DRAM Operating Conditions
Recommended AC operating conditions are given in the DDR2 component data sheets.
Component specifications are available on Micron's Web site. Module speed grades cor-
relate with component speed grades.
Table 8: Module and Component Speed Grades
DDR2 components may exceed the listed module speed grades; module may not be available in all listed speed grades
Module Speed Grade Component Speed Grade
-1GA -187E
-80E -25E
-800 -25
-667 -3
-53E -37E
-40E -5E
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully de-
signed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level. Mi-
cron encourages designers to simulate the signal characteristics of the system's memo-
ry bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the DRAM, not at the edge connector of the module.
Designers must account for any system voltage drops at anticipated power levels to en-
sure the required supply voltage is maintained.
2GB, 4GB (x72, ECC, DR) 240-Pin DDR2 SDRAM RDIMM
DRAM Operating Conditions
PDF: 09005aef818e3fc8
htf36c256_512x72py.pdf - Rev. D 3/10 EN
10
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2005 Micron Technology, Inc. All rights reserved.
I
DD
Specifications
Table 9: DDR2 I
DD
Specifications and Conditions – 2GB
Values shown for MT47H128M4 DDR2 SDRAM only and are computed from values specified in the 512Mb (128 Meg x 4)
component data sheet
Parameter Symbol
-80E/
800 -667 -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are switching; Data bus inputs are switching
I
DD0
1
1926 1746 1566 1566 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL =
4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN
(I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data pattern is same as I
DD4W
I
DD1
1
2196 2016 1836 1746 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
);
CKE is LOW; Other control and address bus inputs are stable; Data bus
inputs are floating
I
DD2P
2
252 252 252 252 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
);
CKE is HIGH, S# is HIGH; Other control and address bus inputs are stable;
Data bus inputs are floating
I
DD2Q
2
1800 1620 1440 1260 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching; Da-
ta bus inputs are switching
I
DD2N
2
1980 1800 1620 1440 mA
Active power-down current: All device banks open;
t
CK
=
t
CK (I
DD
); CKE is LOW; Other control and address bus in-
puts are stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P
2
1440 1260 1080 900 mA
Slow PDN ex-
it MR[12] = 1
432 432 432 432
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid com-
mands; Other control and address bus inputs are switching; Data bus
inputs are switching
I
DD3N
2
3636 3186 2646 2196 mA
Operating burst write current: All device banks open; Continuous
burst writes; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX
(I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data bus inputs are switching
I
DD4W
2
3006 2556 2376 2016 mA
Operating burst read current: All device banks open; Continuous burst
read, I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS
MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid com-
mands; Address bus inputs are switching; Data bus inputs are switching
I
DD4R
2
3006 2556 2376 2016 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC
(I
DD
) interval; CKE is HIGH, S# is HIGH between valid commands; Other con-
trol and address bus inputs are switching; Data bus inputs are switching
I
DD5
2
8280 6480 6120 5940 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
I
DD6
2
252 252 252 252 mA
2GB, 4GB (x72, ECC, DR) 240-Pin DDR2 SDRAM RDIMM
I
DD
Specifications
PDF: 09005aef818e3fc8
htf36c256_512x72py.pdf - Rev. D 3/10 EN
11
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2005 Micron Technology, Inc. All rights reserved.
Table 9: DDR2 I
DD
Specifications and Conditions – 2GB (Continued)
Values shown for MT47H128M4 DDR2 SDRAM only and are computed from values specified in the 512Mb (128 Meg x 4)
component data sheet
Parameter Symbol
-80E/
800 -667 -53E -40E Units
Operating bank interleave read current: All device banks interleaving
reads, I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK
=
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are stable
during deselects; Data bus inputs are switching
I
DD7
1
5526 4446 4176 4086 mA
Notes:
1. Value calculated as one module rank in this operating condition. All other module ranks
in I
DD2P
(CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
2GB, 4GB (x72, ECC, DR) 240-Pin DDR2 SDRAM RDIMM
I
DD
Specifications
PDF: 09005aef818e3fc8
htf36c256_512x72py.pdf - Rev. D 3/10 EN
12
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2005 Micron Technology, Inc. All rights reserved.

MT36HTF25672PY-80ED2

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR2 SDRAM 2GB 240RDIMM
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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