LQG18HH6N2S00D

Spec No. JELF243B-9102E-01 P.7 / 9
MURATA MFG.CO., LTD
Reference Only
9.5 Solder Volume
Solder shall be used not to be exceeded the upper limits as shown below.
Accordingly increasing the solder volume, the mechanical stress to Chip is also increased.
Exceeding solder volume may cause the failure of mechanical or electrical performance.
1/3TtT
T thickness of product
9.6 Mount Shock
Over Mechanical stress to products at mounting process causes crack and electrical failure etc.
9.7 Product’s location
The following shall be considered when designing and laying out P.C.B.'s.
(1) P.C.B. shall be designed so that products are not subject to the mechanical stress due to
warping the board.
Products direction
Products shall be located in the sideways
direction (Length: ab) to the mechanical
stress.
(2) Products location on P.C.B. separation
Products (A, B, C, D) shall be located carefully so
that products are not subject to the mechanical
stress due to warping the board.
Because they may be subjected the mechanical
stress in order of A CB D.
9.8 Cleaning Conditions
Products shall be cleaned on the following conditions.
(1) Cleaning temperature shall be limited to 60°C max. (40°C max for IPA.)
(2) Ultrasonic cleaning shall comply with the following conditions with avoiding the resonance
phenomenon at the mounted products and P.C.B.
Power : 20 W / l max. Frequency : 28kHz to 40kHz Time : 5 min max.
(3) Cleaner
1. Alcohol type cleaner
Isopropyl alcohol (IPA)
2. Aqueous agent
PINE ALPHA ST-100S
(4) There shall be no residual flux and residual cleaner after cleaning. In the case of using aqueous agent,
products shall be dried completely after rinse with de-ionized water in order to remove the cleaner.
(5) Other cleaning Please contact us.
9.9 Resin coating
The inductance value may change and/or it may affect on the product's performance due to high cure-stress
of resin to be used for coating / molding products. So please pay your careful attention when you select
resin.
In prior to use, please make the reliability evaluation with the product mounted in your application set.
Upper Limit
Recommendable
t
Seam
Slit
A
D
B
C
b
a
Lengh:a<b
Poor example
Good example
b
a
Spec No. JELF243B-9102E-01 P.8 / 9
MURATA MFG.CO., LTD
Reference Only
9.10 Handling of a substrate
After mounting products on a substrate, do not apply any stress to the product caused by bending or twisting
to the substrate when cropping the substrate, inserting and removing a connector from the substrate or
tightening screw to the substrate.
Excessive mechanical stress may cause cracking in the product.
Bending Twisting
9.11 Storage and Handing Requirements
(1) Storage period
Use the products within 6 months after delivered.
Solderability should be checked if this period is exceeded.
(2) Storage conditions
Products should be stored in the warehouse on the following conditions.
Temperature -10°C to 40°C
Humidity
15% to 85% relative humidity No rapid change on temperature and humidity
Don't keep products in corrosive gases such as sulfur,chlorine gas or acid, or it may cause
oxidization of electrode, resulting in poor solderability.
Products should be stored on the palette for the prevention of the influence from humidity, dust and
so on.
Products should be stored in the warehouse without heat shock, vibration, direct sunlight and so on.
Products should be stored under the airtight packaged condition.
(3) Handling Condition
Care should be taken when transporting or handling product to avoid excessive vibration or mechanical shock.
10.
!
Notes
(1)Please make sure that your product has been evaluated in view of your specifications with our product being
mounted to your product.
(2)You are requested not to use our product deviating from the reference specifications.
(3)The contents of this reference specification are subject to change without advance notice.
Please approve our product specifications or transact the approval sheet for product specifications before
ordering.
Spec No. JELF243B-9102E-01 P.9 / 9
MURATA MFG.CO., LTD
Reference Only
(1) Residual elements and stray elements of test fixture can be described by F-parameter shown in following.
V
1
A B V
2
I
1
C D I
2
(2) The impedance of chip coil Zx and measured value Zm can be described by input/output current/voltage.
V
1
V
2
I
1
I
2
(3) Thus,the relation between Zx and Zm is following;
Zm-β where, α= D / A =1
1-ZmΓ β= B / D =Zsm-(1-Yom Zsm)Zss
Γ= C / A =Yom
Zsm:measured impedance of short chip
Zss:residual impedance of short chip (0nH)
Yom:measured admittance when opening the fixture
(4) Lx and Qx shall be calculated with the following equation.
Im(Zx) Im(Zx) Lx : Inductance of chip coil
2πf Re(Zx) Qx: Q of chip coil
f : Measuring frequency
=
Zm=
Zx=
Zx=
Lx=
Qx=
<Electrical Performance:Measuring Method of Inductance/Q>
A
B
C
D
Zm
Zx
V
1
2
1
2
ProductTest fixtureTest Head
I
I
V

LQG18HH6N2S00D

Mfr. #:
Manufacturer:
Murata Electronics
Description:
Fixed Inductors 0603 6.2nH +/-0.3nH 100MHz 0.20ohm
Lifecycle:
New from this manufacturer.
Delivery:
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