12 Integrated Silicon Solution, Inc. — www.issi.com
Rev. C1
12/18/2016
IS61C5128AL/AS IS64C5128AL/AS
DATA RETENTION wAVEFORM (CE Controlled)
VDD
CE ≥ VDD
- 0.2V
t
SDR
t
RDR
V
DR
CE
GND
4.5V
Data Retention Mode
DATA RETENTION SwITCHING CHARACTERISTICS (HIGH SPEED) (IS61/64C5128AL)
Symbol Parameter Test Condition Min. Max. Unit
VdrVddforDataRetention SeeDataRetentionWaveform 2.9 5.5 V
idr DataRetentionCurrent Vdd=2.9V,CE ≥Vdd–0.2V Com. — 8 mA
Vin ≥ Vdd – 0.2V, or Vin
≤
Vss + 0.2V
Ind. — 10
Auto. — 15
typ.
(1)
1
tsdr DataRetentionSetupTime SeeDataRetentionWaveform 0 — ns
trdr RecoveryTime SeeDataRetentionWaveform trC — ns
Note:
1.TypicalValuesaremeasuredatVdd=5V,Ta = 25
o
Candnot100%tested.