MT8VDDT6464HDY-335J1

PDF: 09005aef80765fab/Source: 09005aef806e1d28 Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD8C32_64x64HD.fm - Rev. E 11/08 EN
7 ©2004 Micron Technology, Inc. All rights reserved.
256MB, 512MB (x64, DR): 200-Pin DDR SDRAM SODIMM
Electrical Specifications
Electrical Specifications
Stresses greater than those listed in Table 7 may cause permanent damage to the
module. This is a stress rating only, and functional operation of the module at these or
any other conditions outside those indicated on the device data sheet is not implied.
Exposure to absolute maximum rating conditions for extended periods may adversely
affect reliability.
Notes: 1. For further information, refer to technical note TN-00-08: “Thermal Applications,” available
on Micron’s Web site.
Table 7: Absolute Maximum Ratings
Symbol Parameter Min Max Units
V
DD
VDD supply voltage relative to VSS
–1.0 +3.6 V
V
IN, VOUT
Voltage on any pin relative to VSS
–0.5 +3.2 V
I
I
Input leakage current; Any input 0V VIN VDD;
V
REF input 0V VIN 1.35V (All other pins not under
test = 0V)
Address inputs,
RAS#, CAS#, WE#, BA
–16 +16 µA
CK, CK#, S#, CKE
–8 +8
DM
–4 +4
I
OZ
Output leakage current; 0V VOUT VDDQ; DQ are
disabled
DQ, DQS
–10 +10 µA
T
A
DRAM ambient operating temperature
1
Commercial
0+70°C
Industrial
–40 +85 °C
PDF: 09005aef80765fab/Source: 09005aef806e1d28 Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD8C32_64x64HD.fm - Rev. E 11/08 EN
8 ©2004 Micron Technology, Inc. All rights reserved.
256MB, 512MB (x64, DR): 200-Pin DDR SDRAM SODIMM
Electrical Specifications
DRAM Operating Conditions
Recommended AC operating conditions are given in the DDR component data sheets.
Component specifications are available on Microns Web site. Module speed grades
correlate with component speed grades, as shown in Table 8.
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully
designed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level.
Micron encourages designers to simulate the signal characteristics of the systems
memory bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the DRAM, not at the edge connector of the module.
Designers must account for any system voltage drops at anticipated power levels to
ensure the required supply voltage is maintained.
Table 8: Module and Component Speed Grades
DDR components may exceed the listed module speed grades
Module Speed Grade Component Speed Grade
-40B -5B
-335 -6
-26A -75Z
-265 -75
PDF: 09005aef80765fab/Source: 09005aef806e1d28 Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD8C32_64x64HD.fm - Rev. E 11/08 EN
9 ©2004 Micron Technology, Inc. All rights reserved.
256MB, 512MB (x64, DR): 200-Pin DDR SDRAM SODIMM
Electrical Specifications
IDD Specifications
Notes: 1. Value calculated as one module rank in this operating condition; all other module ranks are
in IDD2P (CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
Table 9: IDD Specifications and Conditions – 256MB (Die Revision K)
Values are for the MT46V16M16 DDR SDRAM only and are computed from values specified in the
256Mb (16 Meg x 16) component data sheet
Parameter/Condition Symbol -40B -335 Units
Operating one
device
bank active-precharge current:
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing once per
clock cycle; Address and control inputs changing once every two clock cycles
IDD0
1
416 376 mA
Operating one device bank active-read-precharge current:
Burst = 4;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Iout = 0mA; Address and control
inputs changing once per clock cycle
I
DD1
1
496 476 mA
Precharge power-down standby current: All device banks idle; Power-
down mode;
t
CK =
t
CK (MIN); CKE = (LOW)
I
DD2P
2
32 32 mA
Idle standby current: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN);
CKE = HIGH; Address and other control inputs
changing once per clock cycle;
V
IN
=V
REF
for DQ, DQS, and DM
IDD2F
2
400 400 mA
Active power-down standby current: One device bank active; Power-
down mode;
t
CK =
t
CK (MIN); CKE = LOW
I
DD3P
2
280 240 mA
Active standby current: CS# = HIGH; CKE = HIGH; One device bank active;
t
RC =
t
RAS (MAX);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing twice
per clock cycle; Address and other control inputs changing once per clock
cycle
I
DD3N
2
480 440 mA
Operating burst read current: Burst = 2; Continuous burst reads; One
device bank active; Address and control inputs changing once per clock cycle;
t
CK =
t
CK (MIN); Iout = 0mA
I
DD4R
1
736 656 mA
Operating burst write current: Burst = 2; Continuous burst writes; One
device bank active; Address and control inputs changing once per clock cycle;
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing twice per clock cycle
I
DD4W
1
736 656 mA
Auto refresh burst current
t
RFC =
t
RFC (MIN)
IDD5
2
1,280 1,280 mA
t
RFC = 7.8125µs
IDD5A
2
48 48 mA
Self refresh current: CKE 0.2V
I
DD6
2
32 32 mA
Operating bank interleave read current: Four device bank interleaving
reads; (burst = 4) with auto precharge,
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN);
Address and control inputs change only during active READ or WRITE
commands
IDD7
1
1,176 1,096 mA

MT8VDDT6464HDY-335J1

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR SDRAM 512MB 200SODIMM
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New from this manufacturer.
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