SPA2410LR5H-B
12. RELIABILITY SPECIFICATIONS
Test Description
Thermal Shock
100 cycles air-to-air thermal shock from -40
o
C to +125
o
C with 15
minute soaks. (IEC 68-2-4)
High Temperature Storage 1,000 hours at +105
o
C environment (IEC 68-2-2 Test Ba)
Low Temperature Storage 1,000 hours at -40
o
C environment (IEC 68-2-2 Test Aa)
High Temperature Bias 1,000 hours at +105
o
C under bias (IEC 68-2-2 Test Ba)
Low Temperature Bias 1,000 hours at -40
o
C under bias (IEC 68-2-2 Test Aa)
Temperature / Humidity Bias 1,000 hours at +85
o
C/85% R.H. under bias. (JESD22-A101A-B)
Vibration
4 cycles of 20 to 2,000 Hz sinusoidal sweep with 20 G peak
acceleration lasting 12 minutes in X, Y, and Z directions.
(Mil-Std-883E, Method 2007.2 A)
ESD-HBM
3 discharges of ±2 kV direct contact to I/O pins.
(MIL 883E, Method 3015.7)
ESD-LID/GND
3 discharges of ±8 kV direct contact to lid while unit is grounded.
(IEC 61000-4-2)
ESD-MM
3 discharges of ±200 V direct contact to I/O pins.
(ESD STM5.2)
Reflow 5 reflow cycles with peak temperature of +260
o
C
Mechanical Shock 3 pulses of 10,000 G in the X, Y, and Z direction (IEC 68-2-27, Test Ea)
Notes: After reliability tests are performed, the sensitivity of the microphones shall not deviate
more than 3 dB from its initial value.
Revision: D 5/20/2013
Sheet 10 of
11 ©2013 Knowles Electronics
