MAX9234/MAX9236/MAX9238
Hot-Swappable, 21-Bit, DC-Balanced LVDS
Deserializers
10
Maxim Integrated
(7 + 2):1
1:(9 - 2)
7
7
100
(7 + 2):1
1:(9 - 2)
7
7
100
(7 + 2):1
1:(9 - 2)
7
7
100
PLL
PLL
100
MAX9209
MAX9211
MAX9213
MAX9215
MAX9234
MAX9236
MAX9238
TxOUT
TxCLK OUT
RxIN
RxCLK IN
21:3 SERIALIZER 3:21 DESERIALIZER
PWRDWN
RxCLK OUT
RxOUT
PWRDWN
TxCLK IN
TxIN
HIGH-FREQUENCY, CERAMIC
SURFACE-MOUNT CAPACITORS
CAN ALSO BE PLACED AT THE
SERIALIZER INSTEAD OF THE DESERIALIZER.
Figure 10. Two Capacitors per Link, AC-Coupled
(7 + 2):1
1:(9 - 2)
7
7
100
(7 + 2):1
1:(9 - 2)
7
7
100
(7 + 2):1
1:(9 - 2)
7
7
100
PLL
PLL
100
MAX9209
MAX9211
MAX9213
MAX9215
MAX9234
MAX9236
MAX9238
TxOUT
TxCLK OUT
RxIN
RxCLK IN
21:3 SERIALIZER 3:21 DESERIALIZER
PWRDWN
RxCLK OUT
RxOUT
PWRDWN
TxCLK IN
TxIN
HIGH-FREQUENCY CERAMIC
SURFACE-MOUNT CAPACITORS
Figure 11. Four Capacitors per Link, AC-Coupled
MAX9234/MAX9236/MAX9238
Hot-Swappable, 21-Bit, DC-Balanced LVDS
Deserializers
11
Maxim Integrated
In the following example, the capacitor value for a
droop of 2% is calculated. Jitter due to this droop is
then calculated assuming a 1ns transition time:
C = - (2 x t
B
x DSV) / (ln (1 - D) x (R
T
+ R
O
)) (Eq 1)
where:
C = AC-coupling capacitor (F).
t
B
= bit time (s).
DSV = digital sum variation (integer).
ln = natural log.
D = droop (% of signal amplitude).
R
T
= termination resistor ().
R
O
= output resistance ().
Equation 1 is for two series capacitors (Figure 10). The
bit time (t
B
) is the period of the parallel clock divided by
9. The DSV is 10. See equation 3 for four series capaci-
tors (Figure 11).
The capacitor for 2% maximum droop at 8MHz parallel
rate clock is:
C = - (2 x t
B
x DSV) / (ln (1 - D) x (R
T
+ R
O
))
C = - (2 x 13.9ns x 10) / (ln (1 - 0.02) x (100 + 78))
C = 0.0773µF
Jitter due to droop is proportional to the droop and
transition time:
t
J
= t
T
x D (Eq 2)
where:
t
J
= jitter (s).
t
T
= transition time (s) (0 to 100%).
D = droop (% of signal amplitude).
Jitter due to 2% droop and assumed 1ns transition time is:
t
J
= 1ns x 0.02
t
J
= 20ps
The transition time in a real system depends on the fre-
quency response of the cable driven by the serializer.
The capacitor value decreases for a higher frequency
parallel clock and for higher levels of droop and jitter.
Use high-frequency, surface-mount ceramic capacitors.
Equation 1 altered for four series capacitors (Figure 11) is:
C = - (4 x t
B
x DSV) / (ln (1 - D) x (R
T
+ R
O
)) (Eq 3)
Input Bias and Frequency Detection
The inverting and noninverting LVDS inputs are internally
connected to +1.2V through 42k (min) to provide bias-
ing for AC-coupling (Figure 1). A frequency-detection
circuit on the clock input detects when the input is not
switching, or is switching at low frequency. In this case,
all outputs are driven low. To prevent switching due to
noise when the clock input is not driven, bias the clock
input to differential +15mV by connecting a 10k ±1%
pullup resistor between the noninverting input and V
CC
,
and a 10k ±1% pulldown resistor between the invert-
ing input and ground. These bias resistors, along with
the 100 ±1% tolerance termination resistor, provide
+15mV of differential input.
Unused LVDS Data Inputs
At each unused LVDS data input, pull the inverting input
up to V
CC
using a 10k resistor, and pull the noninverting
input down to ground using a 10k resistor. Do not con-
nect a termination resistor. The pullup and pulldown resis-
tors drive the corresponding outputs low and prevent
switching due to noise.
PWRDWN
Driving PWRDWN low puts the outputs in high imped-
ance, stops the PLL, and reduces supply current to
50µA or less. Driving PWRDWN high drives the outputs
low until the PLL locks. The outputs of two deserializers
can be bused to form a 2:1 mux with the outputs con-
trolled by PWRDWN. Wait 100ns between disabling one
deserializer (driving PWRDWN low) and enabling the
second one (driving PWRDWN high) to avoid con-
tention of the bused outputs.
Input Clock and PLL Lock Time
There is no required timing sequence for the applica-
tion or reapplication of the parallel rate clock (RxCLK
IN) relative to PWRDWN, or to a power-supply ramp for
proper PLL lock. The PLL lock time is set by an internal
counter. The maximum time to lock is 32,800 clock
periods. Power and clock should be stable to meet the
lock-time specification. When the PLL is locking, the
outputs are low.
