 V
BV
DSS
/T
J
Breakdown Voltage Temp. Coefficient
I
D
= -250 µA, Referenced to 25
o
C
-23
mV /
o
C
I
DSS
Zero Gate Voltage Drain Current
V
DS
= -24 V, V
GS
= 0 V
-1 µA
I
GSSF
Gate - Body Leakage, Forward V
GS
= 20 V, V
DS
= 0 V -100 nA
I
GSSR
Gate - Body Leakage, Reverse
V
GS
= -20 V, V
DS
= 0 V
-100 nA
ON CHARACTERISTICS (Note 2)
V
GS(th)
Gate Threshold Voltage V
DS
= V
GS
, I
D
= -250 µA -1 -1.5 -3 V
V
GS(th)
/T
J
Gate Threshold Voltage Temp. Coefficient
I
D
= -250 µA, Referenced to 25
o
C
4
mV /
o
C
R
DS(ON)
Static Drain-Source On-Resistance
V
GS
= -10 V, I
D
= -4 A
0.044 0.052
T
J
=125°C 0.06 0.085
V
GS
= -4.5 V, I
D
= -3.2 A
0.067 0.08
I
D(ON)
On-State Drain Current V
GS
= -10 V, V
DS
= -5 V -20 A
g
FS
Forward Transconductance
V
DS
= -10 V, I
D
= -4 A
8 S
DYNAMIC CH ARACTERISTICS
C
iss
Input Capacitance V
DS
= -15 V, V
GS
= 0 V,
f = 1.0 MHz
730 pF
C
oss
Output Capacitance 400 pF
C
rss
Reverse Transfer Capacitance 90 pF
SWITCHING CHARACTERISTICS (Note 2)
t
D(on)
Turn - On Delay Time
V
DS
= -10 V, I
D
= -1 A
11 20 ns
t
r
Turn - On Rise Time
V
GS
= -10 V , R
GEN
= 6
10 18
t
D(off)
Turn - Off Delay Time 90 110
t
f
Turn - Off Fall Time 55 80
Q
g
Total Gate Charge
V
DS
= -10 V, I
D
= -4 A,
19 27 nC
Q
gs
Gate-Source Charge
V
GS
= -10 V
3.5
Q
gd
Gate-Drain Charge 3.6
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
I
S
Maximum Continuous Drain-Source Diode Forward Current -1.3 A
V
SD
Drain-Source Diode Forward Voltage
V
GS
= 0 V, I
S
= -1.3 A
(Note 2)
-0.75 -1.2 V
t
rr
Reverse Recovery Time V
GS
= 0 V, I
F
= -1.3 A
dI
F
/dt = 100 A/µs
48 100 ns
Irr Reverse Recovery Current 0.8 A
Notes:
1. R
θ
JA
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. R
θ
JC
is guaranteed by
design while R
θ
CA
is determined by the user's board design.
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.
FDS8947A Rev.B
c. 135
O
C/W on a 0.003 in
2
pad of 2oz copper.
b. 125
O
C/W on a 0.02 in
2
pad of 2oz copper.
a. 78
O
C/W on a 0.5 in
2
pad of 2oz copper.
FDS8947A Rev.B
0 4 8 12 16 20
0.5
1
1.5
2
2.5
3
-I , DRAIN CURRENT (A)
DRAIN-SOURCE ON-RESISTANCE
V =-3.5V
GS
D
R , NORMALIZED
DS(on)
-5.0V
-4.5V
-4.0V
-10V
-6.0V
Typical Electrical Characteristics
Figure 1. On-Region Characteristics.
Figure 2. On-Resistance Variation with
Drain Current and Gate
Voltage.
-50 -25 0 25 50 75 100 125 150
0.6
0.8
1
1.2
1.4
1.6
T , JUNCTION TEMPERATURE (°C)
DRAIN-SOURCE ON-RESISTANCE
J
R , NORMALIZED
DS(ON)
V = -10V
GS
I = -4.0A
D
Figure 3. On-Resistance Variation with
Temperature.
1 2 3 4 5 6
0
5
10
15
20
-V , GATE TO SOURCE VOLTAGE (V)
-I , DRAIN CURRENT (A)
V = -5V
DS
GS
D
T = -55°C
J
125°C
25°C
Figure 5. Transfer Characteristics.
0 0.3 0.6 0.9 1.2 1.5
0.0001
0.001
0.01
0.1
1
5
20
-V , BODY DIODE FORWARD VOLTAGE (V)
-I , REVERSE DRAIN CURRENT (A)
25°C
-55°C
V = 0V
GS
SD
S
T = 125°C
J
Figure 6 . Body Diode Forward Voltage
Variation with Source Current
and Temperature.
2 4 6 8 10
0
0.05
0.1
0.15
0.2
0.25
0.3
-V , GATE TO SOURCE VOLTAGE (V)
GS
R , ON-RESISTANCE (OHM)
DS(ON)
T = 25°C
A
I = -2A
D
T = 125°C
A
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
0 1 2 3 4 5
0
5
10
15
20
-V , DRAIN-SOURCE VOLTAGE (V)
-I , DRAIN-SOURCE CURRENT (A)
V =-10V
GS
DS
D
-4.0V
-4.5V
-3.5V
-3.0V
-6.0V
-5.0V

FDS8947A

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
MOSFET 2P-CH 30V 4A 8SOIC
Lifecycle:
New from this manufacturer.
Delivery:
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