23
General Specifications
Environmental
Specification
Appearance
No visual defects
Capacitance Variation
C0G (NP0): ± 5% or ± .5pF, whichever is greater
X7R: ± 10%
Z5U: ± 30%
Y5V: ± 30%
Q, Tan Delta
C0G (NP0): 30pF......................Q 350
10pF, < 30pF.........Q 275+5C/2
< 10pF ....................Q 200+10C
X7R: Initial requirement + .5%
Z5U: Initial requirement + 1%
Y5V: Initial requirement + 2%
Insulation Resistance
Initial Value x 0.3
Measuring Conditions
Store at 85 ± 5% relative humidity and 85°C for 1000
hours, without voltage. Remove from test chamber
and stabilize at room temperature and humidity for
48 ± 4 hours (24 ±2 hours for C0G (NP0)) before
measuring.
Charge and discharge currents must be less than
50ma.
STEADY STATE HUMIDITY
(No Load)
Specification
Appearance
No visual defects
Capacitance Variation
C0G (NP0): ± 5% or ± .5pF, whichever is greater
X7R: ± 10%
Z5U: ± 30%
Y5V: ± 30%
Q, Tan Delta
C0G (NP0): 30pF .....................Q 350
10pF,< 30pF.........Q 275+5C/2
< 10pF ....................Q 200+10C
X7R: Initial requirement + .5%
Z5U: Initial requirement + 1%
Y5V: Initial requirement + 2%
LOAD HUMIDITY
Specification
Appearance
No visual defects
Capacitance Variation
C0G (NP0): ± 3% or ± .3pF, whichever is greater
X7R: ± 10%
Z5U: ± 30%
Y5V: ± 30%
Q, Tan Delta
C0G (NP0): 30pF......................Q 350
10pF, < 30pF.........Q 275+5C/2
< 10pF ....................Q 200+10C
X7R: Initial requirement + .5%
Z5U: Initial requirement + 1%
Y5V: Initial requirement + 2%
Insulation Resistance
C0G (NP0), X7R: To meet initial value x 0.3
Z5U, Y5V: Initial Value x 0.1
Charge devices with twice rated voltage in test
chamber set at +125°C ± 2°C for C0G (NP0) and X7R,
+85° ± 2°C for Z5U, and Y5V for 1000 (+48,-0) hours.
Remove from test chamber and stabilize at room
temperature for 48 ± 4 hours (24 ±2 hours for C0G
(NP0)) before measuring.
Charge and discharge currents must be less than
50ma.
LOAD LIFE
Insulation Resistance
C0G (NP0), X7R: To meet initial value x 0.3
Z5U, Y5V: Initial Value x 0.1
Charge devices with rated voltage in test chamber set
at 85 ± 5% relative humidity and 85°C for 1000
(+48,-0) hours. Remove from test chamber and
stabilize at room temperature and humidity for 48 ± 4
hours (24 ±2 hours for C0G (NP0)) before measuring.
Charge and discharge currents must be less than
50ma.
24
General Specifications
Mechanical
Specification
No evidence of peeling of end terminal
Measuring Conditions
After soldering devices to circuit board apply 5N
(0.51kg f) for 10 ± 1 seconds, please refer to Figure 1.
Specification
Appearance:
No visual defects
Capacitance
Within specified tolerance
Q, Tan Delta
To meet initial requirement
Insulation Resistance
C0G (NP0), X7R Initial Value x 0.3
Z5U, Y5V Initial Value x 0.1
Measuring Conditions
Vibration Frequency
10-2000 Hz
Maximum Acceleration
20G
Swing Width
1.5mm
Test Time
X, Y, Z axis for 2 hours each, total 6 hours of test
END TERMINATION ADHERENCE
RESISTANCE TO VIBRATION
Specification
95% of each termination end should be covered with
fresh solder
Measuring Conditions
Dip device in eutectic solder at 230 ± 5°C for
2 ± .5 seconds
Figure 2. Bend Strength
Figure 1.