Power-Supply Bypassing
There are separate on-chip power domains for digital
circuits, outputs, PLL, and LVDS inputs. Bypass each
V
CC
, V
CCO
, PLL V
CC
, and LVDS V
CC
pin with high-fre-
quency, surface-mount ceramic 0.1µF and 0.001µF
capacitors in parallel as close to the device as possi-
ble, with the smallest value capacitor closest to the
supply pin.
Cables and Connectors
Interconnect for LVDS typically has a differential imped-
ance of 100. Use cables and connectors that have
matched differential impedance to minimize impedance
discontinuities.
Twisted-pair and shielded twisted-pair cables offer
superior signal quality compared to ribbon cable and
tend to generate less EMI due to magnetic field cancel-
ing effects. Balanced cables pick up noise as common
mode, which is rejected by the LVDS receiver.
MAX9234/MAX9236/MAX9238
Hot-Swappable, 21-Bit, DC-Balanced LVDS
Deserializers
12
Maxim Integrated
Board Layout
Keep the LVTTL/LVCMOS outputs and LVDS input sig-
nals separated to prevent crosstalk. A four-layer PC
board with separate layers for power, ground, LVDS
inputs, and digital signals is recommended.
ESD Protection
The MAX9234/MAX9236/MAX9238 ESD tolerance is
rated for IEC 61000-4-2 Human Body Model and ISO
10605 standards. IEC 61000-4-2 and ISO 10605 specifiy
ESD tolerance for electronic systems. The Human Body
Model discharge components are C
S
= 100pF and R
D
=
1.5k (Figure 12). For the Human Body Model, all pins
are rated for ±5kV contact discharge. The ISO 10605 dis-
charge components are C
S
= 330pF and R
D
= 2k
(Figure 13). For ISO 10605, the LVDS outputs are rated
for ±8kV contact and ±25kV air discharge. The IEC
61000-4-2 discharge components are C
S
= 150pF and
R
D
= 330 (Figure 14). For IEC 61000-4-2, the LVDS
inputs are rated for ±8kV Contact Discharge and ±15kV
Air-Gap Discharge.
5V Tolerant Input
PWRDWN is 5V tolerant and is internally pulled down to
GND.
Skew Margin (RSKM)
Skew margin (RSKM) is the time allowed for degrada-
tion of the serial data sampling setup and hold times by
sources other than the deserializer. The deserializer
sampling uncertainty is accounted for and does not
need to be subtracted from RSKM. The main outside
contributors of jitter and skew that subtract from RSKM
are interconnect intersymbol interference, serializer
pulse position uncertainty, and pair-to-pair path skew.
V
CCO
Output Supply and Power Dissipation
The outputs have a separate supply (V
CCO
) for interfacing
to systems with 1.8V to 5V nominal input-logic levels. The
DC Electrical Characteristics
table gives the maximum
supply current for V
CCO
= 3.6V with 8pF load at several
switching frequencies with all outputs switching in the
worst-case switching pattern. The approximate incremen-
tal supply current for V
CCO
other than 3.6V with the same
8pF load and worst-case pattern can be calculated using:
I
I
= C
T
V
I
0.5f
C
x 21 (data outputs)
+ C
T
V
I
f
C
x 1 (clock output)
where:
I
I
= incremental supply current.
C
T
= total internal (C
INT
) and external (C
L
) load capaci-
tance.
V
I
= incremental supply voltage.
f
C
= output clock-switching frequency.
The incremental current is added to (for V
CCO
> 3.6V)
or subtracted from (for V
CCO
< 3.6V) the
DC Electrical
Characteristics
table maximum supply current. The
internal output buffer capacitance is C
INT
= 6pF. The
worst-case pattern-switching frequency of the data out-
puts is half the switching frequency of the output clock.
In the following example, the incremental supply current is
calculated for V
CCO
= 5.5V, f
C
= 34MHz, and C
L
= 8pF:
V
I
= 5.5V - 3.6V = 1.9V
C
T
= C
INT
+ C
L
= 6pF + 8pF = 14pF
Figure 13. ISO 10605 Contact Discharge ESD Test Circuit
Figure 12. Human Body ESD Test Circuit
STORAGE
CAPACITOR
HIGH-
VOLTAGE
DC
SOURCE
DEVICE
UNDER
TEST
CHARGE-CURRENT-
LIMIT RESISTOR
DISCHARGE
RESISTANCE
R1
1M
R2
1.5k
C
S
100pF
STORAGE
CAPACITOR
HIGH-
VOLTAGE
DC
SOURCE
DEVICE
UNDER
TEST
CHARGE-CURRENT-
LIMIT RESISTOR
DISCHARGE
RESISTANCE
R1
50 TO 100
R2
2k
C
S
330pF
Figure 14. IEC 61000-4-2 Contact Discharge ESD Test Circuit
STORAGE
CAPACITOR
HIGH-
VOLTAGE
DC
SOURCE
DEVICE
UNDER
TEST
CHARGE-CURRENT-
LIMIT RESISTOR
DISCHARGE
RESISTANCE
50 TO 100
R
D
330
C
S
150pF

MAX9234EUM+TD

Mfr. #:
Manufacturer:
Maxim Integrated
Description:
Serializers & Deserializers - Serdes 21-Bit DC-Balanced LVDS Deserializer
Lifecycle:
New from this manufacturer.
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