OMO ElectronicOMO Electronic
Expand menu
Hello, Sign inMy Account
0 Cart

NUP2105LT1G

P1-P3P4-P6P7-P7
NUP2105L, SZNUP2105L
www.onsemi.com
4
APPLICATIONS
Background
The Controller Area Network (CAN) is a serial
communication protocol designed for providing reliable
high speed data transmission in harsh environments. surge
protection diodes provide a low cost solution to conducted
and radiated Electromagnetic Interference (EMI) and
Electrostatic Discharge (ESD) noise problems. The noise
immunity level and reliability of CAN transceivers can be
easily increased by adding external surge protection diodes
to prevent transient voltage failures.
The NUP2105L provides a surge protection solution for
CAN data communication lines. The NUP2105L is a dual
bidirectional surge protection device in a compact
SOT−23 package. This device is based on Zener technology
that optimizes the active area of a PN junction to provide
robust protection against transient EMI surge voltage and
ESD. The NUP2105L has been tested to EMI and ESD
levels that exceed the specifications of popular high speed
CAN networks.
CAN Physical Layer Requirements
Table 1 provides a summary of the system requirements
for a CAN transceiver. The ISO 11898−2 physical layer
specification forms the baseline for most CAN systems. The
transceiver requirements for the Honeywell
Smart
Distribution Systems (SDS
) and Rockwell
(Allen−Bradley) DeviceNet high speed CAN networks
are similar to ISO 11898−2. The SDS and DeviceNet
transceiver requirements are similar to ISO 11898−2;
however, they include minor modifications required in an
industrial environment.
Table 1. Transceiver Requirements for High−Speed CAN Networks
Parameter ISO 11898−2 SDS Physical Layer
Specification 2.0
DeviceNet
Min / Max Bus Voltage
(12 V System)
−3.0 V / 16 V 11 V / 25 V Same as ISO 11898−2
Common Mode Bus Voltage CAN_L:
−2.0 V (min)
2.5 V (nom)
CAN_H:
2.5 V (nom)
7.0 V (max)
Same as ISO 11898−2 Same as ISO 11898−2
Transmission Speed 1.0 Mb/s @ 40 m
125 kb/s @ 500 m
Same as ISO 11898−2 500 kb/s @ 100 m
125 kb/s @ 500 m
ESD Not specified, recommended
w $8.0 kV (contact)
Not specified, recommended
w $8.0 kV (contact)
Not specified, recommended
w $8.0 kV (contact)
EMI Immunity ISO 7637−3, pulses ‘a’ and ‘b’ IEC 61000−4−4 EFT Same as ISO 11898−2
Popular Applications Automotive, Truck, Medical
and Marine Systems
Industrial Control Systems Industrial Control Systems
NUP2105L, SZNUP2105L
www.onsemi.com
5
EMI Specifications
The EMI protection level provided by the surge protection
device can be measured using the International Organization
for Standardization (ISO) 7637−2 and −3 specifications that
are representative of various noise sources. The ISO 7637−2
specification is used to define the susceptibility to coupled
transient noise on a 12 V power supply, while ISO 7637−3
defines the noise immunity tests for data lines. The ISO 7637
tests also verify the robustness and reliability of a design by
applying the surge voltage for extended durations.
The IEC 61000−4−X specifications can also be used to
quantify the EMI immunity level of a CAN system. The IEC
61000−4 and ISO 7637 tests are similar; however, the IEC
standard was created as a generic test for any electronic
system, while the ISO 7637 standard was designed for
vehicular applications. The IEC61000−4−4 Electrical Fast
Transient (EFT) specification is similar to the ISO 7637−3
pulse 3a and b tests and is a requirement of SDS CAN
systems. The IEC 61000−4−5 test is used to define the power
absorption capacity of a surge protection device and long
