STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87738
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
7
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics
– Continued.
Test
Symbol
Conditions
-55C T
A
+125C
Group A
subgroups
Device
type
Limits 1
/
Unit
V
S
= 15 V
unless otherwise specified
Min Max
Large signal voltage gain
A
VOL
R
L
2 k, V
O
= 12 V
4 03 450 V/mV
R
L
1 k, V
O
= 10 V
300
R
L
2 k, V
O
= 10 V
5,6 300
Output voltage swing
+V
OUT
R
L
1 k
4 All +12.0 V
R
L
2 k
4 +12.5
5,6 +12.0
-V
OUT
R
L
1 k
4 -12.0
R
L
2 k
4 -12.5
5,6 -12.0
Slew rate 3/ SR
R
L
2 k, T
A
= +25C
7 All 0.1
V/s
Input noise voltage 3/ 5/
en
pp
0.1 Hz to 10 Hz, T
A
= +25C
7 All 0.6
V
PP
Input noise voltage density 5/ en
f
O
= 10 Hz, T
A
= +25C
7 All 18.0 nV /
f
O
= 1000 Hz, T
A
= +25C
11.0
Hz
Input noise current 3/ 5/ in
f
O
= 10 Hz, T
A
= +25C
7 All .80 pA /
f
O
= 1000 Hz, T
A
= +25C
.17
Hz
Gain bandwidth product 3/ GBW
T
A
= +25C
7 All 0.4 MHz
1
/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in
this table. Negative current shall be defined as conventional current flow out of device terminal.
2
/ Long term input offset voltage stability refers to the average trend line of offset voltage versus time over extended periods
after the first 30 days of operation. Excluding the first hour of operation, changes in V
OS
during the first 30 days are
normally 2.5 V.
3
/ If not tested, shall be guaranteed to the limits specified in table I herein.
4/ For device types 01 and 02, inputs offset voltage is measured with high speed test equipment approximately 1 second
after power is applied. For device type 03, input offset voltage is measured after power is applied and the device is fully
warmed up.
5
/ 10 Hz noise voltage density is sample tested on every lot.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87738
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
8
DSCC FORM 2234
APR 97
Device types 01,02,03 02 01, 02
Case outlines G and P H 2
Terminal
number
Terminal symbol
1
V
OS
TRIM
NC NC
2 -INPUT
V
OS
TRIM V
OS
TRIM
3 +INPUT -INPUT NC
4
-V
S
+INPUT NC
5 NC
-V
S
-INPUT
6 OUTPUT NC NC
7
+V
S
OUTPUT +INPUT
8
V
OS
TRIM +V
S
NC
9 ---
V
OS
TRIM
NC
10 --- NC
-V
S
11 --- --- NC
12 --- --- NC
13 --- --- NC
14 --- --- NC
15 --- --- OUTPUT
16 --- --- NC
17 --- ---
+V
S
18 --- --- NC
19 --- --- NC
20 --- ---
V
OS
TRIM
NC = No connection
FIGURE 1. Terminal connections
.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87738
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
9
DSCC FORM 2234
APR 97
3.6 Certificate of compliance
. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of
MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance
. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M
. For device class M, notification to DLA Land and Maritime-VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M
. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 49 (see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening
. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) T
A
= +125C, minimum.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
4.2.2 Additional criteria for device classes Q and V
.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.

5962-8773802GA

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Precision Amplifiers LOW OFFSET VTG OP AMP IC
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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