Terminal Adhesion
SOLDERABILITY
Specification
Appearance:
No visual defects
Capacitance Variation
C0G (NP0): ± 5% or ± .5pF, whichever is larger
X7R: ± 12%
Z5U: ± 30%
Y5V: ± 30%
Insulation Resistance
C0G (NP0): Initial Value x 0.3
X7R: Initial Value x 0.3
Z5U: Initial Value x 0.1
Y5V: Initial Value x 0.1
Measuring Conditions
Please refer to Figure 2
Deflection:
2mm
Test Time:
30 seconds
BEND STRENGTH
Specification
Appearance:
No serious defects, <25% leaching of either end
terminal
Capacitance Variation
C0G (NP0): ± 2.5% or ± 2.5pF, whichever is greater
X7R: ± 7.5%
Z5U: ± 20%
Y5V: ± 20%
Q, Tan Delta
To meet initial requirement
Insulation Resistance
To meet initial requirement
Dielectric Strength
No problem observed
Measuring Conditions
Dip device in eutectic solder at 260°C, for 1 minute.
Store at room temperature for 48 hours (24 hours for
C0G (NP0)) before measuring electrical parameters.
Part sizes larger than 3.20mm x 2.49mm are reheated
at 150°C for 30 ±5 seconds before performing test.
RESISTANCE TO SOLDER HEAT
Speed = 1mm/sec
R340mm
Supports
2mm
Deflection
45mm 45mm
5N FORCE
DEVICE UNDER TEST
TEST BOARD
31
0805
Size
(L" x W")
5
Voltage
50V = 5
100V = 1
200V = 2
C
Dielectric
1B CG = A
2R1 = C
2F4 = G
103
Capacitance
Code
M
Capacitance
Tolerance
See Dielectrics
C0G, X7R, Y5V
T
Specification
CECC32101-801
T
Terminations
T = Plated Ni
and Sn
2
Marking
Packaging
2 = 7" Reel
4 = 13" Reel
A
Special
Code
A = Std.
Product
PART NUMBER (example)
RANGE OF APPROVED COMPONENTS
Case Dielectric
Voltage and Capacitance Range
Size Type 50V 100V 200V
1BCG
0603 1B CG 0.47pF - 150pF 0.47pF - 120pF 0.47pF - 100pF
0805 1B CG 0.47pF - 560pF 0.47pF - 560pF 0.47pF - 330pF
1206 1B CG 0.47pF - 3.3nF 0.47pF - 3.3nF 0.47pF - 1.5nF
1210 1B CG 0.47pF - 4.7nF 0.47pF - 4.7nF 0.47pF - 2.7nF
1808 1B CG 0.47pF - 6.8nF 0.47pF - 6.8nF 0.47pF - 4.7nF
1812 1B CG 0.47pF - 15nF 0.47pF - 15nF 0.47pF - 10nF
2220 1B CG 0.47pF - 39nF 0.47pF - 39nF 0.47pF - 15nF
2R1
0603 2R1 10pF - 6.8nF 10pF - 6.8nF 10pF - 1.2nF
0805 2R1 10pF - 33nF 10pF - 18nF 10pF - 3.3nF
1206 2R1 10pF - 100nF 10pF - 68nF 10pF - 18nF
1210 2R1 10pF - 150nF 10pF - 100nF 10pF - 27nF
1808 2R1 10pF - 270nF 10pF - 180nF 10pF - 47nF
1812 2R1 10pF - 470nF 10pF - 330nF 10pF - 100nF
2220 2R1 10pF - 1.2µF 10pF - 680nF 10pF - 220nF
2F4
0805 2F4 10pF - 100nF
1206 2F4 10pF - 330nF
1210 2F4 10pF - 470nF
1808 2F4 10pF - 560nF
1812 2F4 10pF - 1.8µF
2220 2F4 10pF - 2.2µF
European Detail Specifications
CECC 32 101-801/Chips
Standard European Ceramic Chip Capacitors

18125G105ZAT2A

Mfr. #:
Manufacturer:
N/A
Description:
Multilayer Ceramic Capacitors MLCC - SMD/SMT 50V 1uF Y5V 1812 .01pF Tol
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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