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74FCT162823CTPVG8

P1-P3P4-P6P7-P7
1
IDT74FCT162823AT/CT
FAST CMOS 18-BIT REGISTER
INDUSTRIAL TEMPERATURE RANGE
SEPTEMBER 2009
IDT74FCT162823AT/CT
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS 18-BIT
REGISTER
DESCRIPTION:
The FCT162823T 18-bit bus interface register is built using advanced, dual
metal CMOS technology. These high-speed, low-power registers with clock
enable (xCLKEN) and clear (xCLR) controls are ideal for parity bus interfacing
in high-performance synchronous systems. The control inputs are organized
to operate the device as two 9-bit registers or one 18-bit register. Flow-through
organization of signal pins simplifies layout. All inputs are designed with
hysteresis for improved noise margin.
The FCT162823T has balanced output drive with current limiting resistors.
This offers low ground bounce, minimal undershoot, and controlled output fall
times – reducing the need for external series terminating resistors. The
FCT162823T is a plug-in replacement for the FCT16823T and ABT16823 for
on-board interface applications.
R
C
D
2
OE
2
CLR
2
CLKEN
2
CLK
2
D
1
2
Q
1
TO EIGHT OTHER CHANNELS
R
C
D
1
OE
1
CLR
1
CLKEN
1
CLK
1
D
1
1
Q
1
TO EIGHT OTHER CHANNELS
2
1
56
55
54
3
27
28
29
30
42
15
FEATURES:
• 0.5 MICRON CMOS Technology
• High-speed, low-power CMOS replacement for ABT functions
• Typical tSK(o) (Output Skew) < 250ps
• Low input and output leakage
≤≤
≤≤
≤1µA (max.)
•VCC = 5V ±10%
• Balanced Output Drivers of ±24mA
• Reduced system switching noise
• Typical VOLP (Output Ground Bounce) < 0.6V at VCC = 5V,
TA = 25°C
• Available in SSOP and TSSOP packages
FUNCTIONAL BLOCK DIAGRAM
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
© 2009 Integrated Device Technology, Inc. DSC-5437/7
2
INDUSTRIAL TEMPERATURE RANGE
IDT74FCT162823AT/CT
FAST CMOS 18-BIT REGISTER
SSOP/ TSSOP
TOP VIEW
PIN CONFIGURATION
47
37
38
39
40
41
42
43
44
45
46
33
34
35
36
56
55
49
50
51
52
53
54
48
1
2
3
4
5
6
7
8
9
10
12
13
14
15
16
17
18
19
20
11
21
22
23
24
29
30
31
3225
26
27
28
2
CLR
GND
V
CC
2
Q
3
2
Q
5
2
Q
6
2
Q
4
GND
2
Q
7
2
Q
8
2
Q
9
2
OE
GND
1
Q
9
1
Q
5
1
Q
6
1
Q
7
1
Q
8
2
Q
1
2
Q
2
GND
1
Q
2
V
CC
1
CLR
1
Q
1
1
Q
3
1
Q
4
1
OE
1
CLK
1
D
1
GND
1
D
2
1
D
3
V
CC
1
D
4
1
D
5
1
D
6
1
D
7
1
D
8
1
D
9
GND
2
D
1
1
CLKEN
2
D
2
GND
2
D
4
V
CC
2
D
5
2
D
6
GND
2
D
7
2
D
8
2
D
9
2
CLK
2
D
3
2
CLKEN
Symbol Description Max Unit
VTERM
(2)
Terminal Voltage with Respect to GND –0.5 to 7 V
VTERM
(3)
Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V
TSTG Storage Temperature –65 to +150 ° C
I
OUT DC Output Current –60 to +120 mA
ABSOLUTE MAXIMUM RATINGS
(1)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Outputs and I/O terminals for FCT162XXX.
Symbol Parameter
(1)
Conditions Typ. Max. Unit
CIN Input Capacitance VIN = 0V 3.5 6 pF
C
OUT Output Capacitance VOUT = 0V 3.5 8 pF
CAPACITANCE (TA = +25°C, f = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
Pin Names Description
x D x Data Inputs
xCLK Clock Inputs
xCLKEN Clock Enable Inputs (Active LOW)
xCLR Asynchronous clear Inputs (Active LOW)
xOE Output Enable Inputs (ActiveLOW)
xOx 3-State Outputs
PIN DESCRIPTION
FUNCTION TABLE
(1)(1)
(1)(1)
(1)
Inputs Outputs
xOE xCLR xCLKEN xCLK xDx xQx Function
H X X X X Z High Z
L L X X X L Clear
LHHXXQ
(2)
Hold
HHL↑ L Z Load
HHL↑ HZ
LHL↑ LL
LHL↑ HH
NOTES:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedance
2. Output level before indicated steady-state input conditions were established.
3
IDT74FCT162823AT/CT
FAST CMOS 18-BIT REGISTER
INDUSTRIAL TEMPERATURE RANGE
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
IODL Output LOW Current VCC = 5V, VIN = VIH or VIL, VO = 1.5V
(3)
60 115 200 mA
IODH Output HIGH Current VCC = 5V, VIN = VIH or VIL, VO = 1.5V
(3)
–60 –115 –200 mA
V
OH Output HIGH Voltage VCC = Min. IOH = –24mA 2.4 3.3 — V
VIN = VIH or VIL
VOL Output LOW Voltage VCC = Min. IOL = 24mA — 0.3 0.55 V
VIN = VIH or VIL
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V
VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V
IIH Input HIGH Current (Input pins)
(4)
VCC = Max. VI = VCC ——±1µA
Input HIGH Current (I/O pins)
(4)
——±1
IIL Input LOW Current (Input pins)
(4)
VI = GND — — ±1
Input LOW Current (I/O pins)
(4)
——±1
IOZH High Impedance Output Current VCC = Max. VO = 2.7V — — ±1 µA
IOZL (3-State Output pins)
(4)
VO = 0.5V — — ±1
VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V
IOS Short Circuit Current VCC = Max., VO = GND
(3)
–80 –140 –250 mA
VH Input Hysteresis — — 100 — mV
ICCL Quiescent Power Supply Current VCC = Max — 5 500 µ A
I
CCH VIN = GND or VCC
ICCZ
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This test limit for this parameter is ±5µA at TA = –55°C.
OUTPUT DRIVE CHARACTERISTICS
P1-P3P4-P6P7-P7

74FCT162823CTPVG8

Mfr. #:
Buy 74FCT162823CTPVG8
Manufacturer:
IDT
Description:
Registers 18-Bit Register
Lifecycle:
New from this manufacturer.
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