STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87738
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
4
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks
. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/
or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence
. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements
. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines
. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3 Electrical performance characteristics and postirradiation parameter limits
. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking
. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87738
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics
.
Test
Symbol
Conditions
-55C T
A
+125C
Group A
subgroups
Device
type
Limits 1
/
Unit
V
S
= 15 V
unless otherwise specified
Min Max
Long term input offset
voltage stability
V
OS
/
time
2
/ 3/ 1 01,02 1.5
V/Mo
03 1.0
Average input offset 3/
voltage drift
V
OS
/
temp
2,3 01 -1.0 1.0
V/C
02,03 -0.6 0.6
Input offset current
I
OS
1 01 -3.8 3.8 nA
2,3 -7.6 7.6
1 02 -1.5 1.5
2,3 -2.2 2.2
1 03 -2.0 2.0
2,3 -4.0 4.0
Input bias current
I
B
1 01 -4.0 4.0 nA
2,3 -8.0 8.0
1 02,03 -2.0 2.0
2,3 -4.0 4.0
Input voltage range
+V
IN
1,2,3 All +13.0 V
-V
IN
-13.0
Power dissipation
P
D
No load 1 01 80 mW
2,3 100
No load, V
S
= 3 V
1 8
No load 1 02 60
2,3 75
No load, V
S
= 3 V
1 4.5
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87738
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics
– Continued.
Test
Symbol
Conditions
-55C T
A
+125C
Group A
subgroups
Device
type
Limits 1
/
Unit
V
S
= 15 V
unless otherwise specified
Min Max
Power dissipation
P
D
No load 1 03 75 mW
2,3 90
No load, V
S
= 3 V
1 6.0
Input resistance 3/
differential mode
R
IN
T
A
= +25C
1 All 15
M
Common mode rejection
ratio
CMRR
V
CM
= 13 V
1 01 110 dB
2,3 106
1,2,3 02 120
1 03 114
2,3 110
Power supply rejection ratio PSRR
V
S
= 3 V to 18 V
1 01,02 106 dB
2,3 100
1 03 110
2,3 104
Input offset voltage 4/
V
OS
4 01 -60 60
V
2,3 -160 160
4 02 -25 25
2,3 -60 60
4 03 -15 15
2,3 -60 60
Large signal voltage gain
A
VOL
R
L
2 k, V
O
= 12 V
4 01 400 V/mV
R
L
1 k, V
O
= 10 V
250
R
L
2 k, V
O
= 10 V
5,6 200
R
L
2 k, V
O
= 10 V
4 02 5000
5,6 2000
See footnotes at end of table.

5962-8773802PA

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Precision Amplifiers LOW OFFSET VTG OP AMP IC
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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