duration voltage transients such as lightning. Table 2
provides a summary of the ISO 7637 and IEC 61000−4−X
test specifications. Table 3 provides the NUP2105L’s ESD
test results.
Table 2. ISO 7637 and IEC 61000−4−X Test Specifications
Test Waveform Test Specifications NUP2105L Results Simulated Noise Source
ISO 7637−2
12 V Power Supply Lines
(Note 2)
Pulse 1
V
s
= 0 to −100 V
I
max
= 10 A
t
duration
= 5000 pulses
I
max
= 1.75 A
V
clamp
_
max
= 31 V
t
duration
= 5000 pulses
R
i
= 10 W, t
r
= 1.0 ms,
t
d_10%
= 2000 ms, t
1
= 2.5 s,
t
2
= 200 ms, t
3
= 100 ms
DUT (Note 1) in parallel with
inductive load that is
disconnected from power
supply.
Pulse 2a
V
s
= 0 to +50 V
coupled onto 14 V battery
I
max
= 10 A
t
duration
= 5000 pulses
I
max
= 9.5 A
V
clamp
_
max
= 42 V
t
duration
= 5000 pulses
Ri = 2 W, t
r
= 1.0 ms,
t
d_10%
= 50 ms, t
1
= 2.5 s,
t
2
= 200 ms
DUT in series with inductor
(wire harness) that is
disconnected from load.
ISO 7637−3
Repetitive data line fast
transients (Note 3)
Pulse ‘a’
V
s
= −60 V
I
max
= 1.2 A
t
duration
= 10 minutes
I
max
= 50 A (Note 4)
V
clamp
_
max
= 40 V
t
duration
= 60 minutes
R
i
= 50 W, t
r
= 5.0 ns,
t
d_10%
= 100 ns, t
1
= 100 ms,
t
2
= 10 ms, t
3
= 90 ms
Switching noise of inductive
loads.
Pulse ‘b’
V
s
= +40 V
I
max
= 0.8 A
t
duration
= 10 minutes
IEC 61000−4−4
Data Line EFT
V
open
circuit
= 2.0 kV
I
short
circuit
= 40 A
(Level 4 = Severe Industrial
Environment)
R
i
= 50 W, t
r
< 5.0 ns,
t
d_50%
= 50 ns, t
burst
= 15 ms,
f
burst
= 2.0 to 5.0 kHz,
t
repeat
= 300 ms
t
duration
= 1 minute
(Note 5) Switching noise of inductive
loads.
IEC 61000−4−5
V
open
circuit
= 1.2/50 ms,
I
short
circuit
= 8/20 ms
R
i
= 50 W
I
max
= 8.0 A Lightning, nonrepetitive
power line and load
switching
1. DUT = device under test.
2. Test specifications were taken from ISO7637−2: 2004 version.
3. Test specifications were taken from ISO7637−3: 1995 version.
4. DUT was tested to ISO7637−2: 2004 pulse 3a,b specification for more rigorous test.
5. The EFT immunity level was measured with test limits beyond the IEC 61000−4−4 test, but with the more severe test conditions of
ISO 7637−3.
NUP2105L, SZNUP2105L
www.onsemi.com
6
Table 3. NUP2105L ESD Test Results
ESD Specification Test Test Level Pass / Fail
Human Body Model Contact 16 kV Pass
IEC 61000−4−2
Contact 30 kV (Note 6) Pass
Non−contact (Air Discharge) 30 kV (Note 6) Pass
6. Test equipment maximum test voltage is 30 kV.
Surge protection Diode Protection Circuit
surge protection diodes provide protection to a
transceiver by clamping a surge voltage to a safe level. surge
protection diodes have high impedance below and low
impedance above their breakdown voltage. A surge
protection Zener diode has its junction optimized to absorb
the high peak energy of a transient event, while a standard
Zener diode is designed and specified to clamp a
steady state voltage.
Figure 7 provides an example of a dual bidirectional surge
protection diode array that can be used for protection with
the high−speed CAN network. The bidirectional array is
created from four identical Zener surge protection diodes.
The clamping voltage of the composite device is equal to the
breakdown voltage of the diode that is reversed biased, plus
the diode drop of the second diode that is forwarded biased.
Figure 7. High−Speed and Fault Tolerant CAN Surge
Protection Circuit
CAN
Transceiver
CAN_H
CAN_L
NUP2105L
CAN Bus
P1-P3P4-P6P7-P7

NUP2105LT1G

Mfr. #:
Buy NUP2105LT1G
Manufacturer:
ON Semiconductor
Description:
TVS Diode Arrays 27V CAN BUS Protection
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet