NFZ32BW150HN10L

SpecNo.JENF243J-0004B-01 P1/8
MURATA MFG.CO., LTD
Reference Only
Rated
Current
at 85
Rated
Current
at 105
85
105
Operating Temperature
(
Ambient temperature
)[]
Rated Current [mA]
CHIP NOISE FILTER NFZ32BW□□□HN10L REFERENCE SPECIFICATION
1.Scope
This reference specification applies to NFZ32BW_HN10L Series, Chip Noise Filter.
2.Part Numbering
(ex) NF Z 32 BW 3R6 H N 1 0 L
Product ID Structure Dimension Features Impedance Performance Category Numbers Other Packaging
(L×W) of Circuit L:Taping
3.Rating
Operating Temperature Range.
(Ambient temperature; Self-temperature rise is not included) -40 to +105°C
(Product temperature; Self- temperature rise is included) -40 to +125°C
Storage Temperature Range.
-40 to +125°C
Customer Part Number MURATA Part Number
Impedance at 1MHz DC Resistance
1 Rated Current(mA)
2 Ambient
temperature
85
3 Ambient
temperature
105
() Tolerance () Tolerance
NFZ32BW3R6HN10L 3.6
±30%
0.030
±20%
2550 1600
NFZ32BW7R4HN10L 7.4 0.045 2050 1320
NFZ32BW9R0HN10L 9.0 0.057 1750 1010
NFZ32BW150HN10L 15 0.076 1600 970
NFZ32BW210HN10L 21 0.12 1200 670
NFZ32BW320HN10L 32 0.18 1000 530
NFZ32BW420HN10L 42 0.24 850 510
NFZ32BW700HN10L 70 0.38 700 380
NFZ32BW111HN10L 110 0.57 520 320
NFZ32BW151HN10L 150 0.81 450 240
NFZ32BW221HN10L 220 1.15 390 190
NFZ32BW291HN10L 290 1.78 310 140
NFZ32BW451HN10L 450 2.28 275 120
NFZ32BW621HN10L 620 2.70 250 110
NFZ32BW881HN10L 880 4.38 200 80
1: As for the rated current, rated current derated as figure.1 depending on the operating temperature.
2: When applied rated current to the Products, temperature rise caused by self heating will be 40°C or less.
3: When applied rated current to the Products, temperature rise caused by self heating will be 20°C or less.
Fugure. 1
SpecNo.JENF243J-0004B-01 P2/8
MURATA MFG.CO., LTD
Reference Only
Chip Coil
Substrate
4. Testing Conditions
Unless otherwise specified In case of doubt
Temperature : Ordinary Temperature (15 to 35°C) Temperature : 20 ± 2°C
Humidity : Ordinary Humidity (25 to 85 %(RH)) Humidity : 60 to 70%(RH)
Atmospheric Pressure : 86 to 106 kPa
5.Appearance and Dimensions
6.Electrical Performance
No. Item Specification Test Method
6.1 Impedance Impedance shall meet item 3. Measuring Equipment : KEYSIGHT 4192A or equivalent
Measuring Frequency: 1MHz
6.2 DC Resistance DC Resistance shall meet item 3. Measuring Equipment: Digital multi meter
7.Mechanical Performance
No. Item Specification Test Method
7.1 Shear Test Chip Noise Filter shall not be
damaged.
Substrate: Glass-epoxy substrate
Force: 10N
Hold Duration: 5±1s
7.2 Bending Test Substrate: Glass-epoxy substrate
(100×40×1.0mm)
Speed of Applying Force: 0.5mm / s
Deflection: 2mm
Hold Duration: 5s
(in mm)
7.3 Vibration Chip Noise Filter shall not be
damaged.
Oscillation Frequency : 10 to 2000 to 10Hz for 20 min
Total amplitude : 1.5 mm or Acceleration amplitude
98 m/s
2
whichever is smaller.
Testing Time: A period of 2 hours in each of
3 mutually perpendicular directions.
(Total 6 hours)
45
R230
F
Deflection
45
Product
Pressure jig
2.5±0.2
2.7±0.2
2.5±0.2
1.55±0.15
3.2±0.3
0.9±0.3 1.3±0.2
0.9±0.3
※製品本体への表示はありません。
A:2.8以下
(
単位
mm)
No marking.
(in mm)
Unit MassTypical value
0.044
SpecNo.JENF243J-0004B-01 P3/8
MURATA MFG.CO., LTD
Reference Only
2.9±0.2
2.0±0.05
4.0±0.1
Direction of feed
1.7±0.2
Lead- in/out wire
4.0±0.1
3.6±0.2
8.0±0.2
1.75±0.13.5±0.05
φ
1.5
-0
+0.1
0.2
The packing directions of the chip coil
in taping are unified with the in/out
positions of the lead wire.
( )
No. Item Specification Test Method
7.4 Solderability The wetting area of the electrode shall
be at least 90% covered with new
solder coating.
Flux: Ethanol solution of rosin,25(wt)%
(Immersed for 5s to 10s)
Solder : Sn-3.0Ag-0.5Cu
Pre-Heating: 150±10°C / 60 to 90s
Solder Temperature: 240±5°C
Immersion Time: 3±1 s
7.5 Resistance to
Soldering Heat
Appearance: No damage
Impedance Change: within ± 10%
Flux: Ethanol solution of rosin,25(wt)%
(Immersed for 5s to 10s)
Solder : Sn-3.0Ag-0.5Cu
Pre-Heating: 150±10°C / 60 to 90s
Solder Temperature: 270±5°C
Immersion Time: 10±1 s
Then measured after exposure in the room
condition for 24±2 hours.
8.Environmental Performance (It shall be soldered on the substrate.)
No. Item Specification Test Method
8.1 Heat Resistance Appearance: No damage
Impedance Change: within ± 10%
DC Resistance Change: within ± 10%
Temperature: 105±2°C
Time: 1000 h (+48h , -0h)
Then measured after exposure in the room condition
for 24±2 hours.
8.2 Cold Resistance Temperature: -40±2°C
Time: 1000 h (+48h , -0h)
Then measured after exposure in the room condition
for 24±2 hours.
8.3 Humidity Temperature: 40±2°C
Humidity: 90~95%(RH)
Time: 1000 h (+48h , -0h)
Then measured after exposure in the room condition
for 24±2 hours.
8.4 Temperature
Cycle
1 cycle:
1 step: -40±2°C / 30±3 min
2 step: Ordinary temp. / 10 to 15 min
3 step: +105±2°C / 30±3 min
4 step: Ordinary temp. / 10 to 15 min
Total of 10 cycles
Then measured after exposure in the room condition
for 24±2 hours.
9. Specification of Packaging
9.1 Appearance and Dimensions of plastic tape
(in mm)
Dimension of the Cavity is measured
at the bottom side.

NFZ32BW150HN10L

Mfr. #:
Manufacturer:
Description:
EMI Filter Beads, Chips & Arrays 1210 15ohm 30%
Lifecycle:
New from this manufacturer.
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