MT8VDDT6464HDY-335F2

PDF: 09005aef80765fab/Source: 09005aef806e1d28 Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD8C32_64x64HD.fm - Rev. E 11/08 EN
10 ©2004 Micron Technology, Inc. All rights reserved.
256MB, 512MB (x64, DR): 200-Pin DDR SDRAM SODIMM
Electrical Specifications
Notes: 1. Value calculated as one module rank in this operating condition; all other module ranks are
in I
DD2P (CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
Table 10: IDD Specifications and Conditions – 256MB (All other Die Revisons)
Values are for the MT46V16M16 DDR SDRAM only and are computed from values specified in the
256Mb (16 Meg x 16) component data sheet
Parameter/Condition Symbol -40B -335
-26A/
-265
Units
Operating one
device
bank active-precharge current:
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing
once per clock cycle; Address and control inputs changing once every
two clock cycles
IDD0
1
556 516 496 mA
Operating one device bank active-read-precharge current:
Burst = 4;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Iout = 0mA; Address and
control inputs changing once per clock cycle
IDD1
1
756 736 636 mA
Precharge power-down standby current: All device banks idle;
Power-down mode;
t
CK =
t
CK (MIN); CKE = (LOW)
I
DD2P
2
32 32 32 mA
Idle standby current: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control inputs
changing once per clock cycle;
VIN
=
VREF
for DQ, DM, and DQS
IDD2F
2
480 400 360 mA
Active power-down standby current: One device bank active;
Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
I
DD3P
2
320 240 200/
240
mA
Active standby current: CS# = HIGH; CKE = HIGH; One device bank
active;
t
RC =
t
RAS (MAX);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing twice per clock cycle; Address and other control inputs
changing once per clock cycle
IDD3N
2
560 480 400 mA
Operating burst read current: Burst = 2; Continuous burst reads;
One device bank active; Address and control inputs changing once per
clock cycle;
t
CK =
t
CK (MIN); Iout = 0mA
I
DD4R
1
1,056 896 756 mA
Operating burst write current: Burst = 2; Continuous burst writes;
One device bank active; Address and control inputs changing once per
clock cycle;
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing twice
per clock cycle
I
DD4W
1
876 796 656 mA
Auto refresh burst current
t
RFC =
t
RFC (MIN)
I
DD5
2
2,080 2,040 1,880/
1,960
mA
t
RFC = 7.8125µs
I
DD5A
2
48 48 48 mA
Self refresh current: CKE 0.2V
I
DD6
2
32 32 32 mA
Operating bank interleave read current: Four device bank
interleaving reads; (burst = 4) with auto precharge,
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Address and control inputs change only during active
READ or WRITE commands
I
DD7
1
2,056 1,776 1,536/
1,616
mA
PDF: 09005aef80765fab/Source: 09005aef806e1d28 Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD8C32_64x64HD.fm - Rev. E 11/08 EN
11 ©2004 Micron Technology, Inc. All rights reserved.
256MB, 512MB (x64, DR): 200-Pin DDR SDRAM SODIMM
Electrical Specifications
Notes: 1. Value calculated as one module rank in this operating condition; all other module ranks are
in I
DD2P (CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
Table 11: IDD Specifications and Conditions – 512MB
Values are for the MT46V32M16 DDR SDRAM only and are computed from values specified in the
256Mb (32 Meg x 16) component data sheet
Parameter/Condition Symbol -40B -335 -265 Units
Operating one
device
bank active-precharge current:
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing
once per clock cycle; Address and control inputs changing once every
two clock cycles
IDD0
1
640 540 480 mA
Operating one device bank active-read-precharge current:
Burst = 4;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Iout = 0mA; Address and
control inputs changing once per clock cycle
IDD1
1
800 660 600 mA
Precharge power-down standby current: All device banks idle;
