7
AT29BV010A
0519DFLASH05/02
Input Test Waveforms and Measurement Level
Output Test Load
Note: 1. These parameters are characterized and not 100% tested.
t
R
,t
F
<5ns
Pin Capacitance
f=1MHz,T=25°C
(1)
Symbol Typ Max Units Conditions
C
IN
46pFV
IN
=0V
C
OUT
812pFV
OUT
=0V
8
AT29BV010A
0519DFLASH05/02
AC Byte Load Waveforms
(1)(2)
WE Controlled
CE
Controlled
AC Byte Load Characteristics
Symbol Parameter Min Max Units
t
AS
,t
OES
Address, OE Set-up Time 10 ns
t
AH
Address Hold Time 100 ns
t
CS
Chip Select Set-up Time 0 ns
t
CH
Chip Select Hold Time 0 ns
t
WP
Write Pulse Width (WE or CE) 200 ns
t
DS
Data Set-up Time 100 ns
t
DH
,t
OEH
Data, OE Hold Time 10 ns
t
WPH
Write Pulse Width High 200 ns
9
AT29BV010A
0519DFLASH05/02
Software Protected Program Waveform
Notes: 1. OE must be high when WE and CE arebothlow.
2. A7 through A16 must specify the sector address during each high to low transition of WE
(or CE) after the software code has
been entered.
3. All bytes that are not loaded within the sector being programmed will be indeterminate.
Programming Algorithm
(1)
Program Cycle Characteristics
Symbol Parameter Min Max Units
t
WC
WriteCycleTime 20 ms
t
AS
Address Set-up Time 10 ns
t
AH
Address Hold Time 100 ns
t
DS
Data Set-up Time 100 ns
t
DH
Data Hold Time 10 ns
t
WP
Write Pulse Width 200 ns
t
BLC
Byte Load Cycle Time 150 µs
t
WPH
Write Pulse Width High 200 ns
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA A0
TO
ADDRESS 5555
LOAD DATA
TO
SECTOR (128 BYTES)
(3)
WRITES ENABLED
ENTER DATA
PROTECT STATE
(2)
Notes: 1. Data Format: I/O7 - I/O0 (Hex);
Address Format: A14 - A0 (Hex).
2. Data Protect state will be re-activated
at end of program cycle.
3. 128 bytes of data MUST BE loaded.

AT29BV010A-12JC

Mfr. #:
Manufacturer:
Microchip Technology / Atmel
Description:
NOR Flash 1M (128K X 8) 2.7V- 120NS COM TEMP
Lifecycle:
New from this manufacturer.
Delivery:
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