BYQ30E-200,127

BYQ30E-200 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 4 — 1 September 2010 3 of 11
NXP Semiconductors
BYQ30E-200
Dual ultrafast power diode
4. Limiting values
Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
RRM
repetitive peak reverse voltage - 200 V
V
RWM
crest working reverse voltage - 200 V
V
R
reverse voltage DC - 200 V
I
O(AV)
average output current squire-wave pulse; δ = 0.5 ;
T
mb
104 °C; both diodes conducting;
see Figure 1
;
see Figure 2
-16A
I
FRM
repetitive peak forward current squire-wave pulse; δ = 0.5 ; t
p
= 25 µs;
T
mb
104 °C; per diode
-16A
I
FSM
non-repetitive peak forward
current
t
p
= 10 ms; sine-wave pulse;
T
j(init)
= 25 °C; per diode
-80A
t
p
= 8.3 ms; sine-wave pulse;
T
j(init)
= 25 °C; per diode
-88A
I
RRM
repetitive peak reverse current δ = 0.001 ; t
p
= 2 μs-0.2A
I
RSM
non-repetitive peak reverse
current
t
p
= 100 μs-0.2A
T
stg
storage temperature -40 150 °C
T
j
junction temperature - 150 °C
V
ESD
electrostatic discharge voltage HBM; all pins; C = 250 pF; R = 1.5 k -8kV
Fig 1. Forward power dissipation as a function of
average forward current; square waveform;
maximum values
Fig 2. Forward power dissipation as a function of
average forward current; sinusoidal waveform;
maximum values
003aae838
I
F(AV)
(A)
01284
4
8
12
P
tot
(W)
0
δ = 1.0
0.2
0.1
0.5
I
F(AV)
(A)
08624
003aae839
4
8
12
P
tot
(W)
0
a = 1.57
1.9
2.2
2.8
4
BYQ30E-200 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 4 — 1 September 2010 4 of 11
NXP Semiconductors
BYQ30E-200
Dual ultrafast power diode
5. Thermal characteristics
Table 5. Thermal characteristics
Symbol Parameter Conditions Min Typ Max Unit
R
th(j-mb)
thermal resistance
from junction to
mounting base
with heatsink compound; both diodes
conducting; see Figure 3
--2.5K/W
with heatsink compound; per diode;
see Figure 3
--3K/W
R
th(j-a)
thermal resistance
from junction to
ambient
-60-K/W
Fig 3. Transient thermal impedance from junction to mounting base as a function of pulse width
003aae840
10
1
10
2
1
10
Z
th(j-mb)
(K/W)
10
3
t
p
(s)
10
6
11010
1
10
2
10
5
10
3
10
4
per diode
both diodes
BYQ30E-200 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 4 — 1 September 2010 5 of 11
NXP Semiconductors
BYQ30E-200
Dual ultrafast power diode
6. Characteristics
Table 6. Characteristics
Symbol Parameter Conditions Min Typ Max Unit
Static characteristics
V
F
forward voltage I
F
=16A; T
j
= 25 °C; see Figure 4 - 1.12 1.25 V
I
F
=16A; T
j
=15C; see Figure 4 - 1 1.15 V
I
F
=8A; T
j
= 150 °C; see Figure 4 - 0.84 0.95 V
I
R
reverse current V
R
=200V; T
j
= 100 °C - 0.3 0.6 mA
V
R
=200V; T
j
=2C - 4 30 µA
Dynamic characteristics
Q
r
recovered charge I
F
=2A; V
R
30 V; dI
F
/dt = 20 A/s;
T
j
=2C; see Figure 5
-411nC
t
rr
reverse recovery time I
F
=1A; V
R
30 V; dI
F
/dt = 100 A/µs;
ramp recovery; T
j
=2C;see Figure 5
- 2025ns
I
F
= 0.5 A; I
R
= 1 A; step recovery;
I
R(meas)
= 0.25 A; T
j
=2C;
see Figure 6
- 1222ns
V
FR
forward recovery
voltage
I
F
=1A; dI
F
/dt = 10 A/µs; T
j
=2C;
see Figure 7
-1-V
(1) Tj = 150 °C; typical values
(2) Tj = 150 °C; maximum values
(3) Tj = 25 °C; maximum values
Fig 4. Forward current as a function of forward
voltage
Fig 5. Forward recovery definitions
V
F
(V)
021.50.5 1
003aae841
10
5
15
20
I
F
(A)
0
(1) (3)(2)
001aab911
t
rr
time
100 %
10 %
I
F
dl
F
dt
I
R
I
RM
Q
r

BYQ30E-200,127

Mfr. #:
Manufacturer:
WeEn Semiconductors
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Rectifiers RAIL REC-EPI
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