Power-down mode;
t
CK =
t
CK (MIN); CKE = (LOW)
I
DD2P
2
40 40 40 mA
Idle standby current: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control inputs
changing once per clock cycle;
VIN
=
VREF
for DQ, DM, and DQS
IDD2F
2
440 360 320 mA
Active power-down standby current: One device bank active;
Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
I
DD3P
2
360 280 240 mA
Active standby current: CS# = HIGH; CKE = HIGH; One device bank
active;
t
RC =
t
RAS (MAX);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing twice per clock cycle; Address and other control inputs
changing once per clock cycle
IDD3N
2
480 400 360 mA
Operating burst read current: Burst = 2; Continuous burst reads;
One device bank active; Address and control inputs changing once per
clock cycle;
t
CK =
t
CK (MIN); Iout = 0mA
I
DD4R
1
860 680 600 mA
Operating burst write current: Burst = 2; Continuous burst writes;
One device bank active; Address and control inputs changing once per
clock cycle;
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing twice
per clock cycle
I
DD4W
1
880 800 560 mA
Auto refresh burst current
t
RFC =
t
RFC (MIN)
I
DD5
2
2,760 2,320 2,240 mA
t
RFC = 7.8125µs
I
DD5A
2
88 80 80 mA
Self refresh current: CKE 0.2V
I
DD6
2
48 40 40 mA
Operating bank interleave read current: Four device bank
interleaving reads; (burst = 4) with auto precharge,
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Address and control inputs change only during active
READ or WRITE commands
I
DD7
1
1,940 1,640 1,420 mA
PDF: 09005aef80765fab/Source: 09005aef806e1d28 Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD8C32_64x64HD.fm - Rev. E 11/08 EN
12 ©2004 Micron Technology, Inc. All rights reserved.
256MB, 512MB (x64, DR): 200-Pin DDR SDRAM SODIMM
Serial Presence-Detect
Serial Presence-Detect
Notes: 1. To avoid spurious start and stop conditions, a minimum delay is placed between SCL = 1 and
the falling or rising edge of SDA.
2. This parameter is sampled.
3. For a restart condition or following a WRITE cycle.
4. The SPD EEPROM WRITE cycle time (
t
WRC) is the time from a valid stop condition of a write
sequence to the end of the EEPROM internal ERASE/PROGRAM cycle. During the WRITE
cycle, the EEPROM bus interface circuit is disabled, SDA remains HIGH due to pull-up resis-
tance, and the EEPROM does not respond to its slave address.
Serial Presence-Detect Data
For the latest serial presence-detect data, refer to Microns SPD page:
www.micron.com/SPD.
Table 12: Serial Presence-Detect EEPROM DC Operating Conditions
Parameter/Condition Symbol Min Max Units
Supply voltage
V
DDSPD 2.3 3.6 V
Input high voltage: Logic 1; All inputs
V
IH VDDSPD × 0.7 VDDSPD + 0.5 V
Input low voltage: Logic 0; All inputs
V
IL –1.0 VDDSPD × 0.3 V
Output low voltage: I
OUT = 3mA
VOL –0.4V
Input leakage current: V
IN = GND to VDD
ILI –10µA
Output leakage current: V
OUT = GND to VDD
ILO –10µA
Standby current: SCL = SDA = V
DD - 0.3V; All other inputs = VSS or VDD
ISB –30µA
Power supply current: SCL clock frequency = 100 kHz
I
CC –2.0mA
Table 13: Serial Presence-Detect EEPROM AC Operating Conditions
Parameter/Condition Symbol Min Max Units Notes
SCL LOW to SDA data-out valid
t
AA 0.2 0.9 µs 1
Time the bus must be free before a new transition can start
t
BUF 1.3 µs
Data-out hold time
t
HD:DAT 200 ns
SDA fall time
t
F 300 ns 2
SDA rise time
t
R 300 ns 2
Data-in hold time
t
HD:DI 0 µs
Start condition hold time
t
HD:STA 0.6 µs
Clock HIGH period
t
HIGH 0.6 µs
Clock LOW period
t
LOW 1.3 µs
SCL clock frequency
f
SCL 400 kHz
Data-in setup time
t
SU:DAT 100 ns
Start condition setup time
t
SU:STA 0.6 µs 3
Stop condition setup time
t
SU:STO 0.6 µs
WRITE cycle time
t
WRC 5 ms 4

MT8VDDT6464HDY-335F2

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR SDRAM 512MB 200SODIMM
Lifecycle:
New from this manufacturer.
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