May 1997
NDH8304P
Dual P-Channel Enhancement Mode Field Effect Transistor
General Description Features
___________________________________________________________________________________________
Absolute Maximum Ratings T
A
= 25°C unless otherwise noted
Symbol Parameter
NDH8304P
Units
V
DSS
Drain-Source Voltage -20 V
V
GSS
Gate-Source Voltage ±8 V
I
D
Drain Current - Continuous (Note 1) -2.7 A
- Pulsed -10
P
D
Maximum Power Dissipation (Note 1) 0.8 W
T
J
,T
STG
Operating and Storage Temperature Range -55 to 150 °C
THERMAL CHARACTERISTICS
R
θJA
Thermal Resistance, Junction-to-Ambient (Note 1) 156 °C/W
R
θJC
Thermal Resistance, Junction-to-Case (Note 1) 40 °C/W
NDH8304P Rev.C
SuperSOT
TM
-8 P-Channel enhancement mode power field
effect transistors are produced using Fairchild's proprietary,
high cell density, DMOS technology. This very high density
process is especially tailored to minimize on-state resistance.
These devices are particularly suited for low voltage
applications such as notebook computer power management
and other battery powered circuits where fast high-side
switching, and low in-line power loss are needed in a very small
outline surface mount package.
-2.7 A, -20 V. R
DS(ON)
= 0.07 Ω @ V
GS
= -4.5 V
R
DS(ON)
= 0.095 Ω @ V
GS
= -2.7 V.
Proprietary SuperSOT
TM
-8 package design using copper
lead frame for superior thermal and electrical capabilities.
High density cell design for extremely low R
DS(ON)
.
Exceptional on-resistance and maximum DC current
capability.
1
5
7
8
2
6
3
4
© 1997 Fairchild Semiconductor Corporation