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IRLL024ZPBF
P1-P3
P4-P6
P7-P9
P10-P10
IRLL024ZPbF
4
www.irf.com
Fig 8.
Maximum Safe Operating Area
Fig 6.
Typical Gate Charge vs.
Gate-to-Source Voltage
Fig 5.
Typical Capacitance vs.
Drain-to-Source Voltage
Fig 7.
Typical Source-Drain Diode
Forward Voltage
1
10
100
V
DS
, D
rai
n-t
o-S
ource Vol
tage (V
)
10
100
1000
10000
C
,
C
a
p
a
c
i
t
a
n
c
e
(
p
F
)
V
GS
= 0V, f = 1 MHZ
C
iss
= C
gs
+ C
gd
, C
ds
SHO
RTED
C
rss
= C
gd
C
oss
= C
ds
+ C
gd
C
oss
C
rss
C
iss
0123456
78
Q
G
Tot
al Gate C
harge (
nC)
0.0
1.0
2.0
3.0
4.0
5.0
6.0
V
G
S
,
G
a
t
e
-
t
o
-
S
o
u
r
c
e
V
o
l
t
a
g
e
(
V
)
V
DS
= 44V
V
DS
= 28V
V
DS
= 11V
I
D
= 3.
0A
0.0
0.
5
1.0
1.
5
2.0
2.
5
3.0
V
SD
, S
ource-
to-D
rai
n Volt
age (V
)
0
1
10
100
I
S
D
,
R
e
v
e
r
s
e
D
r
a
i
n
C
u
r
r
e
n
t
(
A
)
T
J
= 25°
C
T
J
= 150°
C
V
GS
= 0V
0.1
1.0
10
100
1000.0
V
DS
, D
rai
n-t
o-Sour
ce Volt
age (V
)
0.0001
0.001
0.01
0.1
1
10
100
1000
I
D
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
C
u
r
r
e
n
t
(
A
)
1msec
10msec
OPERATION IN THIS AREA
LIM
ITED BY R
DS
(on)
100µsec
T
A
= 25°
C
Tj
= 150°C
Si
ngle Pul
se
DC
IRLL024ZPbF
www.irf.com
5
Fig 11.
Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
Fig 9.
Maximum Drain Current vs.
Ambient Temperature
Fig 10.
Normalized On-Resistance
vs. Temperature
25
50
75
100
125
150
T
A
, A
mbi
ent T
emperat
ure (
°C
)
0
1
2
3
4
5
I
D
,
D
r
a
i
n
C
u
r
r
e
n
t
(
A
)
-60
-40
-2
0
0
20
40
60
80
100
120
140
160
T
J
, Junct
ion T
emperatur
e (°
C)
0.5
1.0
1.5
2.0
R
D
S
(
o
n
)
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
O
n
R
e
s
i
s
t
a
n
c
e
(
N
o
r
m
a
l
i
z
e
d
)
I
D
= 3.
0A
V
GS
= 10V
1E-006
1E-005
0.0001
0.001
0.01
0.1
1
10
100
t
1
, R
ectangul
ar P
ulse D
urat
ion (
sec)
0.0001
0.001
0.01
0.1
1
10
100
T
h
e
r
m
a
l
R
e
s
p
o
n
s
e
(
Z
t
h
J
A
)
0.20
0.10
D =
0.50
0.02
0.01
0.05
SINGLE PUL
SE
( THERMAL RESPO
NSE )
Notes
:
1. Du
ty Fa
cto
r D = t1
/t2
2. P
eak Tj
= P dm x Z
thja +
Tc
Ri (°C/W)
τ
i (sec)
5.3396 0.000805
19.881 0.706300
19.771 20.80000
τ
J
τ
J
τ
1
τ
1
τ
2
τ
2
τ
3
τ
3
R
1
R
1
R
2
R
2
R
3
R
3
τ
τ
C
Ci
i
/
Ri
Ci=
τ
i
/
Ri
IRLL024ZPbF
6
www.irf.com
Q
G
Q
GS
Q
GD
V
G
Charge
10 V
Fig 13b.
Gate Charge Test Circuit
Fig 13a.
Basic Gate Charge Waveform
Fig 12c.
Maximum Avalanche Energy
vs. Drain Current
Fig 12b.
Unclamped Inductive Waveforms
Fig 12a.
Unclamped Inductive Test Circuit
t
p
V
(BR)DSS
I
AS
Fig 14.
Threshold Voltage vs. Temperature
R
G
I
AS
0.01
Ω
t
p
D.
U.T
L
V
DS
+
-
V
DD
DRI
V
ER
A
15V
20V
V
GS
1K
VC
C
DUT
0
L
25
50
75
100
125
150
St
art
ing T
J
, Junct
ion T
emperatur
e (°
C)
0
20
40
60
80
100
E
A
S
,
S
i
n
g
l
e
P
u
l
s
e
A
v
a
l
a
n
c
h
e
E
n
e
r
g
y
(
m
J
)
I
D
TO
P 3.0A
0.80A
BO
TTOM
0
.6
9A
-75
-50
-2
5
0
25
50
75
100
125
150
T
J
, T
emperature (
°C )
1.0
1.5
2.0
2.5
V
G
S
(
t
h
)
G
a
t
e
t
h
r
e
s
h
o
l
d
V
o
l
t
a
g
e
(
V
)
I
D
= 250µA
P1-P3
P4-P6
P7-P9
P10-P10
IRLL024ZPBF
Mfr. #:
Buy IRLL024ZPBF
Manufacturer:
Infineon Technologies
Description:
MOSFET 55V 1 N-CH HEXFET 60mOhms 7nC
Lifecycle:
New from this manufacturer.
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